Title:
PATTERN RECOGNITION APPARATUS, PATTERN RECOGNITION METHOD, AND PATTERN RECOGNITION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2007/063705
Kind Code:
A1
Abstract:
In pattern-matching between a binary or ternary reference image and an input gray
image, a pattern recognition method makes it possible to more quickly obtain the
results equal to those of a pattern recognition method in which a plurality of
binary reference images are generated assuming the various binarized threshold values
that can be set and the distances between these reference images and a gray image
are compared. A first cumulative histogram of the pixels of the gray image made
correspond to the pixels in the high density region of the binary reference image
and a reverse second cumulative histogram of the pixels of the gray image made
correspond to the pixels in the low density region of the reference image are generated
and added. The minimum value of the added cumulative histogram is compared with
a threshold value, thereby determining the presence and absence of a pattern.
Inventors:
TAKAHASHI KATSUHIKO (JP)
Application Number:
PCT/JP2006/322731
Publication Date:
June 07, 2007
Filing Date:
November 15, 2006
Export Citation:
Assignee:
NEC CORP (JP)
TAKAHASHI KATSUHIKO (JP)
TAKAHASHI KATSUHIKO (JP)
International Classes:
G06T7/00; G06V30/162; G06V30/10
Foreign References:
JP2002279422A | 2002-09-27 | |||
JP2001266143A | 2001-09-28 | |||
JPH08287246A | 1996-11-01 | |||
JP2004180000A | 2004-06-24 | |||
JP2000040153A | 2000-02-08 |
Other References:
See also references of EP 1956551A4
Attorney, Agent or Firm:
KUDOH, Minoru (24-10 Minamiooi 6-chom, Shinagawa-ku Tokyo 13, JP)
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