Title:
PLASMON RESONANCE PHASE IMAGING
Document Type and Number:
WIPO Patent Application WO2001020295
Kind Code:
A3
Abstract:
A device for measuring simultaneously the phase at each point of an image formed by light reflected from a sample in which the phase has been modified by plasma resonance in a thin conducting layer, the device comprising a thick transparent substrate (10) on which a thin layer of conducting material is deposited (13); a light source (1); an interferometer; an imaging means (9); and a processing means.
Inventors:
LIPSON STEPHEN (IL)
NOTCOVICH ARIEL (IL)
NOTCOVICH ARIEL (IL)
Application Number:
PCT/IL2000/000559
Publication Date:
October 04, 2001
Filing Date:
September 12, 2000
Export Citation:
Assignee:
TECHNION RES & DEV FOUNDATION (IL)
LIPSON STEPHEN (IL)
NOTCOVICH ARIEL (IL)
LIPSON STEPHEN (IL)
NOTCOVICH ARIEL (IL)
International Classes:
G01N21/55; (IPC1-7): G01B9/02
Foreign References:
| US6161437A | 2000-12-19 | |||
| US5633724A | 1997-05-27 | |||
| US6153444A | 2000-11-28 | |||
| US5923031A | 1999-07-13 |
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