Background

Reflective films iii iutiing multiple polymeric layers e -known. Examples: of such films - _. include mirrors an# ^' polarizers which include alternating polymeric layers in which the adjacent layers have different refractive indices.

Displays may exhibit a color shift with view angle.

Summary

in some aspects of the present.descrtption, a- wavelength and polarization dependent partial reflector including n optical stack is provided. The optica! stack includes a -plurality of optical repeat units where each optica!, repeat unit includes first and second polymer layers. For wavelengths λΐ < A2 < λ3, the partial reflector has a tra-nstnittance.-fof normal iy incident light polarized along a first axis of at least 85%- for ^' wavelengths between X I and ^' 3. The partial reflector has a first reflection band having band edges at XI and λ ^' 3- for normally incident light polarized along an orthogonal second axis. The partial reflector has an f-ratio of the optical repeat units, a refractive index .-difference between the first and second, polymer layers along the second ax s, and a total number of optical repeat units in the optical stack such that the first reflection band has an average ^' -reflectance for normally incident light polarized along the second axis between 15%. and 97%, The -optical repeat units have a range of Optical thicknesses such that (Α-3- 2}/ίλ3+Χ2) is in a range of 0.05 to 0.2, the first reflection band is a primary reflection band, and ,¾3 _is t least 700 nm and no more than 2500 nra.

fn some aspects of the present description, a- wavelength and polarization dependent partial reflector comprising an _. optical stack is provided. The optica ! stack includes: a. plurality of optical repeat units, each optica] repeat, unit including first and second polymer layers, a refractive index difference between the first -and second polymer layers along a first axis being Any, a refractive index difference between the first arid second polymer 1 avers along an orthogonal second axis being Δηχ, |Δηχ| being at least .0. 1 and (Any) ^' being no more than 0.04, For refractive indices along the second axis, the optica! repeat units have a smallest optical thickness ΤΊ proximate a first side of the optical stack a largest optical thickness T2 proximate an opposite second side of the optica! stack. (72-T 1 ^: )/(T2 ! ) is in a range of 0.05 to 0.2 where T2 being at least 350 nm and no rhore 1250 tun.

in some, aspects: of the pireseni-deseriptiotf _v S .eihpu!ar poiariiep incl uding a linear absorbing polarizer, a retarder, and, reflec-tiye- polarizer disposed between the linear absorbing polarizer and the retarder ^' is provided. The reflective polarizer has a prisnary reflection band having a shorter wavelength band edge at a wavelength of at least 600 nm.

in some aspects of the present description, a circular polarizer induding a linear absorbing polarizer, a retarder, arid a reflective polarizer disposed between the. linear absorbing polarizer and the retarder is provided. The ^' , reflective polarizer -includes an optical stack including a plurality of optical

- i - repeat unite wher each optical repeat unit includes first aad second polymer layers. A refractive- index difference between the first and second, polymer .layers along a first axis is an , a refractive index d ifference bet een the first asd second polymer layers along orthogonal ^secon axis is Anx w iere ΙΔηχϊ is at least O. i and lAny is no more than i),C . Fo re&sctive indices along the .second axis,, the. piiea! repeat imiis have a smallest optical thickness ΤΊ proxim e a ^' first side of the optical stack and a largest optica,! thickness T2 proximate opposite second side of t e optical stack where T2.Is at least 300 a;n.

In sonie aspects of the present description, a display iw ikikg an organic Hgbt emitting diode display panel and .a c ^' ire ^: uSar olarizer:dispQsed.prosimate the display pans; Is provided. The organic light emitting diode isplay panel lias ajveiKissio spe¾¾*a having . ^' first, second .and third peak emission wavelengths la, A aod lb satisfying <lb -T¾e. The circula polarizer includes; a linea absorbing poianzeiya retarder disposed between the linear a soming _. poiarizer and die display panel, and a reflective polarizer disposed between the linear absorbin polarizer and the retarder.. The reflecti e polarizer has a irans ittance tor normally incident light l ised slong.a pass axis of the reileeti e polarizer of .at. least of at kiast gS¾.fe wavelength between la m4 , Md a traKsmittanee for normally incident Sight polarized along a block axi of the reflective polarizer of at least of at least 85% for wavelengths between ½(¾a÷ h) and ½(λ λε). For a wavelength A3 > Ac and a wavekngth ¾2 .satis¾itig ^: ½(Xb+Ac). < 12 < ¾3, _. the : reflecti ve polarizer as a first i¾fleerron band, having band edges at λ2 and ^' for normally incident light polarized along the block axis. The first ref!eetioa band has an average reflectance for normally incident light polarise along, the block axis bet een 15% arid 97%. fn some aspects of the present description, a display .including an organic light emitting diode display panel and a circular polarizer disposed proximate the display panel is.. rovided. The organic light emitting diode display panel has. an emission edr having first, .second an .third peak emission wayeten bs. ^.Xa and lb satisfying la < ^" ?,b < ¾.

The circular polarizer inclades a linear absorbing polarizer, a retarder disposed between the linear absorbing polarizer and the display panel, aad a reflective polarizer disposed between the linear absorbing polarizer and the retarder. The reflective polarizer has a transniittajtce tor normally incident l ight polarized along a. pass axis of the reflective polarizer of at ieast of at least §5¾ ^: fo.r wavelengths between a and c, and a ransmittancs: for normally incident light polarized along a block axis of the reneetive polarizer of at ieas of at least g$% fbr- wavelengths between ¾(la÷lb} and; !¾ b÷Xe) For a wavelength λ3 > AC and a wavelength &2.sat ying V¾b+?,c} < 2 < K3 _t the reflective polarizer has a primar ^flection band having: band edges: at 12 and 13 for normally iacident light polarized along the block axis.

hi some aspects ^' of the pfesfeot-descr ptida, display mcludirsg am organic light emitting ^' diode display panel and a circular polarfe disposed proximate tlm dispiay pm l is provided. The circular polarizer includes a linear absorbing polarker, a retarder disposed between the linear absorbing: polarizer and the display panel iusd a wavelength and polarization dependent partial reflector disposed between the linear absorbing polarizer and (he retarder. The partial reflector is a coior-correeiss parfki reflector such .that the dis ay has a AuV color shift at a: view angle of 45 degrees that is no more than 0,8 times thaf of an otherwise ecjiiivalent display having an otherwise equivalent circular polarizer not including the partial reflector.

Brief D scr5 itioR of the Drawings

FIG, ] is a schemiitie perspective view of an. exempfary Optica! repeat unit of a multilayer optical film;

FIG. 2 is, a schematic side view Of a partial reflector;

FIGS. 3A _' B are a schematic iifctraji B$:«f l_$yer ^' thickness profiles of multilayer optical film ^' s; FIG. s a schematic plot of the ; transniittanee versus ^■ wavelength of a. wavelength and polarization dependen partial re Hector;

FIG, 5 is a schematic graph of the transmission spectrum of a partial reflector;

FIG. 6 is a schematic cross-sectional view of a circular polarizer;

FIG. 7 is. schematic illustration of a pass axis of a artial reflector, a pass axis of a linear absorbing polarizer, and a fast axis of a retarder;

FIG , 8 is a schematic cross-sectiorial ie* of a retarder;

FIG, 9 is a schematic plot of retardance -versus wavelength for an achromatic reiarder:

FIG..1 ^' fi is a schematic iHustratiort of a. first fast -axis of a first ietariSer layer and a second fast axis of a second retarde r layer;

FIGS. 1.1 A- U B are-schematic cress-secfional views of displays that ^' include a circular polarizer and organic light emitting diode fOLED) display panel;

FIGS. 1 _: 2Α-ί2 ^' Β are schematic chromati.e-.iiy plots showing the variation of the color output of displays with view angle;

FIG., 1.3 is a schematic plot of a spectrum produced by a display as viewed normal to the display when the display is fully on;

FIG, 14 is a CIB (Coinmis ^' Sicsi -internati nale. dc I'Eclairage) x color plot for -60 to 60 degree inclination angle for commercial samples of Apple Watch (AW) and Samsung Galaxy Tablet 2 ( 2);

FIG, 15 is a plot of the layer thickness profile for the .reflective polarizer of Ex mple 1 ;

FIG. 16 is a plot of the transmission spectra of th« reflective polarizer of Exam le I ;

FIG. I ? is a plot of the layer thickness r file for the reflective polarizer of Example 2;

FIG. 18 is a plot o the transmission spectra of the reflective polarizer of Example 2;

FIG. .19 is a plot ofthe transmission speetra Of reflective polarizer of Example 2 for the block polarization state at.a 0 and a 60 degree inclination -angle ^' ., and ofthe emission spectra Of an OF hi. ⁾ display;

FIG. 20 is e piot ofthe gain of Example 8 as a function of wavelength for variows view angles; FIG. 21 h a plot ofthe reflectivity spectra for Example 2 and Comparative Example 2; £10, 22 is , a..pk i f the layer Thickness .profile fxjr the reflective pdarizer of Example 3 ;

FiG. 23 is. plot of the. transmission spectra of the reWeenve polarizer of Example 3 _: tor the p ss polarization state at .pornaal incidence and for t e blociopolsrizavion state' a normal incidence- and at an angl e of incidence o (iff degrees;

FJG. 24 sg a CJE. color pi at ¾f Example 4 and Comparative Example 1 fw view _. angles from -66 degrees o degrees;

FIG, 2S is a plot of color shift versus inclination angle for Example 4 and Comparative Example u

FIG, 26 is s pfes of the transrnission spectra of the refleeuve polaraer of Example 5 for the pass polarization state af normal incidence and for the block pOfarii ion stare kt storms I incidence Arid at an angle of incidence, of 60 degrees;

f IG. 27 is a GIE color plot ifaf Example- 5 and Comparative Example t lor view angles from -60 degrees to 60 degrees; and

FIG. 28 is a plot of the norma l incidence transmission spectra of the reflective polarixer of Comparat ve Exam pie 3 ,

li m eserifjifoi

In he ioEo tiig description,, retereriee is made to The accompanying drawing that form a part hereof and in wh ich various embodiments a e¾l«swft y way of illustration, The drawings are not necessarily to scale, ft is to be understood that other eoibodsineMs. are contemplated and may be made without departing from the scope or spirit of die present description. The followin detailed . description, therefore, is not to be taken in a lim iting sense,

Wayeiength and polarization "dependent ^' partial reflectors, according to some embodiments of the resent .description are useful for reducing the color shift with view angle of an organic ligh emitt ing diode (OEED) display hen the partial reflector is use in a circular poiarker of the OLED display, ^" for exampie. The partial reflectors .-may be referred to as reflective polarizers or as partial reflective polarizers: since. the partial reflectors, in some embodiments, have a reflection band for one polarization stale and not for an orthogonal polarkation state. The reffectiOR band typical ly lias an average reflectance for .normally incident light polarised along a block axis les thai) 97%,_ or less than 95*}% or less than ^' 90%, o? less than 75%, or less than 66%. The reject ion band may be weaker than the refection band of conventional iftultilayer Optical fiirft .mirrors, or eBeetive,pos.8ri.zers ^' Vvliich. typically provide an average reflectance of greater than 98%, The partial reflectors may fee birefringen t multilayer optical films with controlled band edges and tailored reflectivity with incidence angle. T¾e partial reflectors may be desi ned to have ininknal visual effects on xis wheo incorporated in a display but create optical gain for desired wavelengths off axis . It has. been fo und : that ati ieing th e partial reflectors of the presen t description in an GLED display can f>i¾vfcfe .iiii| iii!Ved-c«oru»iformlt ^' with vaiying. view angle by providing a wavelength arid: view angle dependent gain wifhont sacrificing image quality despite the typically diffusive character of the backplane of the OLED display.

^' la some ^• embodiments, the partial reflector is configured to negligibly affect light front an 0LED display at norma! incidence to the partial reflector, but provide a wave-length dependent gaiii at ofT normal incidence by recycling ^: a portion of light incident on the partiai fefleetor at off-normal incidence. This can foe achieved by choosing t e reflection band to be: predominately in the near- in feared

(wavelengths from 700 Btn to .2500. nm) at norma! incidence. At off-normal view angles the reflection band is shifted into the red wavelength rang (wavelengths from 60Q rsm to - 700 rati) and this can provide a gain for red wavelengths that increases with increasing vie angle. In s me embodiments,.. the partial reflector may provide a Wavelength dependent gain at normal incidence as well as providing a wavelength dependent gain at ^: o.tT-ho-fmal incidence (e.gi, by including _, a -Second harmonic of a primary reflection band to recycle a portion of the blue light, for exampie). This can be done to allow additional flexibi lity in providing the-desired light output from the d isplay or to correct the color temperature of light output at normal incidence when the display is fully on, for example. The partial reflectors of the present description are also useful in other display applications and i n non-display applications as described further elsewhere, herein,

A wavelength: and polarization dependent partial reflector or re fleetive polarizer of the present description typicall a multilayer optical film that includes an optica! stack including a plurality of optical repeat units where each optica! repeat unit includes first and second .polymer layers. FIG. 1 is a Schematic perspective view of an exemplary optical repeat unit (O U) of a multilayer optical film 100. FIG, I depicts only two layers of the multilayer optical film 1 (Ml, which can ^■■■ include tens or hundreds of such _, layers arranged in one or more contiguous packets: or stacks. The film 100 includes individual microlayers 102, 104. where "nilerolayers" refer to layers -that are sufficientl thin so that" light reflected at a plurality of interfaces between such layers undergoes constructive .or destructive interference to give the multilayer optical film the desired reflective or traiismissive properties. The microlayers 1 02, 104 can together represent one -optical repeat unit; (QRU) of the ..multilayer stack, an ORU being t¼- -smallest. set of layers that .recur in a repeating pattern thronghout tbe thickness of the stack. The microlayers ha e: different retractive index characteristics so that some light is. reflected at interfaces between adjacent micraiayers. For optical films designed to reflect Sight at ultraviolet, visible, or near-infrared

wavelengths, each imcrolayer typically has an ptica! thickness ( i.e., a physical thickness multiplied by the relevant refracti ve index) of less than about 1. micrometer. Thicker layers can, however, a! o be included, such as skin layers at the outer surfaces of the film, or protective■ -boundary layers (PSL) disposed within the film that separate packets . f microlayers. as desired. In some embodiment.;;, only a single packet or stack o microlayers is included in the optical films of the present description .

Refractive indices- of one of the micrelayersfe.g. microlayer 1 02 of FIG. 1 , or the "A" layers of FIG. 2) for light polarized a long principals-, y-, and 2-axes are nlx _s n l y, and n f z, respectively, The mutually orthogonal x«, >·>, and z- axes can, for example, correspond to the principal directions of the dielectric tensor of t¾.e material in nm embodiments, and for discussion purposes, the principle directions of the different materials are eojneideot, but this need net be the.case in eneral, The refractive indices of the adjacent -micrplaye?(^.g. niicrolaysr 104 in PN3, 1 , or the "'IT ^* layers in FIG. 2) along the same axes. are n2x, n2y, .ft2¾,,i¾spe i «;J . The differences «j refractive index between these layers are 4ns ( ^' = n ix - ti2x) along the x-direction, Any (™ rfl y - ^■ .« .) al ong the y-direc lon. and & ( ~ ii lz - ri3¾i alojig the z-d rection. The nature of these refractive index _. di-fi¾'enees, in combination with the nambef of raiefoiaysrs.inThe film (or m a given stijek.of the- film) a f their tiookness distri ufioR, .control the reflective and traiisndssive e!mraetiii-istics of the film (or of the given stacfe of the film). For e ample, if adjaeetjt micrdlsyers liave a large refractive index mismatch along one in-plane direct ion (Δηχ large) and a small refractive index m ismatch along the orthogonal in-plane iiireetion (Δην ~ 0). the ^•' film or packet a behave as a inflective polarizer for normally mcidentligbi, A reflective polarizer or polarization dependent partial reflector may he csssideredTo be art optical bod that _. relatively strongly trsnsirtiis -normally incident Hghtthat is polarised along ons. in-plane axis, which may be: referred to as the psss axis or .the first axis, and relatively strongly reflects normall incident, light that is; polarized along an orthogonal m-pSape axis, which may be referred to _. as the btoek sxis or tbe second axis, if the wavelength i ^: s within a reflection band of the wfleetiye ^' olari¾r or polarization dependent .partial reflector.

