PARTICLE ADSORPTION PROBE - NITTO DENKO CORP

Title:

PARTICLE ADSORPTION PROBE

Document Type and Number:

WIPO Patent Application WO/2013/157435

Kind Code:

A1

Abstract:

Provided is a novel particle adsorption probe (1000) that picks up particles by adsorbing said particles. The particle adsorption probe (1000) does not require physical stress to be applied when picking up particles, and the surface of the particle adsorption probe is not contaminated with foreign particles when picking up particles. Furthermore, the particle adsorption probe (1000) is capable of selectively picking up particles with a specific diameter from particle groups with a wide distribution of particle sizes, and allows particles to be analyzed and evaluated in an analyzer as is after being picked up. This particle adsorption probe (1000) has carbon nanotube aggregates (100), which are provided with multiple carbon nanotubes (10).

Inventors:

MAENO YOUHEI (JP)

Application Number:

PCT/JP2013/060664

Publication Date:

October 24, 2013

Filing Date:

April 09, 2013

Export Citation:

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Assignee:

NITTO DENKO CORP (JP)

International Classes:

B25J7/00; B25J15/06; B82Y35/00; G01N1/02; G01N15/00

Domestic Patent References:

WO2009128343A1

2009-10-22

Foreign References:

JP2000516708A	2000-12-12
JP2006035418A	2006-02-09
JP2006205271A	2006-08-10
JP2011132075A	2011-07-07
JP2008052232A	2008-03-06

Other References: