PARTICLE IMAGING DEVICE, PARTICLE SIZE MEASURING DEVICE, DUPLEX PARTICLE SIZE MEASURING DEVICE, COMPUTER PROGRAM, PARTICLE OBSERVATION METHOD, AND DUPLEX PARTICLE MEASURING DEVICE

WIPO Patent Application WO/2019/230636

A1

Provided are a particle imaging device and the like capable of acquiring an image for carrying out particle size measurement, and an image for classifying particles, by performing image capture once. This particle imaging device is provided with a radiating unit for radiating first light of which the wavelength is a first wavelength, and second light including light of which the wavelength is a second wavelength, from different directions toward a sample in which particles are dispersed in a dispersion medium, an image capturing unit for capturing an image of the particles irradiated by the first light and the second light, and an output unit for outputting the captured image in order to calculate a particle size distribution, wherein a radiation plane of the first light is provided in a position facing the image capturing unit, with the sample therebetween, and a radiation plane of the second light is provided in a position illuminating the sample from the same side of the sample as the image capturing unit.

AKIYAMA HISASHI (JP)
MORI TETSUYA (JP)
AKAMATSU TAKESHI (JP)
NAGURA MAKOTO (JP)

PCT/JP2019/020860

December 05, 2019

May 27, 2019

Click for automatic bibliography generation  

HORIBA LTD (JP)

G01N15/02; G02B21/06; G02B21/36

WO2013002223A1	2013-01-03
WO2004086503A1	2004-10-07

JPH1048120A	1998-02-20
JP2013535686A	2013-09-12
JP2014089119A	2014-05-15

KOHNO, Hideto et al. (JP)

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