POSITION DETECTION APPARATUS, POSITION DETECTION METHOD, AND ELECTR5ONIC PART CONVEY APPARATUS

WIPO Patent Application WO/2003/004967

A1

A position detection apparatus includes comparison area selection means (34) for selecting a comparison area for comparing to a template image indicating an electronic part from an input image, phase difference calculation means (42) for calculating a phase difference for each frequency between a phase component when a template image is converted into a frequency component with a predetermined position in the template image as a reference and a phase component when a comparison area image is converted into a frequency component with a predetermined position in the comparison area as a reference, part position detection means (50) for detecting a position of a part in the input image according to a phase impulse response function into which the phase component difference is converted, relative part position detection means (60) for detecting relative positions of a plurality of parts in the input image, and electronic part position detection means (62) for detecting the position of an electronic part in the input image.

ICHIKAWA MASAYOSHI (JP)
YAMAGUCHI TAKAHIRO (JP)

PCT/JP2002/006494

January 16, 2003

June 27, 2002

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ADVANTEST CORP (JP)
ICHIKAWA MASAYOSHI (JP)
YAMAGUCHI TAKAHIRO (JP)

G06T1/00; G03F9/00; G06T7/00; H01L21/50; (IPC1-7): G01B11/00; G06T1/00; H01L21/50; H01L21/68

JP2001067481A	2001-03-16
JPH0843025A	1996-02-16
JPH06188596A	1994-07-08
JP3322943A

Ryuka, Akihiro (24-12 Shinjuku 1-chom, Shinjuku-ku Tokyo, JP)

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