Title:
OSCILLOSCOPE PROBE, METHOD, APPARATUS AND SYSTEM FOR TESTING RIPPLE
Document Type and Number:
WIPO Patent Application WO/2017/152567
Kind Code:
A1
Abstract:
An oscilloscope probe, method, apparatus and system for testing a ripple. The oscilloscope probe comprises a first connector (22) connected to an oscilloscope, and a signal probe (24) and a ground probe (26), wherein the signal probe (24) is connected to the first connector (22) via a cable (28); and the ground probe (26) comprises a sleeve (262), a double-ended spring (264) and a ground needle point (266). The ground probe (26) is connected to the signal probe (24) via a second connector (210), wherein the double-ended spring (264) is located inside the sleeve (262); a first end of the double-ended spring (264) is in contact with the ground needle point (266); and a second end of the double-ended spring (264) is fixed on the second connector (210). The oscilloscope probe solves the problem in the relevant art that it is not easy to test a small packaged device in a ripple test, thus improving the quality and efficiency of the ripple test.
Inventors:
LI WEILONG (CN)
SUN FENGYAN (CN)
SUN FENGYAN (CN)
Application Number:
PCT/CN2016/091527
Publication Date:
September 14, 2017
Filing Date:
July 25, 2016
Export Citation:
Assignee:
ZTE CORP (CN)
International Classes:
G01R1/067; G01R13/00
Foreign References:
| EP0232614A1 | 1987-08-19 | |||
| CN203705493U | 2014-07-09 | |||
| CN204287245U | 2015-04-22 | |||
| CN201464497U | 2010-05-12 | |||
| CN205038240U | 2016-02-17 | |||
| US6831452B2 | 2004-12-14 | |||
| US7161365B2 | 2007-01-09 |
Attorney, Agent or Firm:
KANGXIN PARTNERS,P.C. (CN)
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