Title:
PLASMA DISPLAY PANEL LIGHTING INSPECTING METHOD
Document Type and Number:
WIPO Patent Application WO/2005/052975
Kind Code:
A1
Abstract:
A method of inspecting lighting of a plasma display panel in which cells are formed at two-level crossings between electrodes arranged in the row direction and electrodes arranged in the column direction and gradation display is conducted by combining subfields constituting one field for lighting. In a predetermined subfield, not applying a write pulse voltage to a cell to be inspected a write pulse voltage is applied to at least one specific cell which is one of the cells adjacent to the cell to be inspected, and in the next subfield a write pulse voltage is applied to the cell to be inspected. If there is a defect in the partition of the cell to be inspected, the discharge in the adjacent cells adversely influences through the defective partition the amount of charge of the partition of the cell to be inspected. As a result, in the next subfield, the cell to be inspected does not light. Thus lighting failure caused by the defective partition can be detection.
Inventors:
Ikura, Tsuneo
Wakitani, Takao
Wakitani, Takao
Application Number:
PCT/JP2004/017668
Publication Date:
June 09, 2005
Filing Date:
November 22, 2004
Export Citation:
Assignee:
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (1006, Oaza Kadoma Kadoma-shi, Osaka, 571-8501, JP)
Ikura, Tsuneo
Wakitani, Takao
Ikura, Tsuneo
Wakitani, Takao
International Classes:
H01J9/42; H01J11/02; H01J17/49; H01J9/42; H01J11/02; H01J17/49; (IPC1-7): H01J9/42
Attorney, Agent or Firm:
Iwahashi, Fumio c/o Matsushita Electric Industrial Co. Ltd. (1006, Oaza Kadom, Kadoma-shi Osaka, 571-8501, JP)
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