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Title:
POWER MOSFET WITH METAL FILLED DEEP SINKER CONTACT FOR CSP
Document Type and Number:
WIPO Patent Application WO/2018/000357
Kind Code:
A1
Abstract:
A method of forming an IC (180) including a power semiconductor device includes providing a substrate (100) having an epi layer (150) thereon with at least one transistor (160) formed therein covered by a pre-metal dielectric (PMD) layer (118). Contact openings are etched from through the PMD into the epi layer to form a sinker trench extending to a first node of the device. A metal fill material (128b) is deposited to cover a sidewall and bottom of the sinker trench but not completely fill the sinker trench. A dielectric filler layer (128c) is deposited over the metal fill material to fill the sinker trench. An overburden region of the dielectric filler layer is removed stopping on a surface of the metal fill material in the overburden region to form a sinker contact (128). A patterned interconnect metal is formed providing a connection between the interconnect metal and metal fill material on the sidewall of the sinker trench.

Inventors:
LIU YUNLONG (CN)
YANG HONG (US)
LIN HO (CN)
LV TIANPING (CN)
ZOU SHENG (CN)
JIA QIULING (CN)
XIONG YUFEI (CN)
Application Number:
PCT/CN2016/087968
Publication Date:
January 04, 2018
Filing Date:
June 30, 2016
Export Citation:
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Assignee:
TEXAS INSTRUMENTS INC (US)
TEXAS INSTRUMENTS JAPAN LTD (JP)
International Classes:
H01L21/311; H01L29/417; H01L21/768; H01L29/78
Foreign References:
US20130320443A12013-12-05
CN105009296A2015-10-28
CN104412365A2015-03-11
US6489217B12002-12-03
US5777362A1998-07-07
US7445996B22008-11-04
Attorney, Agent or Firm:
JEEKAI & PARTNERS (CN)
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