Title:
POROUS METAL FOIL OR WIRE AND CAPACITOR ANODES MADE THEREFROM AND METHODS OF MAKING SAME
Document Type and Number:
WIPO Patent Application WO/2020/090935
Kind Code:
A1
Abstract:
A porous metal foil and porous metal wire are described. Capacitor anodes made from either or both of the porous metal foil and porous metal wire are further described as well as methods to make same.
Inventors:
HORIO ISAYUKI (JP)
Application Number:
PCT/JP2019/042680
Publication Date:
May 07, 2020
Filing Date:
October 30, 2019
Export Citation:
Assignee:
GLOBAL ADVANCED METALS JAPAN K K (JP)
International Classes:
C22C27/02; C22C1/08; H01G9/042; H01G9/048; H01G9/04
Domestic Patent References:
| WO2008019992A1 | 2008-02-21 |
Foreign References:
| JP2007305780A | 2007-11-22 | |||
| JP2011198873A | 2011-10-06 | |||
| JP2009152273A | 2009-07-09 | |||
| JPS61121320A | 1986-06-09 | |||
| US201862752431P | 2018-10-30 | |||
| US4067736A | 1978-01-10 | |||
| US4149876A | 1979-04-17 | |||
| US4684399A | 1987-08-04 | |||
| US5234491A | 1993-08-10 |
Other References:
G S UPADHYAYA: "Powder metallurgical processing and metal purity: A case for capacitor grade sintered tantalum", BULLETIN OF MATERIALS SCIENCE., vol. 28, no. 4, 31 July 2005 (2005-07-31), IN, pages 305 - 307, XP055650301, ISSN: 0250-4707, DOI: 10.1007/BF02704240
CHANDRASEKHARAN RAMESH ET AL: "Thermal oxidation of tantalum films at various oxidation states from 300 to 700°C", JOURNAL OF APPLIED PHYSICS, AMERICAN INSTITUTE OF PHYSICS, US, vol. 98, no. 11, 12 December 2005 (2005-12-12), pages 114908 - 114908, XP012077983, ISSN: 0021-8979, DOI: 10.1063/1.2139834
R W FRANKLIN: "ANALYSIS OF SOLID TANTALUM CAPACITOR LEAKAGE CURRENT", 17 June 1996 (1996-06-17), XP055650390, Retrieved from the Internet [retrieved on 20191206]
CHANDRASEKHARAN RAMESH ET AL: "Thermal oxidation of tantalum films at various oxidation states from 300 to 700°C", JOURNAL OF APPLIED PHYSICS, AMERICAN INSTITUTE OF PHYSICS, US, vol. 98, no. 11, 12 December 2005 (2005-12-12), pages 114908 - 114908, XP012077983, ISSN: 0021-8979, DOI: 10.1063/1.2139834
R W FRANKLIN: "ANALYSIS OF SOLID TANTALUM CAPACITOR LEAKAGE CURRENT", 17 June 1996 (1996-06-17), XP055650390, Retrieved from the Internet
Attorney, Agent or Firm:
AOKI, Atsushi et al. (JP)
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