If desired, the refractive index difference iAnz) between adjacent: mieroiayers lor light polarized along the 2-a is can also be tailored to ¾;hieV«i ^: dfesii^l«-i«fl€©t» i^.prop^i^ ^' for tire p-polarization eoiB oi ent of obliquely incident light. To maintain near en-axis reflectivity of p-po!ari¾ed light at oblique anfles of incidence, the z-index ^' mismatch Δκζ between microlayers can he controlled to be substantially less than the ma im am 0,5 * ίΔ& Alternatively, }&f≠≤ 0 -25 ^' * ) RX1½ A ero or near zero magnitude z-index mismatch yields interfaces between rtricrolayers whose reflectivity for p-poiarized light is. constant or pe constant, as a function of incidence- angle. Furtheraiore, the z-index m smatch A can fee. controlled to have the opposite polarity compm¾d to the in-plaue index d fference Anx, .e.g., _. Λη¾ 0 when Anx 0. This condition yields ^■ -interfaces whose reflectivity ibr -poSari¾ed l ight increases with increasing angles of incidence, as is the ease for s mla ized light. If άηζ > Q, then, the reflectivity for p-po!arized tight- decreases with angle of laeidence. The foregoing relationships BlsO of cottrse apply to relation ships involving An¾and An , e;g. _x In cases, where _. signifieam refJectivi y and transmission are desired along two principal In-plane axes (such as a. partial polarizing fHrn whose pass axis has signiflcimt refleetivity ¾t normal incidence}..

In the schematic side view of FIG. 2, more interior layers of a m»lU layer spiical film 1 10 are shown so that iDulttple O Us can be seem The film is shown in relation to a loeaf x~y-z Cartesian coordinate system, where the; t¾ extends parallel to the x- and. y-axes, and the z-axis is perpendicidar to the film and its constituent layers and paral lel to a thickness axis of the .Hi nt. In Ι ^' Κ ί. 2, the microlayers a e labeled "'A" or " y the "A" layers being composed of one materia! and the "8" layers being compose of a different materia!, these fl ers being stacked in an alternating arrangement to form optical repeat units or unit cells 0!¾U I:, QR J 2, ... ORU 6 as shown, in. many embodiments, a multilayer optica! film composed entirel of polymeric materials would include many more th n 6 optical repeat units if high ..reflectivities are desired, The ^' multilayer optica] film 1 10 is sho n as having a -substantially thicker layer 1 1 , which may represent an outer skin layer, or a protective boundar layer f'PBL," m> U.S. Patent 7ί¾349 (Meav et aL }} that may separate th stack of ra icrolayer shown in the figure from another stack or packet of microiayers (if present). Multilayer ^■ o tical film 1 10 mehides a single stack Ϊ 1 having opposing first and second sides 1 15 and 1 1 7.

in some■ m odiments, the thicker layer 1 12. is optically thick in- that it is too -thick to significantly contribute to the constructive and destructive interference provided by the optica! stack, in some embodiments, an optically thick layer has at least one of a physical thickness and optical thickness that is tit least 1 micrometer, or at least 2 micrometers, or a! least 3 micrometers, or at least 5

micrometers, in some embodiments, . circular polarizer used in an OLED display includes a partial reflector of the present description disposed between a linear absorbing polarizer and a retarder for improved color urtifermky with view angle when the. display is fully on.

In some cases, the ^' microlayers of a given stack or packet can have thicknesses and refractive inde values corresponding to a ¼~ ave stack, i.e., arranged i d&l s eac having two adjaeens niierolayers of equal optical thickness, tich O Li being effective to reflect. by constructive interference light whose wavelength λ is twice the ^■ overall optical thickness of the optica! repeat unit. The "optical thickness ^''' of a body refers to its physical thickness multiplied b its refractive index, tit the case of a polarization dependent partial reflector, the refractive index used ill determining the optica! thickness is the retractive index along the. axis of the partial reflector where the reflection band reflects more strongly (e.g., the block axis of a reflective polarizer). A ¼«wa e stack, in. which the two adjacent microlayers in each ORU have equal optical thickness, is said to have an. "f-raijof -of 0.5 or 50%. ^F-ratio" in this regard refers to the ratio of the opt teal tliiekness of a constituent layer to the optica! thickness of the complete optical: repeat unit, where the constituent ^' layer "A-" is assumed to have a highe ref active index than the constituent layer "B"; if the layer ⁱ B" has the higher refractive index, then the f-ratio is the ratio of the optical thickness of the constituent layer -"9" to the optical thickness of the complete- optical repeat unit. The ^' USe of a 50% i-ratio is often considered desirable because it maxinii ^' zes the rei eetive power of the I ^st Order '{primary) reflection hand of a stack of microlayers. However, a 50% f-ratio suppresses or eliminates the 2 ^iRl order (second harmonic) reflection band (and higher even orders). This too is often considered desirable in many applications; however, as described further elsewhere Herein, it may not be desirable to suppress the 2 ⁿⁱ order reflection band in some, applications since a second harmonic of a primary reflection band can be: utilized to provide additional flexibility in achieving a desired color output.. For example,, in. some embodiments, a second harmonic is used to provide reflection in the blue wavelength range. Furthermore, according to some embodiments, it may be desired Sor the reflection hand to have a relatively w reflectance. In this case, a smaller f-ratio {or ml l-ra io closer to unity), along. with the total nuir-sberof layers and the^dlfferenee ^' refractive indices between layers in .an optica! repeat unit, can be chosen to provide a desired reflectivity. The relative _. retleetive. powers of a primary reflection band and of harmonics of the rimar TefSec on band as .f nction of -f -ratio: is described in U.S. Pat No, 9 ^' ,27%9$.\ _. { iyel etal), for e mple, which is hereby incorporated herein by reference to the. exte t that. It does; not contradict the presen descrip ion.

in some embodiments;, ih£-& i ; fc;. -fn-a raftge ..pr 0,1.. or 0.2 to i - or its a range of 0,0 to

0,8, or 0.9, or 0.94. in . other emhodinisiits, the f-ratio is in » range of 0,4 ffi &i, far example, SA the etTibodit.ae.nt of ΡίΘ.,2, _. ί1ΐ€ ¾ ^!! layers are depicted for generality as being, thinner - than the «fi ^¾ layers. Each depicted optica! repeat un it (ORU I, ORU 2, etc.) has an optical thickness (Ο ^' Π , O ^' lX etc.) equal to the sam of the optical thicknesses of its constituent ¾ ^*' and "S ^{' *} layer, and each optical repeal Wmt provides 1 ^¾ order refketioo of light whose wavelength λ is twice the overa l l optical thickness of the

ORii

To achieve a desired reflectivity with a reasonable number of layers, adjacent mierolayers ma exhibit a difference In refractive inriex:{jAnxj> for Sight polarized .along hex-axis- of at _. feast 0.05, or .at _. least 0, 1, or at least .021. S, for exam l ; Adjacest microhryers ma exhibit -a . ^■ smaller difference in refractive, ndex (|Anyj) for light polarixed along the y-axis. Fo example, in some sraboditnents. jAsy[ is no mere thatt 0,04, no more, ttao 6.02,· or tie more than O.Ol .

n cm!ayer may exhibit a refractive index match: or mismstch aibngthe z-ax or jAnzj large),, and the mismatch may be of the same or pposite polarity Of sign as: the in--piai1e refractive index mismatch(e$): Whether the reflectivity of the p- oi t s¾d component of oblsqucly inciclent light increases, decreases, or remains the same with increasing incidence angle can he controlled by such tailoring of ώη . The refi-aetive indice and refractive index diiterences ma he specified at.s fixed reference wavelength (e,g,, 532 n ) or may be specified for each .optical . repeat no ft at the 'wavelength ^• where the optical repeat unit is eonfigujred to reflect.

In some embod irrfents, the total, number «*f optfeai repeat un ts in the _: optical .stack is at least 25, or at least 30, or at least 35, or at least 40. in some embodiments, the total naraber of optical repeat units is no roore than 300, or no more than 200, or no more than 1 SO, or no mors- than 1 0, or no more than 150. A larger numbe of optical repeat units may he used k embodiments with a smaller (or closer to unity) f-ratio, and; a smal ier number of optical repeat units may be used in embodiments with: an f-ratio ^■ near 0,5,

At least some of the microlayers in at least: one packet of the ^■■ multilayer optical films ma be btrefringent, e,g,, _. aniaxiaUy hirefnngeni In some eases, each ORIS may include one hirefringent micro-layer, and a second:,microlayer that is either isoty ic or tbat has a: small, amount of bireiVi igence relative to the other microSayer. Itt alternative eases, each ORU may include two bireirhigent nticroiayers.

The multilayer optical films can be m de using any suitable lighMransniissive materials, but in many cases It is beneficial to use low absorption polymer ..materials. With such materials,- absorption of a mierolayer stack over visible and infrare wavelengths ¹ cm be rsiade sffm!i of negligible, such that the sura of reflection and transmission for the stack (or an optica! fi lm of which it is a part), aiany given wavelength and for- ny specified angle ofTucidence and. polarization state, is approximately 100%, i.e., K ^ ¾ 10( %, or R ~ ! 00% - T. Exemplary niulii!ayer .optical filets are: composed of polymer materials and may he; fabricated vising coextrudiog, casting, and orienting processes, Refereft _. ee is made to 0. . Patent S,$S2,774 (Jonza et al.) 'Optical Film", X).$ _r ^' Patent 6, 179,948 (Merrill et al.) "Optical Film and Process for Manufacture Thereof > U.S. Patent 6.783,349 (Neavin et - a.!,) ^" 'Apparatus for Making

M Iti layer Optical Films", and patent application publication US 201 1 ^' 027284 ( eavin et a?,) "Feedbiock for Manui¼turiri.g Multilayer ^' Polymeric Films". The .multilayer optical film may be formed by eoextrasion of the polymers as described in. any of the aforeme ^' ntioiie-d references. The polymers: of the various layers may be chosen, t have similar theological properties, e.g., melt viscosities, so that they can be co-extruded with ut ignificant How disturbances. Extrusio conditions are chosen to adequately feed, melt, mix, and pum the respective pol mers as feed streams or melt stream in continuous, and stable manner. Temperatures used to ^' form and maintain each of the melt streams -may be chosen to be _: within a range thai avoids freez rig, crystallization, or unduly high pressure drops at the low end of the ^' temperature range, and that avoids .material degradation at the high e d of the range.

i n Brief summary, the fabrication method can include: (a) providing at least a first and a second stream of resin cortespondirtg to the first and second polymers to be used in the finished film; (b) dividing the first and the second streams into a plurality of layers using a suitable feedblock, such as one that .includes: (i) a gradient plate -comprising first and second flow channels, where the first channel has a cross-sectional area that changes from a first position to a second position along the flow channel, ( ti) a feeder tube plate having a first, plurality of conduit ^' s in fluid communication with the first flow channel and a second plurality of conduits in fluid communication with the second flow channel, each conduit feeding its own respect ive slot die, each conduit having a first end and a second end, the first end of the condui ts being in fluid communication with the flow channels, and the second end of the conduits being; in fluid communication with the slot die, and (iti) option lly, an axial rod heater located proximal to said conduits: (c) passing the composite stream through an extrusion die to form a multilayer web in which each layer i generall parallel to the. major surfac of adjacent layers; and (d) casting the multilayer web onto a chill roll, -sometimes referred to as a easting wheel or casting. drum, to form a east multilayer film. This cast film may have the Same number of layers as the fioished fiini, but the layers pf the cast film are typically much thicker than those of the finished film. Furthermore,, the layers of the east film are ^• typically ait isotropic. A multilayer" optical film with .controlled low ^' frequency variations in reflectivity and transmission over a wide wavelength range can be achieved by the thermal ¾one control of the axial rod heater, $έέ e.g., U.S.. Patent 6.783,349 ( eavsn et al. ),

After the multilayer web is cooled on the chill roll, it can be drawn or stretched to produce a finished or iieai -finished multilayer ^' optical fiifn, The drawing or stretch ing accomplishes two goals; it thins the layers to their desired final thicknesses, and it may orient the layers such that at least some of the layers become birefrmgeni, T! e rien at on m stretching can he accomplished; along ihe _: cross-weh direction, (e,-g., via a tenter), along the- down-web direction (e.g., vis a, length oriemer) or an

eombkation bereof. whether sirRuhaneousi r Kequea iaOy. If stretched^ along, ooly one direction, the stretch ean be ⁱ 'tif¾coiistrained ^f' ' (wheremfhe Sim is allowed to dimensionally relax, to the in-plane direction perpendlewlarlO; the stretch dtreeooi ) or ^'' ''constrained" ^' (where j ttie.:film is constrained and thus oot Uowsd to dimehstonaily relax in the in-plane direction perpendicular to the stretch direction}. The stretch cah.be asymmetric .between, orthogonal in-plane directions: so that the resobing/filni will have a polarization dependent reflectivity _* in se e: embodiments,: the film may be stretched in a batch process, In anyease, subsequent or conchrreot drawredeetion, Stress . or strain equtlibfatiois, heat setting, and other processing ^' operations can also be a pl led to the- film,

h« i lnt may be formed by eoextrudjfig ^' ang or ^' more sets of films composed of large num ers of tpierQlaycrSTo constitute -what is CQ!hmonly eaiSed a packet of typically .alternating isotropic and birefringent layers. The packets ar? typicaiiy ^' formed in roll processes wherein the: ecoss-web dimension is commonly labelled transverse direction (TD) acd the dimension along t e length of the rol l is called machine direction (Mi)), Furthermore, the packets may be carefully stretched hi the forming process in machine direction, and transverse direetlon i carefully controlled ientp¾raUsfe,2oftes _: to affect the hifefringent layers in what is commonly _, eferred to as a festering -process, Farthermore, the {entering pfocessea a provide either l inear traosverse streish or parabsiie stretch of the. packets as they are formed, A controlled inward linea refraction commonly referred to as "toe-hr' may be. used io allow fo controlled shnntageduring the cool down, zenfe, he process- can be used io provide 30 to 600 .layers,, for exam le, or more for desired optical efiects ana may also include external "skin" layers as needed.

