Title:
PERFORMANCE TESTING SYSTEM AND TESTING METHOD FOR RFID TAGS IN CONDITIONS OF HIGH AND LOW TEMPERATURES
Document Type and Number:
WIPO Patent Application WO/2019/228538
Kind Code:
A1
Abstract:
A performance testing system and testing method for RFID tags in conditions of high and low temperatures. Said performance testing system comprises: a high/low temperature thermal cover apparatus configured to heat or cool air; a heat transfer apparatus, connected to the high/low temperature thermal cover apparatus by means of a first transfer pipe and used for delivering the cold/hot air generated by the high/low temperature thermal cover apparatus; and a heat insulation apparatus, connected to the heat transfer apparatus by means of a second transfer pipe and configured to accommodate an RFID tag for conducting performance testing on the RFID tag in conditions of high temperature or low temperature.
Inventors:
ZHANG DONG (CN)
CHEN YANNING (CN)
FU ZHEN (CN)
ZHANG HAIFENG (CN)
YUAN YIDONG (CN)
LI JIANQIANG (CN)
CHEN YANNING (CN)
FU ZHEN (CN)
ZHANG HAIFENG (CN)
YUAN YIDONG (CN)
LI JIANQIANG (CN)
Application Number:
PCT/CN2019/090992
Publication Date:
December 05, 2019
Filing Date:
June 12, 2019
Export Citation:
Assignee:
BEIJING SMARTCHIP MICROELECTRONICS TECH CO LTD (CN)
STATE GRID INFORMATION & TELECOMMUNICATION GROUP CO LTD (CN)
STATE GRID INFORMATION & TELECOMMUNICATION GROUP CO LTD (CN)
International Classes:
G01R31/00
Foreign References:
| CN108761236A | 2018-11-06 | |||
| CN104670523A | 2015-06-03 | |||
| CN205982484U | 2017-02-22 | |||
| CN101592704A | 2009-12-02 | |||
| CN106644401A | 2017-05-10 | |||
| CN204807114U | 2015-11-25 | |||
| JP2010231419A | 2010-10-14 | |||
| JP2010026715A | 2010-02-04 |
Attorney, Agent or Firm:
CHINA PAT INTELLECTUAL PROPERTY OFFICE (CN)
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