Title:
PATTERN INSPECTION METHOD AND INSPECTION DEVICE THEREFOR
Document Type and Number:
WIPO Patent Application WO/2004/023122
Kind Code:
A1
Abstract:
A method and a device for inspecting a printed board for conductor pattern defects, which image-detect a conventionally-undetectable conductor pattern, covered by a resist print and a silk-screen print, on the surface of a printed board, and detect the defects of the conductor pattern. The pattern inspection method inspects, for conductor pattern defects, a printed board that comprises, in the order mentioned, a conductor pattern formed on a base material, and a resist print and a silk-screen print overlaid on the conductor pattern, wherein the conductor pattern is image-detected with an infrared ray in such a wavelength band only that permits it to pass through both of the resist print and the silk-screen print.
Inventors:
OKAMOTO NAOMICHI (JP)
Application Number:
PCT/JP2003/011187
Publication Date:
March 18, 2004
Filing Date:
September 02, 2003
Export Citation:
Assignee:
HAMAMATSU FOUND SCI & TECH PRO (JP)
OKAMOTO NAOMICHI (JP)
OKAMOTO NAOMICHI (JP)
International Classes:
G01N21/956; H05K1/02; H05K3/28; (IPC1-7): G01N21/956; G01N25/72; H05K3/00
Foreign References:
| JP2001283194A | 2001-10-12 | |||
| JPH08222832A | 1996-08-30 | |||
| JPS59218938A | 1984-12-10 | |||
| JPS61189443A | 1986-08-23 |
Attorney, Agent or Firm:
Asahina, Sohta (2-22 Tanimachi 2-chome, Chuo-k, Osaka-shi Osaka, JP)
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