The partiai reflectors of m present description typically ha a primary ^' {first, order) reflection band ih the reci and/or near infrared and -op ionally a .second harmonic (second order) band partially in the blue. Each wavelength jo amrm'.'-prder band is 1 /m times a wavelength i.rt the ffr¾ order band. The location and bandwidth of the higher order bands are thensf re .determined by the _. location and bandwidth of the first- order band. In- order to aeh ieve a desired wavelength raoge for the primary reflection band and the second harmonic, it desired that the primary reflection band He in a suitable wavelength range (e.g., an infrared reflection bapd with a suiiahie bandwidth). This can be achieved by tailoring the thickness profile: that is,, by tailoring the optical thicknesses of the OllUs aceordi g le a thickness gradient along the z^axis. or thick ess direction of the film, whereby the optical thickness: of the optical repeat units tacreas^s, decreases, or follows some other ftsimiionaj rekdonshlp as one progresses from one .side .of the stack (e.g.., the top) to the other side of the stack (e,g., the: bottom). The tWeJ ness profile ..can also be tailored to adjust the slope; of the primary reflection b& i ands r a sharpness of the bapd edges

FIG..3 A .is a. schematic illustration of a layer- (ft iekness profile f an optical film having a single stack of optical repeat units. In this case, 46 optical e eat units: are included and the thickness varies Imeariy across the iim, In some embodiments, the layer, thickness fc'Ofile is substantially co itmotis. A layer thickness profile may be described as. substantially continuous if to a ood approximation (e.g., to

IS within 10 peree-nt error, or to within 5 percent error, ^' or to within 3 percent error), the optical thickness of any interior optical repeat un.it can be determined by li-near extrapolation ' ^' from the opticai thickness of the optica] repeat units on eit r Side of the interior optica! repeat unit

in some embodiments, the optical repeat, units have, an optical thickness that varies substantially continuously from a first side of the optical stack to an opposing second side of the staek. The thickness variation may be chosen to provide sharpened ^' band edges as described in U S 6,1 S 7,4¾> (Wheaiiey et al.), for example, or may be chosen to provide a- more gradual transition from high to low reflectivity, in some embodiments,- the optical thickness of the optical repeat units varies between a minimum value and a maximum value, the maximum value minus th minimum value being no mare than 35 percent of the maxiimim val ue and n less than 5 percent of the maximum value, in some embod iments, the optical thickness monotonieally increases; frorn a first side of the single stack to an opposing second side of the single stack. As illustrated in FIG. 38, which is a plot. of the optical thickness of the optical repeat units in a single stack as a function of vertical (z-coordi-nate-. of FIG. 2) osition in the single stack, in some cmtKjdiments, the qptical thickness monotonical!y decreases from an optical repeat tin.it 3§ 1 at. the first side at position S ; of the single stack to an optica!; repeat unit 383 (which has a smallest optical t ickness T l ) w ithin the stack at position Pi , monotonieairy increases from the opt ical repeat unit 3i¾3 to an optical repeat un it,385 (which has. largest optical thickness T¾ within the single stack at positio I¾ disposed between the second side at posito S¾ of the single stack and the optical repeat unit 383, and monotoiilcaily decreases from the Opticai repeat unit 385 to the second side at po si ton & of the single stack. In some embodinienia, a separation between the first and second optical repeat units (P>-Fi) is at least half, -or ^' at least 70%, of a thickness of the single stack (SI-SJ). Other possible layer profiles include a smile profile (thinner in the middle of the slack than at the edges) and a frown profile (thicker in the midd le of the stack than at the edges).

In. some embodiments, the thickness variation of the optical, repeat units is selected to give a desired slope of the primary reflection.- band. For example,, the primary reflection band s¾ay be more reflective at higher wavelengths and less, reflective at lower wavelengths, or may he less reflective at higher wavelengths and more reflective at lower wavelengths, or may have a substantially constant; reflectivit in the primary reflection band. Adjusting the slope of the reflection band can provide additional flexibility to adjust the reflectivity with incidence angle and thereby adjust the output color of a displa w ith view angle, for e ample.

I n some embodiments, for wavelengths % i < X2 <- λ3, the partial reflector has a rransm fance for normally incident light polarised along a first axis of at least 85% for wavelengths between λ ΐ and λ3. and the partial reflector has a first reflection band having band edges at ¾2 and λ3 for normally incident light polarized along an orthogonal second axis.. In some embodime ts, the partial reflector has an f-ratio of the optical repeat units, a refractive index difference between the first and second polymer layers aiong th secon axis, and a total n umber of opticai repeat units in the opticai stack such that the first reflection bafcd has- an average reflectance for normally incident S ight polarized along the second axis between 15% and 97%, .er bet een 15% and 95%, or between i.S% and 96 or etween 20% and 85%, or between ^' 20% and 75%, or between 25% ami 60%, foe example, la some embed Iments, the optical re eat nits ha e .a tan s- of optical thicknesses sneh th'at^-Xi ^^ _. kat. least 0.03, or _. at tests* 0.05. Or at least 0,0?, and no more than 0,¾ o no more th n 0.O2, or no more than 0,015 (e.g„ in a range of 0.05 to 0i2}_ For example, in soti>e embodime ts, the optica! re eal units have a .smallest optical thickness Tl proximate., a first, side (e.g.* osition Si) of the: ptical stack and a largest optica! thickness T2 proximate an opposite second, side (e.g., position $.2) of the optical stock where ( 2-T i }/fT2-÷Tl ¾ ia n a ■range of 0.05 to 0:2 or n any of the ranges described tor (A3 ,2) (W÷A _: 2 A position within the optical .stack may be described as proximate a first; side of the opdcai staeieif it is closer to -the first side that? the second side, , S m slariy, a ppsit ^' iofi within the optical stack, may be described as proximate a second side of the optical alack if it -is closer to the secoad -side than th« first stele, in some embodiments, T.2 is at least 300 .nrrvor at least 325 nm, or at ieastJSQ nm, or al ^' MS ton, or at least 3:$0 nm, or at least 375 nm, In some embodimen ts, Ί2 mi mom than 1250 «% sf no mere than BOG nm, or no more than 500 ftnvor ηό more than 450 lira.

The transmittance of a wavdengi an polarization dependent pK tisJ reflector or partial reflective polarizer is scbemaiicidiy illustrated in FiG, . In the illustrated embodiment the trans ittance 410 in the pass state (polarization state with light polarized aiofig a first (pass) axis) lor normally incident fight. ^' has the value Tp which may be .at least 85% _s o at least 0Q¾, for example, it: some embo mci S, th« _. :-transmittanee in the pass state _. for normally fedd ii light is. at least S5¾, or at least 90% over at least a. wavelength range from _. %) to X3, Th^ transmittal 42ft inthe b ek state (.pol«l?atioa::State with light polarized along a second (block) axis) exhibits a first; reflection band 401 snd a second reflection band 402. In sooie.embodistisntSj the ¾¾ reflectio ::b'srid ^: 4 1 is a primary reflection band and the second reflection band 02 is a second hatmonicof the primary reflection band. The first reflect ib« band 46 ! has a shorter wavelength band edge of ¾2 and a longer waveiength band edge of X3. some en bodtt eii s, λ2 is about 2 imes: a srnaiSes† optical thickness Ϊ S of the. optica! stack of the partial ^' ., reflector, and ¾3 is abotit ^' 2 times a largest optical thickness T2 of the optical stack. The seeend reflection band 402 has a shorter wavelength band edge of k$ and a longer wavelength band edge of A4. tr, embodiments here the first reflection hand 4Q.s is a primary reflection band and the second reflection band 402 is a second ha nwnie of the primary reflection band, ¾5 is sboni ¾2 2 and 4 is. about 72 In s me ^rRbOilima ts, the first re lection band 401 includes ftear infrared ^' waveiengtns ( i,e., at least one wavelength between

700 m and 3500 am is Included in the; range from λ;2 o:.X y .in sonye embodiments, the .second; reilsctiorr b¾nd 402 imliKies visible wavelengths (i,e., at least one waydength in _: a range of 400 nm to 700 nm (e.g„ 4.00. am) is inckfded in the: range .from 15 to 1 ), I other embodiments, _. 14.may be: less than 40.0 nm. in some embodiments, 14 is no i¾o _s %* ihass 500 nm,o no more than 450 nnibor no more than 430 nm, or no more than 10 nm, in some embodiments, 14 is in a range of 400 nm to 500 nm.

la some embodinrents,,the first reflec ion band Is.a primary reilestipri band having a band etige ,λ3 of at least 700 nm, or at least 7 ; 0 am, Of..at least 720 nm, or at least 750 jan.Jtt so embodiments, the band edge λ3 is no more than 2500 nm* or no siare. thars i 500 nhH or no more than 1 00 torn, or ho more than 900 am. For example, in some .embodiments, ¾3 s in a range of 700: n to 2S00 ran, or 710 nm to 1 08 dm, or 720 nm ίό ^' 900 nm, or 750 ran to 900 mil. In some enrbodsmenis, the band edge .X2 is at least 601) nm, or at: least 610 nm, or at least 620 nm. In some embodiments, λ2 is no more than 750 nm, or Ro more than ^' 710 nm, or no .more than 700 nm. or no more than 690 nm, or no more than 680 nni . For example, in some em ^' bodirtlems, λ2 is in a range of f¾)0 nm to - 700 i ₍ or in a rang of 610 nrn to 690 rati. In some embodiments, A t is no more than 480 nm, or no more than 450 nm, or no more than 420 nm, or no more than 400 nm. in some embodiments, X I is at least 380 nm, or at least 400 nm. For example, in some embodiments _. , λ ί is in a range of 380 nm to 480 nm, or in a range of 400 nm to 450 in some embodiments. A t is 400 mm

In some: embodiments, the first reflection banc! f a partial reflector is centered on a wavelength Ac between 9/00 nm and 980 nm {e.g., 940 nm), for example, and satisfies 0,05 (X3-X2)H}3 ) 2)≤ 0.2. The partial reflector could be adapted to reflect wavelengths near λε at one angle of incidence but not at another angle of incidence dire to the band shift with incidence angle. Such partial reflectors are useful in sensor -systems, for example, as described further elsewhere herein.

Tire first reflection band 4 i has an average tmnKmsttanee for normally incident light polarized along the; second xis of Tb l , The eorrespondi.ng average reflectance, Rb ί ., .fprnormaily incident light polarised along the second axis i S - Tbl , -where S is the sum of the average reflectance and the -average tiitnsmittance which may be about 100% neglecting: surface reflections and absorption, in .some embodiments, the reflectance is not constant over the ban width of the reflection band . The average reflectance over a band can be expressed, as the integral of the reflectance over wave!efigthS: j ^' » the band di vided by the width (e.g..,. A.3 -,,2) of the band, ίή some embodiments, Rbl is greater than 1 5%, or greater than 20%, or grester than 25%, or greater than 30%. In some embodiments, Rbl is less than 97%, or less than 95¾, or less than 90%, or less than 75%, or les than 60%. For example, its some embodiments, Rb l is between 1 5% and 90%, or between 20% and 75%, or between 25% and 60%. Similarly, hi some embodiments, Tb l is between 10% and ¾5%, or between 25% and 80%, or between 40% and 80%. The second ref ation band 402 has . an average t an smiftance for normally incident l ight polarized aiong f.be second axis of Tb2. The corresponding average reflectance, Rb2, for normally incident l ight polarized along the second axis is S - Tb2.. Rb2 may be is any of the ranges described for Rb l . Similarl , Tb2 may be hi any of the ranges described for Tb l , Rb¾ may be greater than, less-; than, orabout equal to Rb l depending on the f-raf to. of t&e optica! stack of the part ial reflector,

FIG. 5 is a schematic graph of the transmission .spectrum of a hypothetical partial reflector. In this figure,. transmittance is plotted against wavelength λ in nanometers, the wavelength, axis extend in over the range from 400 to lOOO nm, The curve 301 may represent the: measured transmitlanee for light at normal incidence polarized along a block axts. The illustrated reflector -selectively blocks light within a narrow band in a portion of the red and near infrared region of the spectrum, evidenced by the relatively low iransniittalice ofthe reflection ^' band 30 la of the -curve 301 . In order to qu antify relevant features of th curve 3. 1 - a baseli ne val ue B of the cur ve 301. a peak value P of the curve 301 (in this ease the peak value F corresponds to a trsitsra ittaace mmin-mm for the■ reflect soft band 3 (Ha, sho n at point p3), an a intermediate val ue H. of the curve 3:0.1 , halfway between F and B are identified _. to FIG, 5, The carve 3 l intersects wkh the value -i at the pomt& l and p2. These points l ie on the shorter wavelength, band edge . (1? an&the iofiger wavelength ^' a fid edge 30, respectively, of the teflect ii band 301 a and define the shorterwaveiengilyband e ge wavelen th λ2 and the longer wavelength band edge wavelength λ . The shorte and longer wavelength band edge wavelengths can fee Used to- calculate .hvo.atiVer pteneter:. ^: ef interest-- he itfth .( ull width at S f- raaximunt, or ⁱ⁴ F HM'Tof the rfeftoctton ted m% which equals λ3 - λ2; and the center wavelength ^: of the reflection band 30 Is, which equals (3ν2+·¾3) 2. Note that the. center wavelength m U lite sa e as or different fjrotft the peak avciehgih (see point i.} of the ^: reflection band .301 a, depending on ^¬ flow s mmetrical opasysrtnietrieal the reflection band JO la is.

Tne transnthtance of an optical element refers enerally to the transmitted light intensit ..divided by the ineideat light; intensity (for light of a given wavelength, incident direction, etc,), but may be expressed in terms of "external iransrnittaRce" or "internal tra smittauce' \ The external transmit atic^ of an optical element is the transrftittance of the optical element when immersed in sir, and without making any corrections dor P resnei reflections atthe alr/eisinent ifrler¾ee.at the h¾rii of ¾e _. element orf r Fresnei refleetidns at the element/air interface at the back ef the e{e.nte?U. The internal trans ittanee o an optical demerit . ^' is the traoswtitiauce of the element bes! the Fresnei reflection:;; at its front ane back Surfaces have been, remo ed The removal of tbe ^: front and back Fresnei -reflections may -fee done either o ^' mptft tio ^' &aiiy (e.- , by subtracting an approp iate f tctio front the external tralismissio!Vspectruin), or experimentally, For many types of polynier and glass materials, the Fresoe reflections are about 4 to 6% (for normal or iieaMtorfnal angles of Inetdehee at each of the two -outer- surfaces, which results in a ddwn ward shift of about 10% for the external. trauSfniilapee relative to the _. inte-rasi transroittS!ice, FIG, 5 does .not specify whie.h-.of these traos ittaflces i& used, hence,.. i : ay generally apply ^' to. either internal o.r extemai iransndftance. If trapsipittanee is refe red to- e ein without being si ecifisd as .internal or external, it may be a sume that the transmdtanee refers ^' & external transffiittance, unless otherwise indicated by the context.

In some embodiments, a polymeric rmdtilayer optical Slim rriay have. a reflection bitn.d,ha;y ing a maximum -reflectance :|e.g. _> at point p3 in FIG, 3) -sf at least !S%, or at least 20%,.or at l ast 25%, or at least 3 _. 0% (or/a ηιϊηίηηκ tramtni tance that is less than §5%, or less thyt! 80%, or less than 75%, or less than 70%). In some eases, the interna; ttansrahtanee ihr ugh the optica! film may be at least 80% in regions -on. either side of the reflection hand, or ai teast 2G higher than the min imum transniiftance on either side-of the reflection-band,. For example, in some embodiments, (he optical film may have a mlnhm tt internal transmiitance . in the reflection baKd of les than. 40% and may have an interna! iransmhtariee of at feast 80% _. at a vvavejengfh 10 rtm -shorter, or- 26 «rn SHOrter,:or 30 nm shorter thatt a shorter wavelength band edge of the reflection band, a /or the optical (l ira ma have an interna! transmittance. of at least 80% at a vvaveSen tii I Q mti longer,, or 20 run longer, or 30 rim lin er than a longer w¾veSeogih band edge of the reflection band,

The partial reflectors of t|ie present, description are useftd in display applications and have been found to provide; reduced color shi ft hi OLED. displays incorporating the partial reflector in a circular polarizer. The- artial reflector?- may- ^' also be _. advantageously used in other display applications arid in non-display applications. For example, die partial reflectors can be used in a recycling cavity of a liquid crystal display Or of a light source used in display or non-display applications to adjust the wavelength distribution of the light output as a function of angig. As another example, the partia l reflectors may be used in sensors or sensor systems where it may be desired to block or partially block one polarization in a relatively narrovv near-infrared wavelength range ( ^' e.g., (λ3 .2),''(λ3+λ2) in a range of 0.05 to 0,2 where the wavelength range from ¾2 to I3 ^: includes near-infrared .wavelengths), For example, the partial reflector may be: used in an optical tl!te covering a sensor, or covering a light source used i-n a sensor application, or disposed on a marke (e.g., a retroreflecttve marker) used in a sensor application, in some embodiments, a partial reflector of the present description is used as the near-infrared, polarizer of an optical filter including -a near-infrared polarizer and a visible light blocking Filter, and -may be used in an optic l system, or optical device including the optical filter and one or more of a sensor, a near-infrared light souree, and marker. For example, the partial reflectors of the present description, may be used as the polarizer in the .-optical filters described in FCT App!, Mo, Pi-T/U.S-2 ^' 0 ] 1/034941 (Wheatley et al,}, which is. hereby incorporated herein b reference t the extent that it does not contradict the present description- The partial reflectors of the present description ma also be used in optical systems and optical devices such as those described in PCT Appl. No. jp lVUSSO 1 7/O3 ^' 4 ^' 41. (Wheatley etaJL). In some embodiments, a partial reflector of the present description is used in an optical device selected from the group consisting of a wearable electronic device, a medical diagnostic device, a ceil phone, a near* infrared-markerj a component of a garage door opening system, and a component of a driver assistance system, in some embodi ents, a partial reflector of die present .description is used in an optical system selected; rom the ..group consisting of medical -diagnostic:- system, a garage door opening system, and a dri ve ass i stance syste n ^' t

