Title:
OPTICAL WAVEFORM MEASUREMENT DEVICE AND MEASUREMENT METHOD THEREOF, COMPLEX REFRACTIVE INDEX MEASUREMENT DEVICE AND MEASUREMENT METHOD THEREOF, AND COMPUTER PROGRAM RECORDING MEDIUM CONTAINING THE PROGRAM
Document Type and Number:
WIPO Patent Application WO/2004/113885
Kind Code:
A1
Abstract:
There are provided an optical waveform measurement device, a measurement method thereof, a complex refractive index measurement device, and measurement method thereof, and a computer program recording medium containing the program. It is possible to measure an electric field for an electromagnetic wave of an optical range in which the electromagnetic wave of the near-infrared light range has a short wavelength, output the waveform changing according to time, an easily calculate the complex refractive index of a substance according to the measurement result of the electric field waveform of the light. The optical waveform measurement device includes gate pulse light generation means, measurement light generation means, and light detection means for detecting measurement light. The gate pulse light and the measurement light are both coherent lights. The measurement light is a coherent light having a wavelength shorter than the near-infrared light range. The gate pulse light has a pulse width shorter than the cycle of the measurement light. The measurement light and the gate pulse light are applied to the light detection means to generate a carrier. By measuring a physical amount based on the carrier, an electric field of the measurement light is measured according to the physical amount.
Inventors:
SAITO SHINGO (JP)
IIDA MASARU (JP)
ASHIDA MASAAKI (JP)
IIDA MASARU (JP)
ASHIDA MASAAKI (JP)
Application Number:
PCT/JP2004/008609
Publication Date:
December 29, 2004
Filing Date:
June 18, 2004
Export Citation:
Assignee:
NAT INST INF & COMM TECH (JP)
SAITO SHINGO (JP)
IIDA MASARU (JP)
ASHIDA MASAAKI (JP)
SAITO SHINGO (JP)
IIDA MASARU (JP)
ASHIDA MASAAKI (JP)
International Classes:
G01J11/00; G01N21/41; (IPC1-7): G01N21/35; G01J11/00
Foreign References:
| JP2002277393A | 2002-09-25 | |||
| JPH08320254A | 1996-12-03 |
Other References:
KONO S. ET AL: "Coherent detection of mid-infrared radiation up to 60 THz with an LT-GaAs photoconductive antenna", IEE PROCEEDINGS-OPTOELECTRONICS, vol. 149, no. 3, June 2000 (2000-06-01), pages 105 - 109, XP002981862
TANI M. ET AL: "Generation and detecion of Ultrabroadband terahertz radiation with photoconductive antennas", CONFERENCE DIGEST - TWENTY SEVENTH INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES, September 2002 (2002-09-01), pages 125 - 126, XP010618786
DUVILLARET L. ET AL: "A reliable method for extraction of material parameters in terahertz time-domain spectroscopy", IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, vol. 2, no. 3, September 1996 (1996-09-01), pages 739 - 746, XP002951810
SUN. F.G. ET AL: "Analysis of terahertz pulse measurement with a chirped probe beam", APPLIED PHYSICS LETTERS, vol. 73, no. 16, 19 October 1998 (1998-10-19), pages 2233 - 2235, XP012021164
SHAN J. ET AL: "Single-shot measurement of terahertz electromagnetic pulses by use of electro-optic sampling", OPTICS LETTERS, vol. 25, no. 6, 15 March 2000 (2000-03-15), pages 426 - 428, XP002981863
TANI M. ET AL: "Generation and detecion of Ultrabroadband terahertz radiation with photoconductive antennas", CONFERENCE DIGEST - TWENTY SEVENTH INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES, September 2002 (2002-09-01), pages 125 - 126, XP010618786
DUVILLARET L. ET AL: "A reliable method for extraction of material parameters in terahertz time-domain spectroscopy", IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, vol. 2, no. 3, September 1996 (1996-09-01), pages 739 - 746, XP002951810
SUN. F.G. ET AL: "Analysis of terahertz pulse measurement with a chirped probe beam", APPLIED PHYSICS LETTERS, vol. 73, no. 16, 19 October 1998 (1998-10-19), pages 2233 - 2235, XP012021164
SHAN J. ET AL: "Single-shot measurement of terahertz electromagnetic pulses by use of electro-optic sampling", OPTICS LETTERS, vol. 25, no. 6, 15 March 2000 (2000-03-15), pages 426 - 428, XP002981863
Attorney, Agent or Firm:
Shimbo, Itsuki (1-2-10-905 Suido,, Bunkyo-k, Tokyo, JP)
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