PROBABILITY INFORMATION-BASED METHOD OF DETECTING MOST FREQUENTLY-ACCESSED ADDRESS OF SEMICONDUCTOR MEMORY

Title:

PROBABILITY INFORMATION-BASED METHOD OF DETECTING MOST FREQUENTLY-ACCESSED ADDRESS OF SEMICONDUCTOR MEMORY

Document Type and Number:

WIPO Patent Application WO/2016/083865

Kind Code:

A1

Abstract:

Provided is a semiconductor memory management method, the method comprising the following steps: on the basis of a sampling time period, sampling a row address from an access stream of a memory unit array; on the basis of probability information, determining whether the sampled row address is an address corresponding to a most frequently-accessed target row; performing an updating operation on a row neighboring the target row.

Inventors:

CHO SANG YEUN (KR)

Application Number:

PCT/IB2014/066308

Publication Date:

June 02, 2016

Filing Date:

November 25, 2014

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Assignee:

SAMSUNG ELECTRONICS CO LTD (KR)
CHO SANG YEUN (KR)

International Classes:

G11C11/408

Foreign References:

US20140059287A1	2014-02-27
US20140177370A1	2014-06-26
US20140189228A1	2014-07-03
US20140219043A1	2014-08-07
US20140281207A1	2014-09-18

Attorney, Agent or Firm:

OH, Se-Jun et al. (KR)
權赫洙 (KR)

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