Title:
PARAMETER CALIBRATION METHOD, DEVICE, AND SYSTEM FOR X-RAY MACHINE
Document Type and Number:
WIPO Patent Application WO/2018/133090
Kind Code:
A1
Abstract:
A parameter calibration method, device, and system for an X-ray machine. The method comprises: controlling a rotating arm of an X-ray machine to rotate about and scan a standard phantom, and acquiring projection results of the standard phantom at multiple preset rotation positions (S110); recording, at each of the preset rotation positions, a mechanical structure motion state of the rotating arm (S120); calibrating, at each of the preset rotation positions and according to the projection results of the standard phantom, an error parameter to obtain a calibration result of the error parameter (S130); and generating, according to the mechanical structure motion state of the rotating arm at each of the preset rotation positions and the calibration result of the error parameter, a dynamic correction matrix for correcting an actual project result of the X-ray machine (S140).
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Inventors:
CHEN KEN (CN)
WANG CHENG (CN)
QIN WENJIAN (CN)
XIONG JING (CN)
XIE YAOQIN (CN)
WANG CHENG (CN)
QIN WENJIAN (CN)
XIONG JING (CN)
XIE YAOQIN (CN)
Application Number:
PCT/CN2017/072177
Publication Date:
July 26, 2018
Filing Date:
January 23, 2017
Export Citation:
Assignee:
SHENZHEN INST ADV TECH (CN)
International Classes:
G01N23/04
Domestic Patent References:
| WO2016055167A1 | 2016-04-14 |
Foreign References:
| CN102692421A | 2012-09-26 | |||
| CN204520733U | 2015-08-05 | |||
| CN102652674A | 2012-09-05 | |||
| CN105849537A | 2016-08-10 | |||
| CN102144927A | 2011-08-10 | |||
| CN103759679A | 2014-04-30 |
Attorney, Agent or Firm:
BEYOND ATTORNEYS AT LAW (CN)
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