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Patent Searching and Data


Title:
PARTICLE MEASURING SYSTEM, AND PARTICLE MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2023/181438
Kind Code:
A1
Abstract:
A particle measuring system (10) according to an embodiment comprises: a light source (11) for emitting illuminating light onto a liquid containing a particle to be measured; an objective lens (16) for condensing the illuminating light; an imaging lens (17) for imaging the condensed illuminating light; an image sensor (18) for capturing an image of the imaged illuminating light and outputting a captured image; a detecting unit (22) for detecting the particle appearing in the captured image; a calculating unit (23) for calculating a particle detection reliability on the basis of a detection result from the detecting unit (22) and a predetermined indicator; and a processing unit (24) for determining next processing on the basis of the reliability.

Inventors:
TORII MORIAKI (JP)
NODA SHUHEI (JP)
HAYAMI TOKUSUKE (JP)
KAKINUMA KENJI (JP)
HASHIMOTO YUTA (JP)
HU JINYANG (JP)
MIZUUCHI RIEKO (JP)
Application Number:
PCT/JP2022/028718
Publication Date:
September 28, 2023
Filing Date:
July 26, 2022
Export Citation:
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Assignee:
TOSHIBA KK (JP)
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP (JP)
International Classes:
G01N15/06
Domestic Patent References:
WO2016159131A12016-10-06
Foreign References:
JP2017167081A2017-09-21
JP2022039780A2022-03-10
US20210019883A12021-01-21
JP2021135129A2021-09-13
JP2010133928A2010-06-17
US20190357541A12019-11-28
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
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