Title:
PROBE EXCHANGE TOOL, PROBE EXCHANGE ASSISTANCE SYSTEM, AND PROBE EXCHANGE METHOD
Document Type and Number:
WIPO Patent Application WO/2017/109837
Kind Code:
A1
Abstract:
Provided are a probe exchange tool and a probe exchange assistance system, by which a particular probe to be exchanged can be correctly removed from an inspection device by a user. A probe exchange tool 20a is used for probe exchange in an electronic circuit inspection device 80 including a probe plant unit 70 having a plurality of exchangeable probes 10 planted therein, and the tip end part of the probe exchange tool 20a is formed by applying a chuck of a mechanical pencil such that the head part of the probe 10, which looks like a lead of a mechanical pencil, is inserted from the front of the tip end part so as to freely hold and release the head part. In the holding state, conductivity to the probe 10 is secured. In a probe exchange assistance system 100, a first electrode 61 and a second electrode 62 of a conduction tester circuit 60 are electrically connected to the probe 10 to be exchanged and the conductive probe exchange tool 20a, respectively, the conduction tester circuit 60 determines that the probe 10 to be exchanged and the probe exchange tool 20a are in a conduction state, and the probe exchange tool 20a detects the probe 10 to be exchanged.
Inventors:
UTSUMI MASATO (JP)
KATO KIYOAKI (JP)
KATO KIYOAKI (JP)
Application Number:
PCT/JP2015/085715
Publication Date:
June 29, 2017
Filing Date:
December 21, 2015
Export Citation:
Assignee:
WIT CO LTD (JP)
KATO MRTALLIC IND CO LTD (JP)
KATO MRTALLIC IND CO LTD (JP)
International Classes:
G01R1/067; G01R1/073
Foreign References:
JPH07113820A | 1995-05-02 | |||
JP2015141036A | 2015-08-03 | |||
JP2006234691A | 2006-09-07 |
Attorney, Agent or Firm:
KOIKE, Akira et al. (JP)
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