Title:
POSITION MEASUREMENT SYSTEM AND POSITION MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2020/105311
Kind Code:
A1
Abstract:
The purpose of the present invention is to reduce coordinate system error between position measurement devices when it is necessary for a plurality of position measurement devices to share a common coordinate system. This position measurement system (100) divides the position measurement of a plurality of measurement points (30) between a plurality of laser trackers (50). A laser tracker (50-1) measures three coordinate definition targets (14) for defining a coordinate system for measurement points (30), defines a workpiece coordinate system on the basis of the measurement results for the three coordinate definition targets (14), and uses the defined workpiece coordinate system to measure a measurement point (30) allocated thereto. The other laser trackers (50-2), (50-3) each measure a measurement point (30) allocated thereto using the workpiece coordinate system defined by the laser tracker (50-1) and a correction vector that has been obtained beforehand and is based on the positional relationship between the other laser tracker (50-2), (50-3) itself and the laser tracker (50-1).
Inventors:
YAMAGUCHI JUNPEI (JP)
TSUTSUI MASANOBU (JP)
MORI HARUKI (JP)
TSUTSUI MASANOBU (JP)
MORI HARUKI (JP)
Application Number:
PCT/JP2019/040312
Publication Date:
May 28, 2020
Filing Date:
October 11, 2019
Export Citation:
Assignee:
MITSUBISHI HEAVY IND LTD (JP)
International Classes:
G01C3/00; B25J13/00; G01B11/00; G01C3/06; G01C15/00
Domestic Patent References:
WO2018185893A1 | 2018-10-11 | |||
WO2014033823A1 | 2014-03-06 |
Foreign References:
JP2018109552A | 2018-07-12 | |||
JP2015221489A | 2015-12-10 | |||
JP2017226023A | 2017-12-28 |
Attorney, Agent or Firm:
FUJITA, Takaharu (JP)
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