Title:
PARAMETER ESTIMATING DEVICE, PARAMETER ESTIMATING METHOD, ELECTRICITY STORAGE SYSTEM, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2014/097868
Kind Code:
A1
Abstract:
A parameter estimating device comprises: a state quantity measuring unit (11) to acquire measured values for state quantities having a correlation with a plurality of parameters; a state quantity calculating unit (12) to calculate and acquire calculated values corresponding to each measured value on the basis of an equation correlating estimated values for the plurality of parameters with the state quantities; and an optimal estimated value identifying unit (13) to find an error evaluation function value that is calculated on the basis of a value obtained by multiplying a first coefficient by the sum of the absolute quantities of the errors of the calculated values corresponding to the measured values, and a value obtained by multiplying a second coefficient by the degree of error variation, and to identify, while varying the estimated values, the optimal estimated value for which the error evaluation function value is the minimum.
Inventors:
WAKASUGI KAZUYUKI (JP)
MORITA KATSUAKI (JP)
OZAKI KAZUKI (JP)
SHIGEMIZU TETSURO (JP)
HASHIMOTO MASAYUKI (JP)
MORITA KATSUAKI (JP)
OZAKI KAZUKI (JP)
SHIGEMIZU TETSURO (JP)
HASHIMOTO MASAYUKI (JP)
Application Number:
PCT/JP2013/082348
Publication Date:
June 26, 2014
Filing Date:
December 02, 2013
Export Citation:
Assignee:
MITSUBISHI HEAVY IND LTD (JP)
International Classes:
G01R31/36; H01M10/48
Foreign References:
| JP2000222391A | 2000-08-11 | |||
| JP2003177165A | 2003-06-27 | |||
| JPH0756608A | 1995-03-03 | |||
| JP2011122951A | 2011-06-23 |
Other References:
See also references of EP 2933648A4
Attorney, Agent or Firm:
MORI Ryuichirou et al. (JP)
Woods Ryuichiro (JP)
Woods Ryuichiro (JP)
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