Title:
PHASE-CONTRAST X-RAY IMAGING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2019/111505
Kind Code:
A1
Abstract:
This phase-contrast X-ray imaging system (100) comprises an X-ray source (1), an X-ray detector (4), a grating unit, and a control unit (6). The control unit (6) acquires at least one type of positional deviation from among the positional deviation of the grating unit in the optical axis direction connecting the X-ray source (1) and X-ray detector (4), the positional deviation of the grating unit in a direction orthogonal to the slits of the grating unit, and the positional deviation of the grating unit resulting from rotation around the optical axis.
Inventors:
MORIMOTO NAOKI (JP)
TANABE KOICHI (JP)
KIMURA KENJI (JP)
SHIRAI TARO (JP)
DOKI TAKAHIRO (JP)
SANO SATOSHI (JP)
HORIBA AKIRA (JP)
TANABE KOICHI (JP)
KIMURA KENJI (JP)
SHIRAI TARO (JP)
DOKI TAKAHIRO (JP)
SANO SATOSHI (JP)
HORIBA AKIRA (JP)
Application Number:
PCT/JP2018/036090
Publication Date:
June 13, 2019
Filing Date:
September 27, 2018
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N23/041
Foreign References:
| JP2014090967A | 2014-05-19 | |||
| JP2012108098A | 2012-06-07 | |||
| JP2011227041A | 2011-11-10 | |||
| JP2012020107A | 2012-02-02 | |||
| JP2013070867A | 2013-04-22 | |||
| JP2012024554A | 2012-02-09 | |||
| JP2015529510A | 2015-10-08 | |||
| US20170307549A1 | 2017-10-26 | |||
| JP2018179969A | 2018-11-15 |
Attorney, Agent or Firm:
MIYAZONO, Hirokazu (JP)
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