The partial reflectors of the present description have been found to be particularly advantageous in correcting the color shift ofa display, such as an OLED display, with vie angle, In some embodiments, the partial reflector is. a eoior-eon ^* ectmg partial reflector which is disposed in a circular polarizer between a linear absorbin polarizer and a retarder. PIG. 6 is a schematic cross-sectional view of a circular polarizer 650 including a linear absorbing polarizer 652, a partial reflector 600 and a retarder 656, The partial reflector 600 may be any wavelength and polarization dependent partial reflector or reflective polarizer described herein. Partial reflector 600 includes Optical stack 613, which includes plurality of alternating polymer layers, and ineisdes: optically thick layers $1? and 614, Is some embodiments, partial reHeetor o ^' ili is a reflective polarizer disposed between the linear absorbing polarizer 652 and the retarder 656, where lh¾ reflective polarizer baa ..a primary reflection band having a: shorter wave length band edge (e.g:. 7£ of FIG. 4) at a wavelength of at least 600 am,

In some embodiments, partial reflector 6 0 is a reflective polarizer disposed b&W y the linear absorbing polarizer 652 and the retarder 656, where the reflective: polanzer iaehdes an optical stack nioSudlng a plui-alify of bptleal repeat anfe where each -optical repeat tnii includes: first and second polymer layers, and where a retractive index difference between the first &ηά seeorsd polymer layers along a first axis is Any, a retractive index (difference between the first and: second polymer layers along atV Ort ogotial second fixis is ^' Anx. la same enmodhnents;, jAa rss l least 0, 1 and iAnyl is no more than 0,04. lR--sofris..em ^' odiioeiltSj. for tracti e ^' iij Uces along the. second axis, the optical repeat units have a smalles optical thickness Ti proximate a first sloe of the ^' optica! stack and a largest optical thiekness T2 proxiaia¾ an opposite second side of the Optical slack. T2 and/or (T2-T2)/(1 ^" 2+ T2) nm be m any of tlie ranges .described elsewhere herein. For exaaipie _: , in scmfe embodiments, T2 is at least 3ββ ran, or at least 350 mm and/or is no. ^' more than 1.250 tart

FIG. 7 i$ a scheaiatie illustrat on of a first axis 133 of a partial reflector, which is a pass axis of the partial reflector, and a pass: axis 743 of a linear absorbing polarizer. An angle Θ between the pass axis 743: aad the ^: first axis: 733 is illustrated, if t!w angle-i is lesa than 20.degrees, tlm: pass axis 743 may be described as substantia) i aligned wi th the first ax is 733 , hi some emb diments, the angle Θ is less titan I f} degrees, or less than 5 degrees. A fast axis ^" 53 of a retarder i.g also ^' hhtstrated.. The fast axis 753 makes art obiiqae angle φ with the pass _, axis 743 of. the iiaear absorbing polanzer: In some embodiments, the bitiiue angle. φ is> betwe n 40 and 50 degrees, in some erabodimeats.. φ. is about 45 degrees.

In some embodiments, a retarder incKides a pl uralit of retarder layers. FIG, 8 is a seliematie oross-secttonal view of a retarder ¾56 includ ing a first retarder layer 857 and a second. retarder layer 859., fti some embodiments, addttiosal retarder layers ma he mehided. Multiple retarder (avers ma be utilized to give a retardanee in waves {e.g., the retard rtee in nm. divided by the wavelength iii iini) that is independent. or only weakly dependent on wavelength. FIG. 9 Is a schematic plot of retardanee in waves versu wavelength for a hypothetlcai chrom tic retarder. ^' The achromatic retarder may have a single layer or may include multiple layers, la the illustrated embodiment the retardaace is one fou th of the wave length at two wavelengths, la some embodiments, for at leaxt one _: wavelength in a range: from 400 nm to /(JO ran, the retarder has: a retardan e _. of one fourth of the : wavelength. In some embodiments, she retarder has- a retardartce of one fourth the wavelength for onowaveiength and in some embodiments, the retarder has a reiardanee of oae,fo«rth the wavelength for two or more wwekngt s. In some embodiments, the retarder has a retardanee:difi½rerii 4 rom quarter wave. For example, a retardaiice. of (η-Η ί /4) may be tised.

I n sortie embodiments, a retarder mcmdes a phH¾l.tty ¾f retarder layer where a first retarder layer in the pi oral ity of retarde tsyera has a first fast axis and a second retarder layer la tile plurality of retarder layers: has a second fast axis. In some embodiments, the flrsTand second fast "axes- are ^' parallel and in .sam«: embodi ments, the first an-d second fast axes are not parallel. Non-parallel - fast axes may be used in a retarder of a circular polarizer for improving the aehromaticlty of the circular polarizer, FIG, i f) schematically .illustrates a fu st fast axis 1053 of a first retarder layer and a second last axis 1054 of a second retarder layer where, the first and: second fast axes 1053 ard 1054 are not parallel. The angle φ between ie first and second fast a&es 1053 and 1054 may be any suitable angle, in some embodiments, is about 0 degrees (e.g., .between -5 degrees and 5 degrees). hi other embodiments, is between 0 degrees and 45 degrees. f .between 4.5 degrees and 90 degrees,

FIG. 1 1 A ts i.a schematic cross-sectional, v iew of a display 1 199 including-a -circular polarizer 3: 1 50 Wad an.01,KD display paeel l ^' l 75. The circular polarize!' 1 1 50 way be: any- circular polarizer •described het ein In the illustrated embodiment the circular polarizer 1 150 includes linear absorbing polarizer 1 1 52, partial reflector 1 100, and retarder 1 1 56. The partial reflector 1 1-00 may be any wavelength and polarization dependent partial reflector or reflective polarizer described herein. -in the illustrated eraiboditsent, the OLE.D ^■ ■display panel 1 175 includes an Oli ^' ED stack 731 and an interior layer 734, The OLEO stack 73:1 typicall includes -an emissive layer, electrodes, and a hole transport layer. The interior layer 734 may be an encapsulant layer for the OLED stack 73 1. In some embodiments, other layers arc disposed between the circular polarizer 1 1 50.and.the OLED stack 73 1 , Additional layers such as a touch sensitive layer, for example, may also be included.. FIG; 1 1 A illustrates a first light output 742 at a view angle of zero degrees relati ve to a normal 746 to the dtsplay 1 199 and a second light output 744 at. a view angle of a relative to th norm l 7 The view- angle a .may be 45 degrees and the display ma be fuiiy on when various colors and color differences are specified. As used herein, unless specified differently, the view angle refers to the view angle relative to the ^' normal to the display as observed in air externa] to the display.

The color of light 744 may be d ifferent from the color o? light 742 when ^' lire display is fully on. In some embodiments,. he color shift or chromatic ity dsffet-ence .beiween light 744 and light 742 is less than that of a comparative display which . is, otherwise equivalent to display 1 199 except that the partial reflector ! 100 is omitted. FIG. I I B is a schematic cross-seetiarsal view of a display 1 199c which is therwise equivalent to display 1 199 except that the partial reflecto 1 .100 is not included. The eircalar polarizer 1 1 0 has becsv replaced with the comparative circular polarizer 1 1 S0c- hich includes the linear absorbing polarizer 1 152 and the retarder 1. 156. but not the partial reflector 1 100.

in some embodiments, the display 1 199 has a Au color sh ift t a view angle of 45 degrees that is no mo e than 9,8 times, or no more than 0.5 times that of the otherwise equivalent display i i 99e. The AiiV color shift refers to the color shift or chromatichy: distance as observed in air external to the display when the: display is folly on. The A«V color shift or chrpn aiscity distance refers to the Eucl idean distance between two points in the CfE (Commission Internationale de i'Eclairage) 1976 UCS ( Uniform Ghromaticiiy Seals) chromaficity diagram. For .example, if a first color has CLE 1976 DCS color coordinates (u ^! _¾ ,v' i) and a different: second color has CIE 1 76 UCS color coordinates (u'>:,v'a), the chromatic ity distance between the two colors js ^' iven y the positive square roof of (W = _, ξμ'Η^ί > ^? ' ⁺ · <v v'i}*

FIGS, ! 2A-12B ^' rs. sct!ewaiie CIE 1935- UQS o'tf' plots showing the variaiioii of the color out ut of OLED displays with view angle. IG. Γ2Α shows the-coior putpiit of a displa ιιοί mcktding the partial refleptor (e.g., display 1 i 99c) and FIG . 1 _. 2B shows the _. color o ipat of dismay wtan s partial -reflector of ti¾B ^: _: pre§e».t. description, is included In a circular polarizer of the display {e ,, display 1 _. 199). Paints correspoiKimg to view- afrgi.es in air of 0, 45 and 60 degrees; ars shown on both: plots. Similarly plots.askg CIE y coordinates can fea.used in ad-diiio to: or ^' instead of CIE u'v' plots to

color otitput. The eolox shift- ith view .Single is. substantially reduced. hen the partial reflector is included. The pa ai refle ^' eior provides a ^ol f shit by reeyeSing light having a polarization ch that it wotdd otherwise e absorbed by the absorbing polarizer. In s me embod enis, ibis provides a gain that is wavelength and view angle e endent due- to ih* wa el ii h dependence of the reflectivity of the partial reflector.

FIG . 13 is a schematic p ot of a speciumi produced _, by ^' .a display as viewed normal {zero view angle) to the display when the display is felly on, The display in&issdes an OLED display panel having an emission spectra that includes first, second and third peak era isai s wavelengths Aa, Aa and lb where ₅ Xa :¾b < In. some-enibodinieots, the. displa i clu es a circular polarizer disposed ^' proximate, the dismay panel, where the citedar pdiarszer inehsdes a refect-ive polari¾er, which may be any of the partial reflectors described elsewhere herein, disposed between a linear absorbittg polarizer and a retarder. hisorne embodiments, the wavelength dependence of the:rei eci¾ncc and. trafiSQjittasee.of ^' t-he reflective, polarizer fs _. :seleeted based on -the wavelengths- ¾ , As and Ib. of the display that the reflective polarizer is configured to be: incorporated e.g., FIG. 4} iaa be chosen relative to the wavelengths λβ, Aa and Kh in sortie embodiments, the reflective polarizer has a traasmittance for normally incident light po ^' lariaed. along a pass ani af the reflective polarizer of at least of at least . ·85¾. tor- wavslengtlts ^' between Aa and λο _Γ sa a fraasmittance for normally incident light polarized ¹ along- a block axis qf the rsfiective poia.t¾sr f t least of at least 85% fdr wave lengths between ½(Aa' ^; - - }- nd ½{¾ί-? }. _: 1« some embodiments, the iransiTtinance for normally incident light polarized along the block axis of the reflective polarizer is at least W%, o at feast 85%,· for wave lesigths between ΧΆ and Ac. hi sdrae embodiments, (bra wavelength. Ή ^" > Ac and a wavelength A2 satisfying ½(¾ ^' b+Ac}- ,¾2 < λ the reflective polarizer has a :t¾st refleetioa band having. band edges at ¾2 and A3 for normally incident light polarized aloog ihe block axis.

reflectts!vbaad has sn average ^' reflectance for nanftally incident light polarized along the btocleaxis ^■ between I5 and 90%, or tit any of the ^' mher ranges described elsewhere- herein. In some embodiments, for refractive indices along ^' the-, second axis, the opiieal repeat units of the reflect! ve polarizer feave a raiige of. optical thicknesses swell thai (&3Α2^ &+¾2) is ia a. range of OXB to 0.2,

In some embodjmen Sj the rirsi refleeiion band is a primary ref eetfe . band, in some

embodiments,, the reflective polarizer has a second refieelism hand which is a second harmonteof the primary and wher the second band iias .a wavelength range that, includes 400 tun. in some

embodim-ents, h3 ^' : < 2AS, In some embodiments where this: wavelength relationship is satisfied, the first reflection bati is a primary reflection band,, and the sec nd harmonic has a longer wavelength hand edge .4 thai is less than Aa. This may be useful when little or gain from including the partial reflector is desired fcrbiue l ight at a view angle of zero degrees. In sqimv feo imeni , X +¾b ^' > ^■ ¾3 ^' 2¾- In s me embodiments where this wavelength relationship is satisfied, the first rejection band is a primary rejection band, and the seeond _: harmonic has a longer wavelength band edge X4 that is greater than or equal to & but less that* or equal to the midpoint between ¾a anrj Xh f e,,, ½ (kM +kh}). This may be useful when some gain from including the partial reflector is desired .for blue: light at a view angle of ze degrees, but little or no gam is desired lor green light,

The . gain provided by the partial reflector is the emission intensity at a given -vie.w angle and wavelength provided fay a .display including the partial reflector when the display i;s fully on divided b the emission intensity at die gi ven view angle and waveleisgth of an otherwise equivalent display not ItteJ tid ing the partial reflector when the ^■ otherwise equivalent display is fully on , The gain typically depends on wavelength due- to" the ^' wavelength dependes&e of the. reflectivity of the part ial reflector. The ^' g&inVtyptcally _. -depends or* vie angle due to t e-sh-ift of the reflection. b d(s) -of the.

yi ^' ew- angle, In some embodiments, the partial reflector is a reflective polarizer adapted to provide a gain of at least _. J..15 for wavelengths between Xc and 700 nnt at a view angle of 45 degrees, a i to pro v ide a gain of between LOO and 1 .05: at the wavelength ¾c at a view angle of 2ero degrees. In sonic embodiments, the partial reflector is a reflective polarizer adapted to provide a gain for wavelengths between 620 rim and TOO nm at a. view angle- of 30: degrees that is less than a .-gain tor wavelengths between 62 nifrand 700 rim at a view angle of 45 degrees: As described further elsewhere herein _* in some embodiments, as a r sult of the wavelength arid view angle dependent gain provided by the partial reflector, the d isplay has a AuV color shift at ..a .view angle of 45 degrees that is substantially less than (e.g,,. no more than 0,8 times or no more than 0.5 times) that of a otherwise equivalent display not ^■ including the partial reflector.

Teniis saen as "about" will be understood in the: context m which they are used and described in the present -description by e: of ord inary skill in the an . If the use of ^{, kt} abo.ut" as applied to quantities expressing feature sizes, am uftts, and physical properties: is not otherwise clear to one of ordinary skill i n the art in the context i n which it i s used . and: described In the- present description, "about" wi 11 be iindsrsf od to: mean wit n 5 percent of the spec! ied value. A quantity gi ven as about a specified val ue can be: precisely the specified value. For example, if it is not otherwise clear to one of ordinary sfcill in the art in the . ^■ coinext in which it is used and describe in ihe present description a, quantity having a val ue of about I _v means that the quantity has a value between 0.95 and 1 .05, and that: the value could be i ,

The following is a list of -exemplary embo imen s of the present ^' description.

\ 9 Embodiment I is a wavelength and polarization dependent partial reflector comprising an optical stack, the optical stack comprising a pinraliiv of opticsi repeat units, each optical repeat unit including first and second polymer layers,

wherein for wavelengths ,Vi < ^' ¾2 X3 _V the artial! reflector haa a tr¾ is ^' la¾laiKie or normally incident light polarized, along a firsf axis of at least S5¾ for wave lengths between ?,| and ¾-3,

wherein the partial .reflector has a first reflection band aving ban edges at ¾2 and 13 for normally incident light olarised along an orthogonal second axis, the partial reflector having an f-ratio of t e- optical repeat units* .& .refractive index difference between the first and second polymer layers along the sec nd axis, and a total number of optica! repeat ^' Units in the . optical stack, such that the first reflection band has .an average reflectance ¹ for normally iftc¾©Ri light polarized along the second axis between 15%: and 97%.

wherent the optical repeat units have a _. range of opiicai hicknesses such thai (λ3-/ 2) (Λ3+λ2) is in a range of 0.05 to 0.2, and

wherein the firs reflection hand is a primary reflection band and λ3 is at least 700 am and no more than 2500 am.

