Title:
POLYAMIDE FILM AND METHOD FOR PRODUCING SAME
Document Type and Number:
WIPO Patent Application WO/2023/171521
Kind Code:
A1
Abstract:
The present invention provides a polyamide film which has excellent heat resistance and excellent flexibility, and which is not only capable of being uniformly stretched both before and after a heat treatment, but also capable of maintaining the uniform state after the uniform stretching by means of the heat treatment and restoring the state before the application of a tension by means of release after the application of the tension. The present invention relates to a polyamide film which contains a polyamide (E) that contains a unit derived from an aliphatic dicarboxylic acid (A) having 18 or more carbon atoms, a unit derived from an aliphatic diamine (B) having 18 or more carbon atoms, a unit derived from an aromatic dicarboxylic acid (C) having 12 or less carbon atoms, and a unit derived from an aliphatic diamine (D) having 12 or less carbon atoms, and which has a melting point of 240°C or higher, an elongation recovery ratio of 30% or more in a hysteresis test, a tensile modulus of 1,500 MPa or less, a 10% elongation strength of 70 MPa or less and a crystal melting enthalpy of 15 J/g or more.
Inventors:
TAKAISHI NAOKI (JP)
MARUO TAKESHI (JP)
HATTORI YOSHIO (JP)
MARUO TAKESHI (JP)
HATTORI YOSHIO (JP)
Application Number:
PCT/JP2023/007760
Publication Date:
September 14, 2023
Filing Date:
March 02, 2023
Export Citation:
Assignee:
UNITIKA LTD (JP)
International Classes:
C08J5/18; B32B27/34; C08G69/34; H05K1/03
Domestic Patent References:
WO2021106541A1 | 2021-06-03 | |||
WO2020085360A1 | 2020-04-30 | |||
WO2016001949A1 | 2016-01-07 |
Foreign References:
JP2008274288A | 2008-11-13 | |||
JPS6274641A | 1987-04-06 | |||
JPH06511281A | 1994-12-15 | |||
JPH0253823A | 1990-02-22 | |||
JP2021154650A | 2021-10-07 | |||
JP2020131577A | 2020-08-31 | |||
JPH02265925A | 1990-10-30 | |||
US20220049054A1 | 2022-02-17 | |||
CN102532530A | 2012-07-04 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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