Title:
PARTICLE MEASURING SYSTEM, AND PARTICLE MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2023/181438
Kind Code:
A1
Abstract:
A particle measuring system (10) according to an embodiment comprises: a light source (11) for emitting illuminating light onto a liquid containing a particle to be measured; an objective lens (16) for condensing the illuminating light; an imaging lens (17) for imaging the condensed illuminating light; an image sensor (18) for capturing an image of the imaged illuminating light and outputting a captured image; a detecting unit (22) for detecting the particle appearing in the captured image; a calculating unit (23) for calculating a particle detection reliability on the basis of a detection result from the detecting unit (22) and a predetermined indicator; and a processing unit (24) for determining next processing on the basis of the reliability.
Inventors:
TORII MORIAKI (JP)
NODA SHUHEI (JP)
HAYAMI TOKUSUKE (JP)
KAKINUMA KENJI (JP)
HASHIMOTO YUTA (JP)
HU JINYANG (JP)
MIZUUCHI RIEKO (JP)
NODA SHUHEI (JP)
HAYAMI TOKUSUKE (JP)
KAKINUMA KENJI (JP)
HASHIMOTO YUTA (JP)
HU JINYANG (JP)
MIZUUCHI RIEKO (JP)
Application Number:
PCT/JP2022/028718
Publication Date:
September 28, 2023
Filing Date:
July 26, 2022
Export Citation:
Assignee:
TOSHIBA KK (JP)
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP (JP)
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP (JP)
International Classes:
G01N15/06
Domestic Patent References:
WO2016159131A1 | 2016-10-06 |
Foreign References:
JP2017167081A | 2017-09-21 | |||
JP2022039780A | 2022-03-10 | |||
US20210019883A1 | 2021-01-21 | |||
JP2021135129A | 2021-09-13 | |||
JP2010133928A | 2010-06-17 | |||
US20190357541A1 | 2019-11-28 |
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
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