Embodiment 2 is the partial reflector of Etnbodttnsrti 1 , wherein the average reflectance for normally incident light polarized ^' along the ^' second iods is bet een 15% and 95%,

Embodiment 3 is the pinital reflector I , wherein the average reflectance for normally incident light polarized along the second axis is between ; 5.% a d 90%.

Embodiment Is the partial seflector of Embodiment 1. wherein the average reflectance for normally incident light polarized along the second . axis is between 20% and 75%,

Embodiment 3 is the partial reflector of Embod ment 1 , the average reflectance for normally incident light polarized -a long the second axis is between: 25% and 60%.

Embodiment 6 is. the partial reflector of Embodiment: I , wherein for refractive indices along the second axis, the optical repeat units have a smallest optical thickness T 1 proximate a first side of the optical stack and a largest optical thickness 12 proximate an opposite second side of the optical stack, (T2- ^' Π )¾ ^' Γ2·÷Τ Ϊ ) being in a range of Q.05 to 0,2,

Embo ment 7 is the partial reflector of Embodiment ^' I, wherein λ ! is in a range of 3<¾) Bin to 4S0 nm, λ2 is in. a range of 600 tun to 700 nm, and 3 is In a range of 71 if nm to 1000 nm. Enrbqdiftieni 8 Is the partial reflector of Embodiment 1 , wherein ill is in a range of 40 nm to 450 nni, X2 h in a range of 600 ^' _. tan to 700 nm,,aud.¾3 is in a range of 7.20 ttm to 900 nm.

Entbodiraeni 9 s.s _: the partial reflector of Eii lmciiment I, herein λΐ is 400 hni, ¾2 is in ai range of 610 nffi 5 to 690 n.ra,.jaftd Xi is in a range of 7S0 nm tcv900 nm.

Embodiment 10 is the paftial reflector of Embodiment 1 , here n the -ratio of 1 minus she f-ratio Is- i - a range of Q to 0,4. 0 .Embodiment 1 1 is the partial reileetor of Emb dime t 1 , wherein the ^' f-ratio is in a range of 0.4 t : 0*6.

Embodiment 12 Is the partial, reflector of En hodiment 1, wherein the total number of optical repeat y n its in the optical stack is in a range of 35 to 160, 5 Embcidansnt: 13 is the partial reflector of Embodiment I , wherei at least one of the first and second polymer layers is birefringeitt.

Embodiment 14 is the partial reflector of EmbOdinient. ί , wherein the refractive Index differenco between the first and second polymer layers along th second axis is Δηχ, & refractive index difference between0 the first and sec-pod pojyraer layers along ^' the -first axis is A y, \ l being at least 0.1 and |Anyi bei g no more than 0.04.

Embodiment 15 is the partial reflector of Embodiment 14, wherein !Anxj is at least 0, 15 an i \&ny] is no more than 0.02,

:5

Emboiiinient 16 is the partial reflector of ^' Embodiment L farther comprising a second reflection band bei g a second harmonic of the first reflection band.

Embodiment 1 7 is the partial reflector of Em diment 16, wherein the second refiection band has an0 average reflectance for normally incident light polarized a long the second axis between 15% and 90%.

Erntodinifint 18: is the■ artial, reflector of Embodiment 16, wh«in the second refiection band has an average reflect nce for normally incident Sighl poSaritt-d along the: second axis between.20% and 75%. 5: Ernbodfinent: 1 is the partial reflector .of -Embodiment, i 6. wherein the second reflection band has an average ref!eetafrce f r nsrmafl incident light polarized along the second axis between S¾ and 60%. Embodiment 20 is the partial reflector of E bodiment 16, wherein the second reflection band has a longer wavelength band -edge λ.4 of no mors than 500 nm.

Embodiment^ ! is llie parti l reflector of tthodimenf 20ywherein λ4 is no mors han 50 nm.

Embodiment 22 is the partial reflecto of Embodiment 20, -wherein M is no mar than 430 nm,

E bodimer)t23 is. the partial reflector of Embodmieitt 20, wherein λ4 is ne rnore than 10 nm»- Embodiment 24 is the partial reflector of Embodiment 20, wherein IA is in a: range of 400 nm to 5:00 nrs.

Embodiment 25 is a wavelength and- polarization dependent partial reflector comprising an optical stack, the- optical stack comprising a plurality of optical repeal units, each optical repeat, .un.it including first and second polymer layers, a refractive index difference between the .first and second polymer layers along a first axis being Any, a refractive i dex difference between the first and second polymer layers along an orthogonal second axis being ^' Anx, \&nx\ being at least 0. s .and iAnyj being no more than 0.04, wherein for refractive indices along the second axis, the optical repeat units have a smallest optical thickness 11 proximate a first side of the optical sta k and a largest optical thickness 72 proximate an opposite second side of the- -optical stack, (Τ2-ΤΊ y(T2÷T l ^' ; being in a ra e of 0.05 to 0,2, 2 being at least 350 m no more 1250 nm.

Embod ment 26 is the pa tial reflector of Embodfriierit 25, wherein T2 is at least 355 nm. m odiment 27 is the partial reflector of Embodiment 25 , wherein T2 is ¾t least. 360 nm.

Embodiment 2§ is the partial reflector of Embodiment 25, where in T2 is at least 37S nm.

Embodiment 29 is the partial .reflector of Em od ment 35.» wherein T2 is no wore. han 500 n$n. Embodiment 30 is the? partial reflector of Embod iment 25, wherein T2 is no ntore than 450 rep.

Embodiment 31 is the partial reflector of Embodiment 25. wherein for wavelengths λ ^' ! < Ά2 < λ the partial reflector has a train sip iftane for normally incident light, polarized along the first axis of at least 85% for wavelengths, between XI and λ3·„

wherein the partial reflector has a first reflection band ha r band- edges at ¾2- and 7 for normally incident light polarized along the second axis, tire reflect ton band having an average reflectance for normally incident light polarized along the second axis between 15% and 9?¾., wherein (¾ ;-12)/ λ3- ^; -λ2) is in a range of 0,05 to 0,2, and Λ.2 is about 2 times T l and Λ3 is about 2 times T2.

Embadirnetii 32 is the partial reflector of Embodiment 3.1, wherein the average reflectance for normaHy incident light poJitrfzed along the second i s is between 1 5% and 95%.

Embodiment 33 is the partial reflector of Embodiment 3 1 , wherein the average refleeianee for ^'' normally incident fight polarized aiotrg the second axis is between 15% and: 90%,

Embodiment 34 is the partial reflector o Embodiment ,31 , wherein the average reflectance tor normally incident light polarized along the; second axis is between 2 % and 75%.

Embodiment 35 is the partial reflector of Embodiment 3 1 , wherein the average reflectance for normally incident light polarized along the second axis is between ^' 2S¾¾ and 60%.

Em pciiment 36 is the partial reflector of Embodiment 5, wherein J¾«x| is at least 0, 15 and |Ariyj is no ntore than 0,02,

Embodiment 37 is the partial reflector of ^' Embodiment 25, wherein an f-ratio of the optical repeat units, or 3 minus the f-ratio, is in a t¾n«e of 0,06 to 0.4.

Embodiment 38 is the partial reflector of.Etriixxiimeiit 25, whereiti aft f-ratio of the optical repeat units is in a range of 0,4 to 0,6.

EmbotSinierit 39 is the partial reflector of Embodiment 25, wherein a total number of optical repeat units in the optical stack is in a range of 35 to 160.

Embodiment 40 is the partial reflector .of Embodiment 25 being further characterized by any one of Embodiments 1 to 24.

Embodiment 41 is a circular polarizer COtnprising:

a linear ^' absorbing polarizer;

a retarder; and

the partial reflector of any one; of Embodiments 1 to 40 disposed between the linear absorbing polarizer and the retarder.

Embodi ent.42 is a circular polarizer comprising: a linear absorbing eptizer;

a retamer; and

a reflective polarizer disposed between tin .linear absorbing polarizer and the retarder, wherein, the reflective polarizer has a primary rsEeetiem band, having a shorter wavelength band edge at a wavelength of at least 600. nm.

Embodiment 43 is the circular polarizer of Embodiment 42, wherein the primary reflection baftd has a longer wavelength feaftcf edge ©f at least- 708 nm.

Embodiment 44 is the circu lar polarizer of EnibodimeiU 42, wherein the primary reflection band has a. longer wavelength feario edge of at least 710 nm and no more thati 2500 nm.

Embodiment 45 is the circular polarizer of Embodiment 42, wherein a .second harmonic of the rimary reflection band has a longer wavelength ba«d erfge of _. no mom than 50.0 nm .

Embodiment 46 is the circular polarizer of Embodi ment 42, wherein a second harmonic of the primary reflection band has a longer wavelength ban edge of no more than 450 nm.

Embodiment 4? is the circular poiarizer of Embodiment 42, wherein .a second harmonic of the primary reflectio band ha a longer wavelength band edge o f no mors than 430 nm.

Embodiment 48 is the citwlar ^' polarizer of Embodiment 42, wherein a second harmonic of the primary reflection band has s longer wavelength band edge of no ino.re than 410 mm.

Embodiment 49 is the circular po larizer of Embod ment 42, wherein a second harmonic of the primary reflection band h;¾s a. longer wavelen th band edge m a range of 400 nm so 500 ntn.

Embodiment .50 ^' !& a circular polarizer comprising:

adinear absorbing polarizer;;

a retarder; and

a reflective polarizer disposed between the lise&r absorbing: polarizer smd the retarder, the reflective polarize -comprising an optical stack, the optical stack comprising a plural ity of optical repeat units, each optical repeat unit including first and second polymer layers,

wherein a refractive index, di fference between the first and second polymer layers along a first axis is dtiy, a refractive index d ifference between the first and second polymer layers along an orthogonal second axis is Ληχ, Anx| being at least 0.1 and j&nyf being no mors than 0.04, wherein for refractive indices along, the second axis, the optical repeat units have a smallest optical t ekness T i proximate a first side of the Optical stack and a largest optical thickness T2 proximate an opposite: second side of the optical stack, and

wherein T2 is at least 3D0 ntri.

Embodiment 51 is the eircular ptiiarizer of Embodiment .SO, . wherein 12 is at least 350 nm.

Embodiment 52 is the circular polarizer of Embo ime t 50, wherei T2 is at least 355 nm and no m re i 250 nm

Embodiment 53 is the circular polamer of Embodiment 50, further comprising, an optically thick layer disposed between the linear absorbing polarizer aad the optica! stack.

Embodiment 54 is the circular polarizer of arty one of Embodiments 42 to S3, w ere ^' ia the reflective polari¾er is a partial reflector according to any one of Embodiments t to 40.

Embodiment 55 is the circular polarizer of any one of Embodiments 41 to 54, wherem the linear absorbing polarizer has a pass axis substantially aligned with the first; axis.

Embodiment 56 is the circwlar polarizer of Embodiment 55, hefein an angle between the pass axis and the first axis is less than 10 - ^' degrees..

Embod ment 57 is the circular, polarizer of Embodiment 55, wherein the retarder has a fast axis making an oblique angle witit the pass axis of the linear absorbing polarizer.

Embodiment 58 is the circular polarizer of Embodiment 57, wherein the oblique angle is between 40 and 50 degrees.

Embodiment 59 is the circular polarizer of any one ¾f Embodiments 4 ] to 54, wherein the retarder comprises a- piuraiify of retarder layers-.

Embodiment 60 is the circular ^' -polarizer of Embodiment 39, wherein a first ietarder layer in the plur ltty of ^' retarder layers has a first fast axis and a second retarder layer in the plurality of retarder layers bas a second fast axis.

Ensbo !iment 6 ! is the cirenlar polarizer of Embodiment 60, wherein the first and second fast axes; are not parallel. Embodiment 62 is the eire¾{.ar fxdarker of any one of Embodiments 41 ici 54, wherein for at least one wavelen th in a range from 400 tim to 700 nm, th retarder has _: a retard anee of one fourth of die wavelength,

Embodiment 63 is -otganic light emitting diode display panel and the circular olar zer of any one of Embodimersis 41 to .62. disposed proximate the is la panel.

Ei¾bodiiiienf 6 is a display eonrpnsing;

an organic light erniftit-ig diode dtspl&y panel hayin an emission spe tra comprisin first, se ond and third peak, emission wavelengths ¾a, Xa and %& satisfying ?.s h. < ρ;

a circular polarizer disposed proximate the display panel, the circular polarizer comprising a linear absorbing polarizer, s retar er disposed between the linea absorbing polari er and the display panel and a reflective polarizer disposed between the linear absorbing polarizer and the retarder,

-wherein dre- reflective p iarizer has a ^' transrnittance for normally incideatiJght polarized ioi% a ass axis of t e- reflective pol aftxer of at least oi ^: at .ieast 85% for ^' »v£t«agths bet een ,¾<i and λ·ο-, ί·η a transmittance for noniiai ly meidesvi light polarixed a ng-a block axis of the reflective polarizer of at least of ^: a ieast:¾5¾,¾r waveierigths berweeri ½( a+-A ^: fo) and ½(¾b+Aej, and

wherein for .a wavelength ¾3f > kc and a wavelength 2 satisfying ½(A.b+AC) < X/2 < ¾3, the reflective polar Bier has a first tefieeiiOa band Having; band edges- at ¾2 and ? _* 3 for normally incident light pofe ^' rized along the block as is,- the first reflection band having ah average reflectance for normally incident light polarized along ihe block axis between 15% and; 97%.

Erpbodsraent 65 is the display of Embodiment 64,. wherein the first reflection band, is, a primary, reflection band.

Embodiment 66 is ihe display of Rm _. boditpefiti §5* wherein inflective polarizer has a second reflection band bein a second harmonic of the primary ref i ^' kvft band, the second reflection band having a wavelength range that ingiodes 400 m i.

Embodiment 67 is, a display com sing:

an organic light (em ttin ; diode displa panel having an emission spectra comprising first, second and *ird ^. e&k.6mj^i.oi ^' w¾ ^¾ Aa, d lb satisfying: ¾a < » ^' <Ae;

a fcirexilhr polarizer disposed proxinaate: tire display pane!, the circular poiariae comprising a linear absorbing .polarizer, a retarded ^' disposed between the linear absorbing polarizer and ^' the: display panel and a feflccti vepdlarizer disposed betwee the l near absorbing polarizer and the .retarder. wherein the reflective polarizer has a h'ansmitUit e for normally incident light olarized along a pass axis of the reflective polarizer of at least of at. least 85% for wavelengths between and kc, and a iransmiitance for normally incident light polarized along a block axis of the reflective larizer of at least of at least S ^' 5% for wavelengths between ½(?.a t¾b) and ½(λ»Η·2ΐό), -and

5 wherein for a wavelength λ3 > λς arid a wavelength X2 satisfying ½(A.b+?vc} < 2 < A3 , the reflective polarizer has a primary reflection band having band edges at λ2 and λ3 for .- _. normally incident light polar i zed a long the b lock axis.

Embodiment 68 is the display of Embodiment 67, wherein the primary reflection band has an average 10 reflectance for normally incident light polarized along the block axis between 1 5% and 97%,

Ernbodiraent 69 is the display of Embodiment 67, wherein reflective polarizer has a second . reflection band being a second harmonic of the primary reflection band, the second reflection hand having a wavelength range tha includes 400 ran,

I S

Embodiment 70 is the display of Embodiments 64 lo 6 , w herein the transmittance for normally incident light polarized along the block axis of the reflective polarizer is at least 80% for wavelengths between Xa and Ac. Embodiment 71 is the display of any one of Embodi ents 64 to 6'λ wherein the transmittance for normall incident light polarized along the block axis of the reflective polarizer is at least 85% for wavelengths between Aa and KC,

Embodiment 72 is the display of any o e pf .Embodiments 64 to 6 . wherein A3 < 2/.a.

