Title:
PIN FOR A SEMICONDUCTOR CHIP TEST, AND SOCKET FOR A SEMICONDUCTOR CHIP TEST INCLUDING SAME
Document Type and Number:
WIPO Patent Application WO/2012/173379
Kind Code:
A3
Abstract:
The present invention relates to a pin for a semiconductor chip test, and to a socket for a semiconductor chip test including same, and more particularly, to a pin for a semiconductor chip test, and to a socket for a semiconductor chip test including same, which: improve test reliability by means of a movement toward a semiconductor chip being natural and contact with a test terminal being reliable; reduce costs by means of a low amount of wear occurring upon contact with a semiconductor chip terminal and by flipping and using one side of a contact terminal when the opposite side has been worn down, thereby preventing damage to components by reducing the number of components.
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Inventors:
NA GYEONG-HWA (KR)
Application Number:
PCT/KR2012/004638
Publication Date:
March 07, 2013
Filing Date:
June 13, 2012
Export Citation:
Assignee:
NA GYEONG-HWA (KR)
International Classes:
G01R1/067; G01R31/26; G01R31/28
Foreign References:
KR100308123B1 | 2001-11-02 | |||
KR100999574B1 | 2010-12-08 | |||
KR20100126130A | 2010-12-01 |
Attorney, Agent or Firm:
YUN, Young-Han (Hiveras Bldg D#1062, Gyesan4-dong,Gyeyang-gu, Incheon 407-784, KR)
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Claims: