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Patent Searching and Data


Title:
PARTICLE BEAM TREATMENT APPARATUS
Document Type and Number:
WIPO Patent Application WO/2018/216087
Kind Code:
A1
Abstract:
The purpose of the present invention is to shorten an operation time for determining the position of an affected part and achieve the improvement in throughput of particle beam treatment. A particle beam treatment apparatus (51) of the present invention is provided with: a pair of X-ray imaging apparatuses which includes two X-ray imaging apparatuses (62a, 62b) that image a patient (45) placed on a treatment table (65) from a direction perpendicular to the patient (45); and a current command generation system (10) which generates current commands (Io) of an X-directional scanning electromagnet (32) and a Y-directional scanning electromagnet (33). The present invention is characterized in that the current command generation system (10) generates the current commands (Io) for scanning an irradiation region (70a), which is planned in a treatment plan, with a charged particle beam (31), on the basis of coordinates (planned spot coordinates (Pp)) of the irradiation region (70a) planned in the treatment plan and a movement amount (Am) which corrects a displacement between a reference image (Imr), which is a reference of the irradiation region (70a) planned in the treatment plan for the patient (45), and a collation image (Imc) imaged by the pair of X-ray imaging apparatuses.

Inventors:
KATO KEI (JP)
Application Number:
PCT/JP2017/019118
Publication Date:
November 29, 2018
Filing Date:
May 23, 2017
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
A61N5/10
Foreign References:
JP2016209012A2016-12-15
JP2007061438A2007-03-15
US20130237822A12013-09-12
JP2015510781A2015-04-13
JP2015029793A2015-02-16
Attorney, Agent or Firm:
OIWA Masuo et al. (JP)
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