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Patent Searching and Data


Title:
PHYSICAL PROPERTY MEASUREMENT METHOD, PHYSICAL PROPERTY MEASUREMENT SYSTEM, AND ELEMENT FOR PHYSICAL PROPERTY MEASUREMENT
Document Type and Number:
WIPO Patent Application WO/2023/214455
Kind Code:
A1
Abstract:
In this physical property measurement method, in an element (3) for physical property measurement that comprises a material (4) to be measured which is a solid object, an insulating layer (31) disposed on only one of both sides in the thickness direction of the material (4) to be measured, and a pair of electrodes (32, 33) between which the material (4) to be measured and the insulation layer (31) are sandwiched in the thickness direction, a voltage that varies periodically and of which the polarity is reversed periodically is applied between the pair of electrodes (32, 33). Further, in the physical property measurement method, a physical property of the material (4) to be measured is measured on the basis of a current that flows through the element (3) for physical property measurement due to the applied voltage. In the step for measuring the physical property of the material (4) to be measured, the polarity of ions contained in the material (4) to be measured is measured.

Inventors:
OYABU NORIAKI (JP)
INOUE MASARU (JP)
MURATA HIDEYUKI (JP)
IWATA TAKURO (JP)
Application Number:
PCT/JP2022/019537
Publication Date:
November 09, 2023
Filing Date:
May 02, 2022
Export Citation:
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Assignee:
TOYO CORP (JP)
International Classes:
G01N27/00; G01N27/48
Foreign References:
JPH07161795A1995-06-23
JPS59158533A1984-09-08
JPS57177535A1982-11-01
JPH1152390A1999-02-26
US4938847A1990-07-03
US20140055145A12014-02-27
Attorney, Agent or Firm:
NII, Hiromori (JP)
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