5

Embodiment 73 is the display of any one of Embodiments 64 to 69, wherein λ» - ⁽ -/..b≥ X3≥ ¾a.

Embodiment 74 is the display of any one of Embodiments 64 t 69, wherein the reflective polarizer comprises an optical stack, the optical stack comprising a . plurality of optical repeat units, each optical0 repeat unit including first and econd polymer layers,

wherein for a wavelength ¾· < ¾a, the transmittanee of the reflective polarizer for ^'. normally incident light polarized- along the pass axis is at least 85% for wavelengths between λΐ and λ3,

wherein the reflective polarizer has an f-ratio of the optical repeat units, a refractive Index difference between the first and second polymer layers along the block axis, and a total number of optical repeat5 units in the optical stack such that the average: reflectance for normally incident light polarized along the block axis is. between 15% and 9.5%. Embodiment 75 is the display of Embodiment 74, wherein the average reflecta ce fot normally incident l ight polarized . along the Mock axis is between 15% and 90%..

E ba _. d m*Hf ?§ is ^■ the- display of E bodimen 74, wherein the av rage ^ectarsce i¾r norfflal!y iiiciclent light polarized along e block axis is between: ^' 2.6% and S5 ^' %,

Embodiment 77 ia the display of any one of Embodiments 64 to 69, wherein for refractive indices along the second axis* the Optical repeat units have a range of optica! thicknesses such that (λ3-λ2)/(λ3÷λ2) is in a range of CEOS to 0.2.

Embodiment 78 is the display of any one of Embodiments 64 to; ,69. wherein the reflective polarizer is adapted to provide a gain of at- least 1 .15 far wavelengths b tween AC and 700 rjffi at.a view angle of 45 degrees, and to provide a gain of between 1 .60 and LOS at the wavelength ¾e a vie angle of zero degrees.

Embodiment 7§ is the display of Embodiment 78, wherein the reflective polarizer is adapted to provide a gain for wavelengths between X.e and 700 am at a view angle of 3D degrees tha is. less than the gain- for wavelen ths between Ac and 700 hot at a ^: view aagle of 45 degrees.

E odi ents is the display of any one ef Evnbodimenis 64 to 69, wherein the reflective polarizer is a partial reflector according to an one of Embodiments 1 to 40.

Embodiment S I is the display of any one. of Embodiments 64 to 69, wherein the circ lar polarizer is further characterized by any one of Embodiments- 1 to 62.

Embodiment 82 is the display of any m& of Embodiments 64 to 81 having a <¾.uV color shift at a view angle of 45 degrees t a is no mare than 6.8 times that of an otherwise emnvatent displa not including the reflecti e polarizer.

Embodiment S3 is the display of any one of Embodiments 64 to 81 having a Διι'ν' color shift at a view -angle of 45 degrees that is no more than 0.5 times that of an otherw ise equivalent display not including the reflective polarizer.

Embodimen 8 is a display comprising;

an organic light -emitting; diode -display panel: and

a circular polarizer disposed proximate the. display panel, the circular olarizer c mprfemg a linear absorbing polarizer, a retar-der disposed between the linear absorbing polarizer and the -display panel, and a wavelength■ ^■ arid polarization dependent partial reflector disposed between the J rtear absorbing polarizer arid the re ^' tar ^' der,

wherein the partial reflector i a color-correcting partial reflector sixth that the display has a άίι'ν' color shift at a view angle of 45 .degrees that is no more than 0.8 times that of an otherwise equivalent d isplay haying art otherwise equivalent circular polarize no iflcind ing the partial reflector.

Embodiment 85 is th display of Embodiment 84, wherein the partial reflector comprises an optical stack, the optical stack comprising a plural it}' of Optical repeat unite* ^■ .each optical repeat ^' unit including first arid second polymer layers,

wherein for wavelengths λ 1 in a range of 400 rm to 450 run, λ2 in a range of 600 nm to 700 nm, and λ3 in a range <jf 720 nm to 9D0 nm, the partial reflector has a trartsraittanc tor normally incident light polarized along a first axis of at least 85% for wavelengths between λ ί and. J.3,

wherein the partial reflector has _. a first reflection band having band edges at X2 and λ3 for normally inekietvt light polarized along an orthogonal second axis at normal incidence, the partial reflector having an f-ratio of the optical repeat units, a refractive index difference between, the first and second polymer layers along the second ax is, and a total ^■ number of ^' optical repeat units in the■.■optical stack such that the first reflection band has an average reflectance for light polarized along the second axis at. norma] incidence of between 1 $% and 7%, and

wherein the optic l repeat units have a range Of Optical thicknesses such that (λ3-λ2) (λ3+Λ-2;) is in a range of 0,05 to 0.2,

Embodiment 86 is the display of Embodimeat 85, wherein the fi st, reflection band is a primary: reflection band, Embodiment- ^' 87 is die display of Embodiment 86, wherein the partial reflector has a second reflection band being second harmonic of the primary reflection band, the second reflection band havin a wavelength range that includes 400 nm.

Embodiment 88 is the display of Embodiment 85, wherein the average reflectance for light polarized along the secofid axis at nOrmai incidence i$: between 15% and 95%.

Enihodimeftt 89 is the display Of Embodiment 85, wherein the average reflectance tor light polarized along the. second axis at norma! incidence is between 15% and 90%. Embodiment 90 is the display of Embodiment 85, wherein the average reflectance for light polarized along the second axis a normal incidence i$ between 20% and 85%. Embodimen 91 Is the displa of Erobodimeiii 85. wherein the average reflectance for flight poiaffeed abag the second axis at- noons! incidence is between 2 ¾¾ and 75%.

Efiibodifflent 92 is the display :df Em odiment 85, wherein the avera e refe aftee for li ht polarized along- the. second ax ^' is at norma! incidence is between ^' 25% and 60%.

Embodiment 93 is the display of Embodiment -84, whei¾iit the ^: Δ«'ν' color shift at a view angle of 45 degrees is no raofe. than,0.5- times thai of the otherwise equivalent dispiay.

Embodiment 94 is the display of Embodiment 84, wherein the part refiector is adapted to provide a gain for waveleagi s between 62D nm and 700 am at -a view angle of ^' degrees that, is less than a gain for ^■ wavelengths between 626 ran and 70Q nm at a view angle of 45 degrees.

Eratodiraent 95 is the display of Embodiment 84, wherein the partial .reflector is further characterized by an biie f Embodiments 1 to 40.

Efttbodaftent 96 is the display of Embodiment 8 , wherein the cireuldr pojarteer is fitrfhear characterized by any one of Embodiments 4 1 to 62.

Birefriti ent mulfi tyef optical ii!m¾ ^' with. coiurofied hand edges and tailored reflectivity with angle were raade using ^' genera fl known film r cesses 1¾r creating rarritilayer ^' films and rolls of the filinx-,. The- Examples d scribed herein include differing midtiiayer optical films which were made, generally, of first optic&l layers (made of 9:0/10 eePE ) and second optica;. lave -s.itnside of a. blend of 90 10 coPE and PEIG) .which were fed fern separitte exiruders iittd a multilayer coextrmion feetfbteefc and cast through a film, die ont : a c li roil to form large imm her of alternating layers, PE G is a eopolyester avaiiabk- from Eastma¾ Gheniteafs (Knoixville. T^). 90/ VO <¾ PEN is a rand m cepolvester that is 9:0 i«oi:¾ polyethylene ^' naphthalate and 10 mom polyethylene tcrephthai te prodiieed . b .3 Corporation, Saint Paul, M.N. ariations of layer number, draw ratio details- are ^; reported in .the following Ekampfes.

After Eabrieaiiosi o fhe bireffingent imdtikyer optical film stacks, the Examples were subsequently- combined with. an absorptive olarizer (AP) .an rsae major surface and a .quarter -wave plate stack which can he useful as a color correcting circular polarizer,. for example. This optical, stack as incorporated for some me surements ifUo commercial devices by way of replacement of the circular po arizer that - s typically incorporated in the device'. l est Methods Emissive luminance arid color were imasured via a PR-740 Spectrophotometer from Photo Research !nc with results, reported by .convention: of C1E e lorcfert coordinates. Reflection and transmission. _. spectra were measured via Lambda: 900 Spectrometer ftpis Perkin-Elmer Ine for both polarisation block (crossed) and pass (aligned) states. Th bi-directlona! scatter d istrihii iort functions (BR DFs) were measured for each sample _. at select incidence angles using a Radiant Visiesi Systems !S^ SA. Imaging Spher _^

A birefniigen reflective polarizer was prepared as foHows, Two polymers were used for the optical layers. The first polymer (first optical layers) was 90/10 coPEN, a: polymer composed of 90% polyethylene naphthai ie (PEN) apd 1 Q%: polyeth lene terephthalate (PET). The second .polymer (second optica! layers) was a blend of a first poiyethySene naphthaiate copolymer feoPEN) having 90 mol. ¾ naphthalate and ΙΟ τηοΙ % and a eopolyesters such as Polyethylene Terephthalate Glycol (PETG) at a. ratio of approximately 45 mol % 90ί 10 PE to 55 moi% PETG where the second optica! layer materia! Tg is. approximately 97-100 degrees cent igrade. The ratio of the feed rate of the first polymer to the second, polymer was 8:92 far this. Exainple; the f-ratio if* this ease was 0.10. The polymer used for the skin layers was PETG, The materials ; were. fed: from separate extrud rs to a Huiltilayer eoexfrpsion feedbloek, in which they were assembled into a packet of 137 alternating optical layers, plus a thicker proteetive ^{: '} boundary layer of tlw second optical layers, on each, side, for a total of 139 layers. The skin layers: of the second optical layer materia! were added to the construction in a manifold specific to: that purpose, resulting in a final construction having 141 layers. The multilayer melt was then es$t Through ^, a film die onto a chili roll, in the coriventional nranner for polyester ^' films, .upon which it was quenched. The east web was then stretched in a. commercial scale lines* tenter at a draw ratio approximately 6: 1 arid a temperature of 2 SO ^¾ F. The layer thickness profile is .shown in Figure 15 and the resulting total thickness vva¾ (.measured fay capacitance gauge to be approximately 25 μπϊ,

The resulting multilayer optical film of Example ! was then incorporated together with an absorbing _. olarizer on one surface arid ^' a quarter-wave plate on the other surface: to form a circular polarizer ^■ (labelled Ex ! -CP). Art absorbing polarizer 5618 H-type from Sarin t¾ was laminated to ^" the film of Example I where the block axes were substantially aligned. On the opposite side of the film, of Example I a quarter wave plate (Q VV P) with, trade: narrte.: A PQ W92-004-PG- 14Q MHE from American Polarizers. Inc., Reading, PA was laminate! with: El 7 ! optically clear adhesive from 3M Compaay. The Q WP optical axis was approximately 45 degrees relative to the block axis: of the polarizers. The resulting circular polarizer (:Ex1 -CP) was then laminated to art Apple Watch 1 , where the original circular d been removed from the display.

As specified above for Exiwppie J., a birsf nngeni reftecti ve polarizer was g epared wliii alternatin layers of first po!yrner (90/■ 0 coPE ) and second polymer (blended .eoPE^VPETQ.), The ratio of the feed rate of the-, first polymer to: the second polymer for Example 2 was 9:9] ; the f..ra|ie in ΐ his case was 0.1 _. 2, Also, like Exam le K the pojymer nsed for the: .skin layers was PETG aadabe resulting S fittal construction with skin, layers was 1 ί layers d die resulting physical thicknes as measured bya capacitance gauge of approximatel : 26,6 μηι, The Mayer thickness profile is shown in Figwe 17.

Like Example iy Examp e 2 was hKorpontied ^: together with an absorbin polarize (561 B type from Sa¾-nz).osi one surface end a quarter-wave plats (AF ^; Q %-OW-PC- [ 4 MHE friftn

American Polarizers} on the other surface So form a..cireakir polariKer (labelled Ex2-CP). The circular it) polarize Ex2-€P was then laminated to an Apple Watch 1.0, where the original circular polarizer had been removed, from the display.

^" Example 3

Exampie 3 was prepared as follows. A single muiii layer optical packet was co-extruded

15 comprised of 32 S aitemat ing layers ^' f ^' 90/ (9 c PBiN , a po ί yrae ^' composed of 0% polyethylene

naphtha; ate (PEN) and 1 G¾ polyethylene te.rep:hihahfte (PET), arid a low feitex isotropic layer, which was made with a: bfead of poly ca bonate. ant! co l me s .(PCxoPET) . as described in : WO2015035030 sneh that the index is about 1 ,57 d remains substantially isotropic -upon uniaxial orientation. The PG oPET rnoi ar ratio is appi ix1tsateiy ^' 2,5 mol % PC and 575 mol % oTET and has a T of 105 0 degrees centigrade. This isotropic material is chosen such that after stretching its _. refractive indices ;n .the t o rtqn-strSieh directions re ain simstantia!! atc ed wish, those of the birefnogent .material _. in the: .aon-stretching iii.rcciiors. while in the stretching direction there is a substantial mis-match in refractive indices between hirefringent and nan-bh ^* eif½gei¾ layers. The 90710 PEN and PCxoPET polymers were fed from separate extruders ^; at a target f-mtio of approximately Θ..5 to a rmhtilayer eoextrusion fee back,

25 in wirieh theywere assembled into a packet of 325 alternating optical la e s, plus a thicker protective boundary layer ^' of the PC-eoFET ₅ on eae side, for alotai of 327 layers, The ntii! layer n?«.lt wtis then cast through a film die onto a chill roll In the costveniionai mfftfterfbr- pelye&ter- films- upon which it was quenched. The cast web was then stretched itt a parabolic tenter similar to that described in the invited Paper 45.. {, ainhored by Denker et al, entuied '' dvanoed^ l mer .Film fo Improved Performance of

30 Liquid Crystal Displays," presented at Society for information DisplaysfStfi} International Conference is ijaa Francisco,. Calif. _: , Jtm., 4-¾ 280§. The iayer ^' thickness pro ^' fiieas. _: shawn. in Figure 22. ^' This film has a resulimg physical thickness as measured by a capacitance gaage bf approximatciy 53.3 um.

Like pmvitias Examples,. Example.3 was incorporsted fegether wiih an absorbing polarizer (S618 El-type. front Sahritzf on one surface and a quarter-wave plate ( APQW 2^04-:f - 14ΘΝΜΗΕ from

35 American Polarizers) on the Other snrfacs to f rm a circular polafiiicrf labelled Exa-CPf The circular polarizer Ex3~CP ^' was then laminated to an Apple Watch 1.0, where the original cact!kr polarize had been removed from the display, Esaraple 4

Exam le 4- was prepared m a similar way to Example 3, with parabolic .entering, and f-ratiO of 0.5 _* but the process u¾s adjusted to. change ^' the thickness to 35,4 ιη and create a higher wavelength reflection band.

Like ^' previous Exam les, Example 4 was sneo^ora ed together with an: absorbing polarizer (561 8 H-type from Sanritz) on one surface and a quarter-wave piate (APQW92-()(M-PC- I40NMI-jE from American Polarizers) on the other surface to form a circular polarizer (labelled Ex4-CP), The circular polarizer Ex -C ^' P was then: laminated to an Apple Watch 1 ,G, where the original circular polarizer bad been removed from the isplay

Example 5

Example; 5 was: prepared in a similar way to Example 1 , with linear te n ten ng, except that the ratio of the high and low index resin thicknesses was adjusted to provide an f-ratio of approximately 6.29 and finished thickness was 25,5 micrometers,

Exam le i

Example 6 was prepared in a similar Wanner to ExaiSple- 5, except the ratio Of the high and low index resirt thicknesses was adjusted to provide an f-ratio of approximately 0J ^:' 8. Finished thickness was 25. S micrometers.

