Title:
PARTICLE DETECTOR FOR PARTICULATE MATTER ACCUMULATED ON A SURFACE
Document Type and Number:
WIPO Patent Application WO/2016/208176
Kind Code:
A1
Abstract:
Particle detectors and methods for detecting particulate matter accumulated on a surface are provided. According to one aspect, the particle detector may comprise a substrate, an optical light source configured to emit light along a light path, a waveguide associated with the substrate, having a surface exposed to a gaseous environment and configured to accumulate on the surface particulate matter from the gaseous environment, a detector configured to receive the emitted light from the waveguide, and a controller configured to determine the intensity of the detected light and output an indication of an opacity of the surface of the waveguide with the accumulated particulate matter.
Inventors:
ZHAN CHANGQING
SCHUELE PAUL JOHN
SCHUELE PAUL JOHN
Application Number:
PCT/JP2016/002951
Publication Date:
December 29, 2016
Filing Date:
June 20, 2016
Export Citation:
Assignee:
SHARP KK (JP)
International Classes:
G01N21/17; G01N15/02; G01N15/06
Domestic Patent References:
| WO1996035940A1 | 1996-11-14 |
Foreign References:
| JP2006029883A | 2006-02-02 | |||
| US20040223151A1 | 2004-11-11 | |||
| US20100171958A1 | 2010-07-08 |
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (2-6 Tenjinbashi 2-chome Kita, Kita-ku, Osaka-sh, Osaka 41, JP)
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