Title:
PHASE DIFFERENCE MEASURING DEVICE AND PHASE COMPARISON CIRCUIT ADJUSTING METHOD
Document Type and Number:
WIPO Patent Application WO/2007/037340
Kind Code:
A1
Abstract:
A phase difference measuring device for reducing the measurement time includes: a
plurality of phase difference measuring circuits (104, 105, 106) arranged in
one row; and phase difference conversion circuits (101, 102, 103) connected between
the adjacent phase difference measuring circuits. The phase difference measuring
circuits input a first and a second signal and give a first and a second delay amount
to the first and the second signal, respectively, a plurality of times for accumulation.
The phases of the first and the second signal to which a delay amount is given are
compared each time to judge which is leading. The phase difference conversion
circuits input the first and the second signal inputted to the phase difference
measuring circuit of the former stage and give a first delay total amount (Tr1)
as a total of the first delay amounts and a second delay total amount (Ts1) as a total
of the second delay amounts given in the phase difference measuring circuits
of the former stage to the first and the second signal, respectively for output
of the first and the second signal to the phase difference measuring circuit of
the latter stage.
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Inventors:
NOSE KOICHI (JP)
MIZUNO MASAYUKI (JP)
MIZUNO MASAYUKI (JP)
Application Number:
PCT/JP2006/319355
Publication Date:
April 05, 2007
Filing Date:
September 28, 2006
Export Citation:
Assignee:
NEC CORP (JP)
NOSE KOICHI (JP)
MIZUNO MASAYUKI (JP)
NOSE KOICHI (JP)
MIZUNO MASAYUKI (JP)
International Classes:
G01R25/00; G01R29/02; H03K5/13; H03K5/26
Foreign References:
| JPH0566236A | 1993-03-19 | |||
| JPH0698354A | 1994-04-08 |
Attorney, Agent or Firm:
YAMAKAWA, Masaki et al. (8th Floor Shuwa-Tameike Building, 4-2, Nagatacho 2-chom, Chiyoda-ku Tokyo 14, JP)
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