Exam pic 7

A birefringent refleciive polarizer was. repared as in Example. 1 . The resulting film was thee incorporated together with an absorbi ng polarizer on one surface and a quarter-wave plate on the other to form a circular polarizer (labelled Ex ~CP). An absorbing polarizer 561 8 H-type from Sanritz was laminated to the film .of ^' Example 7 where -the block axes were substantial ly aligned. On the opposite side of the film of Example ?, a quarter wave plate (QWP) with trade name APQ¾ ^:' 92-004-PC- 14 NMH E from American. Polarizers, Inc.,, Reading, PA was laminated wit 8 17 ! optically clear adhesive from 3M Company, The OW.P optical axis was approximately 45 degrees relative to the optic axis of the polarizers. The resulting c?t-cufar polarizer (Ex7-CP) was .then laminated to a Samsung Galaxy 2.Q, where the original circular polarizer had been removed From the display.

Example 8

A birefringent reflective polarizer was prepared as hi Example 2. Similar to Example 7, the resulting film was incorporated together with an absorbing polarizer (561 8 H-type from Sanritz) on one surface and quarter-wave plate (APQ ^c )2-(>04-PG- ! 40NMi ^: iE from American Polarizers) on the other surface to form a e-ircnlat- polarizer (labelled ExS-CP},. The circular polarizer (Ex&-CP) was then laminated to a Samsung Galaxy Tablet .2,0, where: the ongkia! circular polarizer &d .been, removed rri the display.

Example 9

S Example 9 was p e a ed in a sirtiilar manner fe Exanmje <>■ The ratio of the high, and low i-ndes resin tbjek:rie$se$ was adjusted to previde an Emtio of approximately 0, 1 Final thickness was 25.5 nricronieters.

CoB¾ >ar¾ti¥e Exam le I (CE-I )

0 A circular polarizer was a&senrbted b blowing tnttho& An ^' absprbi g p iamer 56f S H- type %m Sanritz was laminated to a quarter wave pjete (Q ^' W ) with trade mm* APQW92A)S4-P€~

140NMHE from American Polarize s, hie.., Read ing. PA, The QWP optical axis was approximately 4S degrees relative to he optic axis, ofthe polarizer.

Phe coiBparaiive polarizer was laminated to an Apple Watch 1 ,0, where, the original circular; 5 polarizer bad heeti rem oved ftqm "the ^' : d isp la ,

Cffrs ftrative Example ! (CE-2)

Tlris comparative example was fabricated as in Comparative Example 1 exce t that the resulting ciretilar poiarissr w s aiso ^: laminated to a Sarres ttg Galaxy Tablet 2,0 _V where ^' .the. original circular0 polarizer bad been removed ftonr se ! ispby.

.Comparative Exai«p!e 3 <CE-3)

Comparative Example 3 was prepared as . ^■ follows. A -single iirultitayer optical packet was co- extrude comprised of ^' 27S ^' atematmg layers of 90 i ό eoPEN ..a polymer composed of 90% polyethyfeiie:5 rcaphthabte (PEN) arid 10% polyethylene lerephthaSate {P TE and a tew index isotropic layer, which was:: made with _a blend of polycarbonate and copolyeaters (PC oPET) as described in D20 r ^: 5035f)o6 such that the index is about PS 7 ,and . remains spbstanti ally isotropic upon■ ^■ uniaxial orieatatiort The PC:coPET molar ratio is approximately 42.S mo! % PC arid 57,5 mol % eoPET and has a Tg of 105 degrees centigrade. This isotropic material was ehosea sweb dm after stretching its reiracti vs: indices jr>P the two oomstreteh directions res«ain®d sybstantiaMy matched with .those of the birefrisigent jnat« j¾i in the non-streielting dittjction wliiie m the stretching direction fnete was a substantial mismatch in j¾t¼itive indices, between b¾refii.agent aiid iiOir-bircfi-in ni layers. The ^: 9Q/ i 0 PE at;d PCcoPET pojy ets were fed fr m separate extruders ratios of total flow of.44%. arid .5(?¾,.¾ _: r 90/ 10- PETsl ¾κί PCicoPET respectively toa.nvultiiayer coextrusiois reedb!oek. The. materials svere .assembled into a5 paeket of 275 alternating Optical ayers, plus a thicker protective boundary layer of the on each side of 90/ IS PEN op one side and .PC:©oPET on the otherc br ^' s total, of 7? layers. The mu ltilayer rneit ^: was then ^' cast throtigh a ^' film, die onto a chili roll, ift the eortvetilional man er !¾r polyester films, upon which it was quenched. The east weo was . ^' then stretched in parabolic tenter similar to thai described in the Invited Paper 411. authored y Denker et af^ entitled "Ad anced Polarizer Film for Improved

Performance- of Uqwd Crystal Displays," presented at Society for ^' information Displays (SID) international Conference in San Francisco, Calif., Jim, 4-9., 2006. The -transmission was determined and is shown in Figure 28. This film had a, resulting physical thickness as measu ed by a capacitance gangs of approximately 45.1 μιη. Th film ^' -was found" to cause higher reflection ^' at normal incidence in the visible range than desired for a color correction film when incorporated into an OLBD device.

T Me ^" 1 ; Example summary or device test .results in Apple Watch 1 (AW I) and Samsung Galax 2 (SG2) devices;

Test resHlts

it was fonnd that the opt ical stacks of the _: Examples could be use in a -display- stack on an em issrve display to reduce angular color shift. The" optica! stacks can create gain, or increased htm manee for specific angles and wavelengths compared to a conventional circular polarizer. In cases whe e the film was a reflective polarizer placed below the absorptive polarizer, a minimal effect ^' on ambient reflection was observed,

in. order (ρ· measure the reductions in angular color shift,, commercial OLBD- devices of two types were modified to incorporate Example circular polarizers. The devices we used for this comparison included an Apple Watch and: a Samsung 2 Tablet. Commercial devices using strong microcavit QL-E ^' D design exhibit a large inherent. angular color shift in the white state. ITie CjIoi typically ^' ss ifts-to. the ^' blue, aod qr green from while. In Figure 14 ₍ . ClB y color from -60 to 60 degrees inclination angle (view angle) is shown for commercial samples of Apple Watch (AW) and Samsung Galaxy Tablet 2 (S2). This color shift problem has been conventionally addressed by blocking some of the blue and green ligh In some examples, the color shift was: compensated by effectively recyclin the polarized light of onl desired wavelengths aosd angles. Irs so oe exantpSes, the desired wavelengths were όΟΟ-65ί)ηπι at angles, greater than 30 degrees.

One potential probiera with «sing _: a wave!erigth specific .reflective fi m te> compensate a display is i lute re lc U-n of ¾e backplane. While 0EED bae.kplaiies are not as:d9¾iBdy retetive as LCD backlights, . hey are..still airly dinase. Averages: ¾r SRiD ^' Fs- (bi-directional scatter distribution, tactions) were measure for samples at select ^■ incidence angles with, a Badiafit Vision Systems _. !S-S A Imaging Sphere snd ai¾ re:porte<i it$ Tab!e 2 where t e view angle is siaiive to: normal is ^' Total . Reflectance,, asd DR. is :<iiftuse,refie:etaii«e. -Qfts-ihightexpe-e t» ^' see-roti«h of the reflected fight at high angles scatter baek towards siormal incidence with such significant ^■ diffuse reflectance. If the dif ftiiie reflectance ¹ Is significiiiit, reflected light oaid be expected scatter to ail angles _* c eating opti s; gain at ail angles. Howeve , it has been found that the partial reflectors of the prssentdescriptioH cat) create gain

Substantially re off-aiis co ared to on-axis.

TahU- 1

Results, for layer thickness . ^■ profiles and pass and block state .tmnsmissior; spectra for Byaropies E 5 are shown, in Ligures 1.5- 19, 22-23, _. and 2:6, Exam le Gain nd reflectivity .specira are shown in Figures 2:0..a.ad.2L respectively,, for Example. . Fi ures ^' 2 -25 show example Gib color ?.lofand. color shift Versus angle for Example 4, Summar Table -of .measurements fo white color shift residts and reflec ivity for Examples and Comparative Examples are summarized in Table 2 where emissive himlnsi ce and color we e measitred via a PR-74.Q Spectrophotometer from Photo Research Inc. Reflectivity was measured via Lambda 900 Spectrometer from Perkiri Elmer. Relative ^' [Ln i ¾nc« is the lummance of hs sample divided by the hi hiinance ot. th a dieated refereslces. 1 he tE x ifnd y value* norma! to the display and the Ai v' at 45 degrees and 60- degrees relative to normal are reported. Table 3: Relative Luminance, color anil reflectance results

} i> F gure 1 , the block transmission, spectra, of reflective polarizer of Exainpie 2, whic was used in the circular polarizer of Exainpie 8, is shown for 0 and.60 degrees inclination angle. Also shown is normal incidence ^' emission spectra for the commercial S msung Galaxy 2 tablet, Minimal i'eflecti«ity was present at normal incidence oft the GEED emission peaks.: However, at higher inclination angles, the reflectivity, from the interference stack swept ac ross the red .emission peak of the QLEl ⁾ device.

Gain for Example 8 was calculated fey dividing the emission itltensitj for the optical stack of Example 8: fe that of the optical stack of -Comparative Example 2, and is shown in Figure 20. Since the OLED emis ion intensit was strongest at less than ·650ηπΊ* the gain at 0 and 15 degrees did not appear to affect emissive color. However, the gain at 30, 45 ami 60 degrees did acid red to the emissive color at those angles. Giveii the diffusi ve character of the backplane, it was unexpected that the gain would occur

3 substantially only where ^' the interference hand shift, occurred, in other words, the backplane appeared to interact with the film in a mostly specular manner despite the diffusive character of the .backplane.

Des f tptioiis for eleme ts is -figures shcsu Id be understood © apply equal ly. to corresponding efeine its in other figures, unless indicated other-wise. Although- speeiik embodiments have been illustrated arid described herein, if will be appreciated by those of ordinary skill in the art that a variety of alternate and/or equivalent implementations san be substituted for the specific embodiments: sh wn s nd described without departing from the scope Of the present discissure, This application is intended to cover any adaptations or variations of the ^' -specific- embodiments discussed herein. Therefore, k is intended that this disclosure be lim ited only by the claims, and the -e uivalents thereof

The following are exsmpi&iy enibodimeati accord ing to the present disclosure:

Item I , A wavelength and polarization, dependent partial reflector comprising an opiicai stack, the optical stack -comprising ^' s plural ity of oj?ticai re est tirsits, each optical repeat unit including first and second polymer -layers,

wherein f r wavelengths λ Ι < λ.2 λ3, the- artial reflector has a transmittancs for normally incident light polarized along a first axis of at least 85% for wavelengths between λ ! and λ. ,

wherein the. partial reflector has a first reflection band having band. edges at λ:2 and λ ^' 3 for normally incident light polarized along an orthogonal second axis, the partis! . reflector having an f-ratio of the

-optical repeat uiiits, a ef active: Index difference between the first an sec nd polymer layers ^; along the second axis, and a total number of optical repeat units, in the _: optical stack such that the first reflection band has ah average. eflectance for no mal y incident l ight polarized along the second axis between 1 S¾ and 9?'!

wherein the optical repeat units have range of optical thicknesses such that (λ3-λ2)/(Α3 -λ2) is in a range, of 0.05 to 0.2, and

wherein the first reflection band is a primary reflection band and A3 k at least 700 run .and no more than 2500 n-m. Item 2. The partial reflecsor of ite 1, wherein the average reflectance for normally incident light polarized along the second axis is between 1 5% and 95%. hem 3. The partial reflector of ton ^' h¾T¾in ^' he-average.i¾ l< cta¾$fe-far -«i)rmal incident light polarized along the second axis is between 15%md. i ,

Item -4. The partial reflector of item 1, wherein ie average re flectance for- normally incident light polarized along the second axis is between 20% and 73%.

3 $ Jtesn 5, The partial reflector of itera i, wherein the average reflectance for normally incident light polarized along the second axis is between 25% and 60%, Item 6. The partial reflector of item L wherein for ^' refractive indices along the second axis, the o tic l repeat un ^' ifs have a smallest optical t ickness T! pro imate a first side of tbe optical stack and a largest optical th ickiiess T2 pfox iffiat an pposite Second side of she optica! -stack, (T2 -T J -) ( 2f T 1 } being in a range■o-f ^' 0 ^' .OS to O.2. Item ?:. The partial reflector of item 1, wherein XI is in. a range of 380 tiro to 480 nm. ,?,2 is in a range of 600 nm to 700 nm, is in a range of 710 firn to 1000. nm.

Item S. The partial reflector of item L wherein ,VS is in a range f 400 nm to 450 nm,.12 is in range of 600 ran to 700. om,. and is in a range of 720 nm to 900 ran.

Ifem 9, The partial reflecto of item i, wherein λ 1 is .400 nm, λ2 is in a range of 61 nm to 690 nm, and λ ^' 3 is- in a. range, of 750 r\m to 900 ma.

_. Item- 0, The partial reflector of item 1. wherein the f-ratso or 1 minus the f-rat ip is m a range of 0.06 to 0,4,

Item 1 1. T le partial reflector of iters i , wherein the f-rStie is m & range of 0, to 0,6.

Item 1 , The partial reflector of item K wherein the total number of optical repeat units in the optical stack is in a range of 35 to. 1 _. 60,

Ite 13. the partial reflector of item 1, wherein at least one of the first and second polymer layers is birefringen item 1 , The partial reflector of item _. i _? wherein the refractive index d ifferesee between the first and second polymer layers along the second axis is Δηχ, a refr£i« iye .ifidex: difl¾renee between the first and second p iyitteir layers along the first axis, is &ny\ |ΛΙΪΧ| being: a least 0. i andj iyf being no nrore than 0.04.

Item 15. The. partial reflector of item 14, wf¾ereinJAnx| is at least 0, 15 and |Δ«>'| is no more: than 0;02, Item 16. The . artial reflector - of item 1 , arth-er comprising a .second reflection band being .a second harmonic of the first reflection band- hem I I. The partial reflector of item 16, wherein the.$ee ^: onei reflection band has an .average reflectance for noirnaiiy incident light polarized along the second axis be ween ^' 15% md 90S4.

Item \ , The partial reflector Of i¾n1 Ϊ , . ^■ wherein the secon-d reflection band as an average reflectance- for formally incident light polarized along the second axis &etw@eff 20% ^: ¾nd ?5%<

Item {-9. The partial reflector of item I ¾ wherein the ^: sec nd reflection band has an ^■ a erage reflectance for normally incident light polarized a!osg the second axis ¾wei&n ^" 2$3¾-afld 6f)%

Item _: 2-0. The _: partial reflector of ste n U, wherein iho sseond refleciio ban has a longer wavelength ban edg ¾4 of no naorat aa 506 am, ίΐείη 21. The partial reflector of item 20, wherein )A is no thore than 450 mn,

Item ¾2, The. partial reflector of iiern 2fL ^■ wherein 1-4 is no o e than 43-0 B?U.

Item 23. The partial reflector of itfefn: 20,. wherein λ-4 is no .more, than 4 j 0 fori.

Item ,24, The partial reflector of ^' iienr. , wherein 1 k in a range of 409 am to SQ0 rtrn< item 25. A wavdeagtii and polarkatjon dependent paniaj sefieetor eonrprising an optieai .stack, the optical stack comprising .a . plurality of optical repeat units, each opiica! repeat unit including first and second polymer layers, a re ractive tndex difference betwee the. first and second polymer layers along a first axis being Any, a .refractive index difference between the first and second l me layers along an orthogonal second axis being Δηχ, ;Δηχ| being, at least 0, 1 and !Ati l being no more than Q.04 ₅ wherein for refractive indices aloi)g the second sisis, the opt eai repeat tirbts have ¾: smaHest optical thickness Tl proximate a first side of the optical stack and a largest optieai thickness T2 proximate an opposite secorsd ^■ side of the optical stack, fT2-T ^: l ;)/(T2+Tf) being in a range of 0,05 to- 0.2, T2 being at least 35 nm and no more 1250 mn.

