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Title:
PHYSICAL QUANTITY MEASUREMENT DEVICE AND PHYSICAL QUANTITY MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2010/058594
Kind Code:
A1
Abstract:
The objective is to make it possible to estimate a highly reliable offset quickly or precisely according to the circumstances, and to further improve the reliability of the estimated offset even when a measurement data group has not been acquired in a space wherein the size of the vector physical quantity, which is the measurement subject, is uniform. Based on a prescribed evaluation formula that uses a difference vector group, the offset included in an acquired vector physical quantity data group is estimated by a statistical method. In the estimation of the offset, reliability information for a reference point is calculated according to calculation parameters for the purpose of calculating the reference point reliability information based on at least one of a vector physical quantity data group, a difference vector group, and multiple estimated reference points; the reliability of a reference point is judged by comparing said reliability information to a judgment threshold value; and a reference point that has been judged to be reliable is output as the offset included in the vector physical quantity data acquired by a data acquisition means.

Inventors:
KITAMURA, Touru (1-105, Kanda Jinbocho Chiyoda-k, Tokyo 01, 〒1018101, JP)
北村徹 (〒01 東京都千代田区神田神保町一丁目105番地 Tokyo, 〒1018101, JP)
Application Number:
JP2009/006266
Publication Date:
May 27, 2010
Filing Date:
November 20, 2009
Export Citation:
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Assignee:
ASAHI KASEI MICRODEVICES CORPORATION (1-105, Kanda Jinbocho Chiyoda-k, Tokyo 01, 〒1018101, JP)
旭化成エレクトロニクス株式会社 (〒01 東京都千代田区神田神保町一丁目105番地 Tokyo, 〒1018101, JP)
KITAMURA, Touru (1-105, Kanda Jinbocho Chiyoda-k, Tokyo 01, 〒1018101, JP)
International Classes:
G01C17/38; G01P21/00
Attorney, Agent or Firm:
TANI, Yoshikazu et al. (6-20, Akasaka 2-chome Minato-k, Tokyo 52, 〒1070052, JP)
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