Title:
POSITION DETECTING APPARATUS, POSITION DETECTING METHOD, INSPECTING APPARATUS, POSITION DETECTING PROGRAM AND COMPUTER READABLE RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2008/013137
Kind Code:
A1
Abstract:
Provided is an inspecting apparatus which can detect a luminescent point defect even
when the luminescent point defect exists on an alignment mark portion. A position
detecting apparatus arranged in the inspecting apparatus is also provided. A
liquid crystal panel module (11) is provided with a control section (7) for lighting
an alignment mark, which is arranged for position detection, at a luminance difficult
to be viewed, and an image processing section (6) for detecting the position of
a display panel based on the picked up image of the display panel whereupon the
alignment mark is lighted.
Inventors:
YASUKAWA, Minoru (())
Application Number:
JP2007/064425
Publication Date:
January 31, 2008
Filing Date:
July 23, 2007
Export Citation:
Assignee:
SHARP KABUSHIKI KAISHA (22-22, Nagaike-cho Abeno-ku, Osaka-sh, Osaka 22, 5458522, JP)
シャープ株式会社 (〒22 大阪府大阪市阿倍野区長池町２２番２２号 Osaka, 5458522, JP)
シャープ株式会社 (〒22 大阪府大阪市阿倍野区長池町２２番２２号 Osaka, 5458522, JP)
International Classes:
G01B11/00; G01N21/88; G02F1/13; G01B11/00; G01N21/88; G02F1/13
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (Daiwa Minamimorimachi Building, 2-6 Tenjinbashi 2-chome Kita,Kita-ku, Osaka-shi, Osaka 41, 5300041, JP)
Download PDF: