POSITIONING JIG FOR FILM THICKNESS GAUGE

WIPO Patent Application WO/2018/142519

A1

Provided is a positioning jig which is for a film thickness gauge and is used together with a measuring jig used by being attached to a probe of the film thickness gauge. The measuring jig includes: a slide member to which the probe is fixed; and a guide member which supports the slide member such that the slide member is slidable and has a flat surface on the side made to approach an object to be measured. The positioning jig is provided with: a base body having an accommodation part in which the guide member is accommodated, and having, on the flat surface side, an open surface through which the tip of the probe passes; a first contact member extending from the base body and having a first contact surface brought into surface contact with a first outer surface of the object to be measured; a second contact member extending from the first contact member on the open surface and having a second contact surface brought into surface contact with a third outer surface of the object to be measured; and a positioning mechanism which adjusts the position of the first contact surface with respect to the base body and the position of the second contact surface with respect to the base body.

JPS5928601	METHOD AND DEVICE FOR DETECTING MAGNETIC MATERIAL PLATE
WO/2010/018337	DEVICE AND METHOD FOR MONITORING THE THICKNESS OF A THERMALLY INSULATED FERRITIC STAINLESS STEEL PIPE BY REMOTE MEASUREMENT

MAKABE KATSUHISA (JP)

PCT/JP2017/003655

August 09, 2018

February 01, 2017

Click for automatic bibliography generation  

CHUGOKU ELECTRIC POWER (JP)

G01B7/06

JP2013019760A	2013-01-31
JP2007239007A	2007-09-20
JPS5492770U	1979-06-30
JPS6417403U	1989-01-27
JPH10156735A	1998-06-16
JPH03273108A	1991-12-04

ISSHIKI & CO. (JP)

View/Download PDF      PDF Help

Previous Patent: METHOD FOR REPAIRING CAST STEEL MEMBER

Next Patent: CREEP FATIGUE TEST METHOD AND CONTROL DEVICE FOR CREEP TEST DEVICE