Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PARTICLE FIXING STRUCTURE AND PARTICLE ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2012/002515
Kind Code:
A1
Abstract:
The disclosed particle fixing structure (14) has multiple retaining holes (9), which each retain test particles to detect light emitted by substances that show the presence of components that compose the test particles, and is provided with a plate-like base (15) and a retaining unit (20) that is positioned on the base (15) and formed of multiple retaining holes (9). Here, light noise, such as background noise and crosstalk noise, is reduced and an opaque layer (19) that reduces light noise is provided to the base (15) or the retaining unit (20) to enable optical observation of multiple test particles with high sensitivity and high precision.

Inventors:
MOGAMI TOSHIFUMI (JP)
MORIMOTO ATSUSHI (JP)
FUTAMI TORU (JP)
Application Number:
PCT/JP2011/065113
Publication Date:
January 05, 2012
Filing Date:
June 30, 2011
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
TOSOH CORP (JP)
MOGAMI TOSHIFUMI (JP)
MORIMOTO ATSUSHI (JP)
FUTAMI TORU (JP)
International Classes:
G01N21/64; G01N21/03; G01N37/00
Domestic Patent References:
WO2009012112A12009-01-22
WO2008122267A22008-10-16
Foreign References:
JP2007086007A2007-04-05
JP2007296510A2007-11-15
JP2002286627A2002-10-03
JP2007298380A2007-11-15
JPH10221243A1998-08-21
JP3723882B22005-12-07
JP2007296510A2007-11-15
JP2007078631A2007-03-29
Other References:
See also references of EP 2589952A4
Attorney, Agent or Firm:
TOYAMA Tsutomu et al. (JP)
Tsutomu Toyama (JP)
Download PDF:
Claims: