OPTICAL PROBE AND DEVICE AND METHOD MAKING USE THEREOF

Title:

OPTICAL PROBE AND DEVICE AND METHOD MAKING USE THEREOF

Document Type and Number:

WIPO Patent Application WO2006075090

Kind Code:

A8

Abstract:

The probe comprises a light source (20), means for shaping (24, 25, 21 ) the beam emitted by said light source and the beam coming from a surface arranged close to a target distance, an optical detector unit (22), comprising a pinhole diaphragm (26) and a photoelectric detector (28), providing a voltage peak (31) when said surface is at said target distance and further comprising a diaphragm (27) with a hole larger than said pinhole and a photoelectric detector (29), providing a voltage greater than that produced by said detection sensor (28), except when said surface is a the target distance. The method uses the probe to measure the thickness of an optical lens.

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Inventors:

DUBOIS FREDERIC (FR)
BRAY MICHAEL (FR)

Application Number:

PCT/FR2006/000059

Publication Date:

August 30, 2007

Filing Date:

January 11, 2006

Export Citation:

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Assignee:

ESSILOR INT (FR)
MB OPTIQUE (FR)
DUBOIS FREDERIC (FR)
BRAY MICHAEL (FR)

International Classes:

G01B11/06; G01B11/00; G02B21/00

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