Title:
PHASE-LOCKED LOW LIGHT MICROSCOPIC IMAGING METHOD AND APPARATUS
Document Type and Number:
WIPO Patent Application WO/2024/045551
Kind Code:
A1
Abstract:
A phase-locked low light microscopic imaging method and apparatus. The method comprises: setting an excitation source parameter; collecting a sample image; acquiring an intensity image; superimposing the intensity image and the sample image; and outputting a result. An excitation signal is inputted into an electrode of a sample being measured (4), so that said sample (4) periodically emits an optical signal at a failure point after said sample (4) is electrified; the optical signal is optically amplified by a microscopic system (3) and the sample image is collected by a camera (2); a digital phase-locked algorithm, i.e., the orthogonality of a trigonometric function, is used to separate the magnitude of a periodic change of a pixel value having the same frequency as an excitation source (5) over time, so as to suppress irregular fluctuations in measurement data due to temperature drift and thermal noise of an electronic component and environmental disturbance, thereby increasing the signal-to-noise ratio of the measurement data.
Inventors:
ZHANG JIACHEN (CN)
Application Number:
PCT/CN2023/081378
Publication Date:
March 07, 2024
Filing Date:
March 14, 2023
Export Citation:
Assignee:
HEFEI PHASE LOCKED PHOTONICS TECH CO LTD (CN)
International Classes:
G01N21/66; G06T5/50
Foreign References:
| CN115219480A | 2022-10-21 | |||
| CN113466650A | 2021-10-01 | |||
| US20100073665A1 | 2010-03-25 | |||
| CN113390919A | 2021-09-14 | |||
| CN102033081A | 2011-04-27 | |||
| CN103149217A | 2013-06-12 | |||
| CN105915179A | 2016-08-31 | |||
| CN114577814A | 2022-06-03 | |||
| US20190212252A1 | 2019-07-11 |
Attorney, Agent or Firm:
DEBUND LAW OFFICE (CN)
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