PARTICLE BEAM TREATMENT APPARATUS

WIPO Patent Application WO/2011/092815

A1

A particle beam treatment apparatus can be obtained that reduces the effect of the hysteresis of a scanning electromagnet and obtain a highly accurate beam irradiation. The particle beam treatment apparatus comprises: an irradiation control device (32) for controlling a scanning electromagnet (3) on the basis of a target irradiation position coordinate (Pi) of a charged particle beam (1b); and a position monitor (7) for measuring a measurement position coordinate (Ps) of the charged particle beam (1b). The irradiation control device (32) has a command value generator (25) for outputting a control input (Io (Ir)) that is input to the scanning electromagnet (3), based on the target irradiation position coordinate (Pi) and correction data (Ia). The correction data (Ia) is generated based on the target irradiation position coordinate (Pi) and the measurement position coordinate (Ps) measured by the position monitor (7) in a pre-irradiation using the excitation pattern of the scanning electromagnet identical to that used in this irradiation plan.

HONDA TAIZO (JP)
HARADA HISASHI (JP)
PU YUEHU (JP)
YAMAMOTO YUICHI (JP)
IWATA TAKAAKI (JP)

PCT/JP2010/051121

August 04, 2011

January 28, 2010

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MITSUBISHI ELECTRIC CORP (JP)
HONDA TAIZO (JP)
HARADA HISASHI (JP)
PU YUEHU (JP)
YAMAMOTO YUICHI (JP)
IWATA TAKAAKI (JP)

A61N5/10

JP2005296162A	2005-10-27
JP2007132902A	2007-05-31
JP2001257100A	2001-09-21

None
See also references of EP 2529791A4

OIWA Masuo et al. (JP)
Masuo Oiwa (JP)

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