Title:
PARTICLE MASS NON-CONTACT MEASUREMENT METHOD AND DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/163207
Kind Code:
A1
Abstract:
Provided is a measurement device for measuring the mass or mass distribution of particles including organic material, said measurement device comprising: a supply means for supplying particles; an irradiation means for irradiating the particles with near infrared light; an imaging means for acquiring data pertaining to the reflectivity of near infrared light reflected from the particles at an m number of specific wavelengths; and a calculation means for calculating the mass of the particles on the basis of the data pertaining to the reflectivity of the near infrared light at the m number of specific wavelengths. Also provided is a measurement method for measuring the mass or mass distribution of particles including organic material, said method comprising the following steps: (a) supplying particles to a measurement device; (b) irradiating the particles with near infrared light and acquiring data pertaining to the reflectivity of near infrared light at an m number of specific wavelengths; and (c) calculating the mass of the particles on the basis of the acquired data.
Inventors:
MATSUDA OSAMU (JP)
OGAWA KENICHI (JP)
OGAWA KENICHI (JP)
Application Number:
PCT/JP2023/007268
Publication Date:
August 31, 2023
Filing Date:
February 28, 2023
Export Citation:
Assignee:
UNIV KYUSHU NAT UNIV CORP (JP)
International Classes:
G01N15/00; G01G9/00; G01G17/00; G01N21/27; G01N21/3563; G01N21/359
Foreign References:
| JP2004515778A | 2004-05-27 | |||
| JP2014185959A | 2014-10-02 |
Attorney, Agent or Firm:
SIKS & CO. (JP)
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