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Patent Searching and Data


Title:
PARTICLE ANALYZING DEVICE, PARTICLE SEPARATING DEVICE, PARTICLE ANALYSIS METHOD, AND PARTICLE SEPARATING METHOD
Document Type and Number:
WIPO Patent Application WO/2018/105721
Kind Code:
A1
Abstract:
A particle analyzing device (10) is provided with a processing device (42) and a storage device (41). The processing device (42) acquires a bulk susceptibility of a particle (p) being analyzed. The storage device (41) stores reference data (43). The reference data (43) represent the bulk susceptibility of a reference particle of the same type as the particle (p) being analyzed, for each crystal form that the particle (p) being analyzed is capable of adopting. The processing device (42) determines the crystal form of the particle (p) being analyzed on the basis of the bulk susceptibility of the particle (p) being analyzed and the reference data (43).

Inventors:
KAWANO Makoto (2-12-9 Ishibash, Ikeda-shi Osaka 32, 〒5630032, JP)
Application Number:
JP2017/044155
Publication Date:
June 14, 2018
Filing Date:
December 08, 2017
Export Citation:
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Assignee:
KAWANO LAB. INC. (2-12-9, Ishibashi Ikeda-shi Osaka, 32, 〒5630032, JP)
FUJIKURA LTD. (1-5-1, Kiba Koto-ku Tokyo, 12, 〒1358512, JP)
International Classes:
G01N27/76
Domestic Patent References:
WO2013021910A12013-02-14
WO2012133537A12012-10-04
Foreign References:
JP2002086015A2002-03-26
JP2000221252A2000-08-11
US20110068064A12011-03-24
Attorney, Agent or Firm:
MAEI Hiroyuki (Yodoyabashi FlexTower 5F, 3-3-11 Koraibashi Chuo-ku, Osaka-sh, Osaka 43, 〒5410043, JP)
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