Item 26, The art a reflector of item 25, wheresii T2 is at least 355 nm. item. 27. The pamal reflector of item 2$, wherein T ^' 2 is at least 360 trm. ΚδϊΏ 28. The partial reflector of item 25, wherein T2 is at least 375 am.

Item ^' 29. The partial reflector of stem 2$, -wherein T2 is rio more than 500 nro. Item.30. The partial reflector of stern 25, wher in Γ2. is no more . than 450 nm. item 3 1. Tile partial reflector of s ern -25,? wherein, for wavelengths -λΐ < ¾2 < λ3, the partial, refleeior has a fr&nsmitlanee for normal iv incident light. polarized along, the first axis of at least 85% for wavelengths between λ 1 and λ3,

wherein the partial reftecwfcas. a first refection band having band edges &V.X2 and XI for normally incident light potari.?.ed along the second axis, the reflection, band.. aving an avera e: reflectance for .normally- ί n idenf light poiari¾ed along the second axis between 15% and 97%,

wherein ( ^' λ3-λ2) (λ3+/ν2) is in a range of 0,0.5 to 0,2, and λ.2 is : about 2 times T l and ¾3 is about 2 times ft.. ite«i 32.. The partial reflector of item 3 1 , wherein the average reflectance for normally incident tight polari ed along the second axis is between 15% and 95%. item 33, The - partial refleeior of item 3 1 ,. whereto the average reflectance tor normally incident light polarized along the second axis Is between 15% and 90%.

Jteaj 34. The partial reflector of item 31 , wherein the average reflectance for normaliv incident light polarized along the second axis is between 20% and 75%. Item. 3 , The partial reflector of item 3 I , -wherein the average reftectariee for normally incident, .light polarized along the second axis is between 25% and 6( ½.

Item 36, The partial reflector of item 25, Wherein !Δηχ| is at least .0.1 and { j is no more than 0.Q2,- Ite !! 37, The partial reflector of item 25, wherein an f-rstio of the optica! repeat units, or 1 minus the f- ratio, is in a range of 0.06 to 0,4. i tem _. 38. The partial reflect©* of item 25, wherein an f-ratio of the optica! repeat units is in a. range of ^' 0;4 to 0.6,

Stem 39. The partial reflector of item 25, wherein a total numbe-f -of. optical repeat units in the optical stack is in a range of 35 to 1 60, Item 40, The ^" partial reflector of item 25 being further characterized by any one of items 1 to 24.

Item 41. A circular polarizer comprising;

a l inear gsbsorbiag p ianzer;

a reiarder; and

the partial■ reflector of any one of items 1 to 40 disposed beiwee die linear absorbing polarizer ^. and the retarder.

Item 42, A circular polarizer comprising:

It near absorbing polarizer;

a retard-?*; aad

a refleedve polarizer disposed behvee« the linear absorbing polarizer and the retard er, wherein ^' the reflective polarizer has a primary reflection band having a s orte wavelength band edge at a Wfaveiertgtli of at least 600 nm.

Stem 43. The circular polarizer of item 42, wherein the primary reflection band has a ioager wavelength band edge of at least TOO nw. item 44. The circular polarizer of item 42. whersin She primary reiieetiots band has a longer wavelength band erlge of at tea ^' st 710 am -and no more than 2500 rtm.

Item 45, The circular polarizer of item .42. *vner fo a second harmonic oTine primary reileetioe bane has a longer wavelen th bmd edge of ao more than 500 nin.

Item 4.6, Th« eireuiar polarizer of sm ^: 42, wherei n a second harmonic of the primary reflection ^' t>»t*d ha» a longer wavelength band edge of no more ^' titan 4§ ^' Q ntn.

Item 47, The circular polarizer of stem 42, wherein a second harmonic of the primary reflection hand has a longer wavelength band edge of no more thai', 430 run.

Hem 48, The circular polarizer of H 42, w herei n a seeond hsnnonie of the primary refkejiQH hand has a longer wavelength band edge of so more, than 410 am.

Item . The circular polarizer of item 42, whereirs a second hanriofsic of the primary reflection band has a longer wavelength band edge in a range οί ^" 40Ο ntn o 500 n . Item 50. A circu lar polarizer -comprising:

a. linear absorbing-polarizer;

a. retardcr; and

a ^■■■ relleetiverp litrizei ^" disposed between the linear absorbing polarizer and the retarder, the reflective polarizer eoitfpri-sing-an optical stack^the optical stack comprising a plural ity of optical repeat units, each optical repeat unit including first arid second polymer layers _. ,

wherein a refractive index difference, between the first and .second, polymer layers along a first axis is

Aiiy a refractive inde difference between the first and: second polymer layers along an orthogonal second axis is Anx, iAnxj being at least 0,1 and |iiny| bgmg. no morefian 0,04,

wherein fo refractive indices along the second axis, the optical repe t units have a smallest optical thickness Tl proximate a first sid of the optical stack and. a largest optical thickness T2 proximate an opposite second side of the optical stack, and

wherein T2 is at least 300 nm.

^' Item 51. e circular polarize of i teni 59, wherein Ψ2. ^' is at least 350 nm.

Item 52.. The circular polarizer of item 50, wherein T2 is at least 355 tint and no more 5250 nm,

Item 53, The circular polarizer of claim 50,. further comprising an optically thick layer disposed between the _. l inear absorbing polarizer and the optical stack.

Item $4. The circular polarizer of any one of items 42. to 5 , wherein the reflecti ve polarizer is a partial reflector accordin to any one: of claims 1 to 40. item 55, The circular polarizer of any one of items 4 1 to 54. w e e n the linear absorbing polarizer has a pass axis substantially aligned -with the first axis.

Item 56:. The circular polarizer of item 55, wherein an angle between the pass axis and the first axis is less than 10 _. degrees.

Item 57, The circular polarizer of item 55. wherein the retardef has a fast axis making an oblique angle w ith the pass axis of the l inear absorbing polarizer.

Item 58, Tbe circnlar polarizer of item 57, wherein the oblique angle is between 40 and 50 degrees. item 59. the^circular polarizer of any one of items 4 1 to 54, wherein the retardcr comprises a - lurality of retarder layers. Item 60. The .circular polarim'-of iienyS.9 wherein a first retarder j^er in the .plurality of retarder layers has a .first - fsst _. axis a«d _: a second retarder layer in the plurality of retarder layers; has. a second fast axis.

Stem 61. The elreu!ar pol rizer of stem 6¾ wher in the firs* md second i¾soa es .are. not parallel bra range ft»i.n-400 tan to JW ή r¾ the retarder has a retaidaaOs f ^' oiie foyrih cfthe wavelength,

Itetri 63· A display comprising an organic light dmstfing diode display panel nd the circular olarize;' of any one of items 41 to 62 disposed proxim te: the dis la psne!, ftern 64, A display comprising:

an organic light emitting diode display pane! having .an enrission spectra comprising first, second and third peak emission wavelengths A.a, a and b ¾ai s ^: f i«g Xa ?.b < £;

a circular polarizer dis osed proximate ^' the display pm$ the eirei ar polarizer comprising .a linear absorbing polarizer, a retarder disposed between the linear absorbing polarizer and die display panel, and a reflective polarizer disposed between -the linear absorb log polarizer and the retarder,

wherein the reflective polarizer has a tranST ittance for ^' aorrasl!y incident ight polarized along a pass axis of the reflective polarizer of at least of at least 8 ^: S¾ for wavelengths between . end Ac, and _. a transmittatKe for noviB¾liy incident light polarized along a block axis o the tefleetjve polarizer .of at least of at least ^: 85¾i for vvavsiengths, betwee : ½(Xa-^¾ and ½f¾bHe), and

wherein, i¾r .a wavelength 3 >·% and a wavelength λ2 s tislVing ½(¾+λρ.) } >3, the reflective polarizer has a first reflection bund Slaving ^' hand edges at 2 aad A3 _: ^' for namtaHy incident light polarized along the block axis. the first reflectio band having an average reflectance for normally incident light polarized a long' the block axis between 15% and 97%.

Item 65. The display of item 64, wherein the first reflection banrJJs _. a prinsary reflection hand.

Item 66, The display of item ^' 65, wherein reflective polarizer has a seeood reflection band being a second, harmonic- f the primary refection band, the seeood reflection bard having a wavelength range that Includes 408 ruts..

I em 6 ^" , A display compr sing:

an organic light e iaingdiode displa panel having aoeini siou spectra comprising first, second and third peak emission wavelen ths Aa, la and Kb ^■■ satisfying ¼ < b < oc; a circular olarize disposed proximate the ^■ .display ane!, the circular polarizer com rising a linear absorbing polarizer, a retsrde.r disposed between the linear ^■ ■ ^■ absorbing. polarizer and the display panel, and a reflective- polarizer disposed between the linear absorbing polarizer and the retarder,

wherein the reilective polarizer has a sransmittanee for normally incident light polarized along a, pass axis of the reilective polarizer of at least of at least 85% for wavelengths between » and λ-c, and a transmittanee for normally incident light polarized along a block axis of the reflective polarizer of at least of at least 85.% for wavelengths between ½{½+¾jb) and ¾(¾b+^c), and

wherein fo a wavelength 73 > a and a _: wavelength λ2 satisfyin ¾(Arj+„e) < %2 < λ3, the reflective polarizer has a primary reflection band having band edges at ?,2 and ¾3 for normally incident light polarized along the block axis.

Item 6¾. The display of item 67, wherein the.:prirnary reflection band has an average reflectance for normally incident light polarized along the block axis between 15% and 97%, i tem 6:9. The d isplay of item 67. wherein reflective polarizer has a second reflection band being a second harmonic of the primary reflection band, the second reflection band having a wavelength range that includes 400 inn.

Item 70. The display of any one of items 6 to 69, wherein ^" the transrmttanee for rjO rnally incident light polarized along the b!eck .axis. of the reflective polarizer is at ieast 80% for wavelengths between &a and

Item 71 _; The display of any 06e f items 64 to 69, wherein the trsnsmitianee for normally incident light polarized along the block axis of th reflective: polarizer is at least 85% for wavelengths between a and ¾e,

Item 72, The display of any one of items 64 to 69, wherein λ3 < 2λβ.

Item 73, The display of any one of items .64 to 69, wherein in + b > .3 2¾a,

Item 74, The display of any one of i tems 64 to 69, wherein the. reflecti ve polarizer comprises an optical stack, the optical stack .comprising a plurality of optical -repeat units, each optical repeat unit including first nd second polymer layers,

wherein for a wavelength ^' λ ^' Ι. < λβ, the transmittance of the reflective polarizer for normally incident Sight polarized along the pass axis is a least 8 S¾ for wavelengths between .λϊ and ,

wherein the reflective : polarizer has an f-ratio of the optical repeat units, attractive index difference betwee the first and second polymer laye rs along the bl ock axis, and a total number of optica l repeat units in. the optical stack such that the average reflectance fpr aoritjal!y incident l ight polarized aSong the block a is is between ) 5% and 9S¾¾, item 75. The display of. tem 74, ^erjei n tfce..ayeyage reflectance: for normally incident light polarized along the block a is is between 1 5% and W½.

Item 76, The d spla of item 74, wherein (he average reflectance for .norma lly incident l ght polarized, along ^' the- block axis Is between 20% and 85%.

Item 77. The display of¾ny ©ae of items .64 to 69. wherein for refractive indices alo he second axis, the O tical repeat; units have a range of optical thicknesses such that (?i3-¾,2} fX3 ÷λ2) is in range of 04)5 to 0.2.

Item 78. The. display of any one of items 64 to 69, wherein the reflecti e pola rizer is adapted to; provide a ga n, of ¾t least i .1-5· for wavelengt s between λο and 700 am at a view angle o?4S degrees, and to provide a gain . of between 1.00 -and 1.05. at Uie wavelength Xc at a view angle of zero degrees.

Item 79.. The display of item 7S, whe¾rn the reflective polarizer is a pted to provide a gain- for wavelengths between A.C and 700 nm at a view angle of 30 degrees that is less than the gain tor wavelengths between Xe and 700. nm at a view angle of 45 degrees.

Item SO, The display of any one of items _. 64 to 69, wherein, the reflective polarizer is a partial reflector accordin to any one of claims 1 to 40. hem 81 . The display of any one of items 64 to 69. wherein the circular polarizer sr. further characterized by any cne.of etaims 41 to 62.

Item The d isplay of any one of herns 64 toifi haying a AirV es!or shift at a v iew aagie of 45 degrees that is. no : more than ·0 ^' .8· times that of an otherwise, equivalent. ^: d¾ lay ^' not me ladi ng- the reflective polarizer; item -83» The display of any one of items 64 to 81 having a Δυ'ν' color shift at a view angle of 45 degrees that is t\Q more than 0.5 times that of art othfer i-se equivalent display not . includ ing the reflective polarizer.

Item 84. A display comprising:

an organic light emittin diode display panel; and a circular polarizer disposed proximate the display panel, the ciretdar polarizer comprising a linear absorbing polarizer, a retarder disposed between th linear absorbing olarizer and the display panel-, and a wavelength .and poiarizattori. dependent _. partial reflector disposed between the Knear absorbing polarizer and the retarder,

wherein the partial reflector is. a eOkyr-eOrreeiirig partial reflector such that the display has a Δ« color shift at view angle of 45 degrees that is no more thai! OS times thai -of an otherwise equivalent display having . an otherwisi* equivalent circular polarizer not ine!tiding the partial reflector.

Item 85. The display of item 84, wherein the partial renectorconiprises art optical stack, die optical stack comp istrtg a pluraiity of optfcaS repeat yn-its, each optical repeal unit incSuding j rst and second polymer layers,

wherein for wavelengths λΐ in a range of 40D nm to 450 am, λ2 in a range of 600 _: nm to 700 nng and 13 in a range of 720 nm t& 900 nm. the partial reflector has a transm ^' fttartc for normally incident light polarized along a

wherein -the p rfal.ief ect r¾as.a,first.fei1eciipn hand having band edges at A2 and ¾3 for normally incident, light polarized. aSongan orthogonal second axis at-normal incidence, the partial refteeior having m t-ratlQ of the optica! repeat units, a refractive index: difference between the first and second polymer layers along the second axis, and a total nuinber of optical repeat units in the .o tical stack, such thai the first reflection band has a average reflectance for light polarized along the second axis at normal incidence of betwee I 5 ¾ -and - 97%, and

wherein the optical repeat units have a range of optical thicknesses such that ,(? -λ2)/ λ3-ί λ2) is in a range of 0,05 to 0.2,

Item 86. The display of item 85, wherein the first.rs leetion band s a primary reflection band,

Item &7, Tire ..display of item 86, herein he ^; ?arti¾{. rtrftec-tor has _; a . second refection band beittg a second harmonic of the primar peile.ction band, the second reflection band a ing a w-aveiength range that includes 400 nm, iterii 8¾; The display of item 85, wherei th§ average reflectance for light polarized along the :secOnd axis at normal incidence is between 15% "and 95%.- item 89. The display of item $5, wherein the average reflectance for l ight -polarized along the second axis at normal .incidence is between 15% and 90%. item 90, The display of item 15. wherein the average reflectance for light polarized aic>ng fhe second axis at norma! incidence-is between: 20% and .85%, item 91. T e: display of tors wherein the average reflectance for light polarize aloag die second axis at normal inc idence is between 2 ^' 0¾ and 75%, item 92. The dispiay of item 35, wherein, the average reflectance for light olarized along the second axis at nor al incidence is between 25% and; 60%.

Item 93 , The display of item 84,, wherein the, .AuV color shift at a iew angle _, of ^' 45 degrees is no more than 0,5 times that of the otherwise e uivalen display,

Item 94. T he 'display of item 84, whexefn the partial reflector is, adapted to provide a gain for wavel ngths between 620 ri and 70 nm at a vkw a igte of 30 degrees that- is less thaii a gain for wavelengths between ^' 620. nm and ?O nm at a view angle of 45 degrees,

Hera 95, The display of item 84, wherein the partial reflector is further characterized by any on of claims 1 to 40.

Item 96, The display of item 84, wherein the cirauiai by any one of claims 41 to (52.,