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Title:
PROBE MEMBER FOR INSPECTION
Document Type and Number:
WIPO Patent Application WO/2017/155134
Kind Code:
A1
Abstract:
The present invention relates to a probe member for inspection and, more particularly, to a probe member for inspection in which at least a part thereof is inserted into a cylindrical body and an upper end thereof is in contact with a terminal of a semiconductor device, the probe member comprising: a first probe portion of a pointed shape having, at an upper end thereof, a first sharp end which is in contact with the terminal of the semiconductor device; a first probe plate extending downwardly from the first probe portion and comprising a first coupling portion inserted into the cylindrical body to be coupled to the cylindrical body; a second probe portion of a pointed shape having, at an upper end thereof, a second sharp end which is in contact with the terminal of the semiconductor device; and a second probe plate extending downwardly from the second probe portion and comprising a second coupling portion inserted into the cylindrical body to be coupled to the cylindrical body, wherein the first probe plate and the second probe plate are integrally combined in a state where the first probe and the second probe are staggered from each other.

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Inventors:
CHUNG, Young Bae (B-6F, 215 Galmachi-ro,Jungwon-gu, Seongnam-si, Gyeonggi-do, 13217, KR)
Application Number:
KR2016/002314
Publication Date:
September 14, 2017
Filing Date:
March 09, 2016
Export Citation:
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Assignee:
ISC CO., LTD. (6F 215, Galmachi-roJungwon-gu, Seongnam-si, Gyeonggi-do, 13217, KR)
International Classes:
G01R1/073; G01R1/067; G01R31/26; G01R31/28
Foreign References:
KR101439342B12014-09-16
JP2004170360A2004-06-17
KR100985497B12010-10-05
JP2012112709A2012-06-14
KR20160002475U2016-07-14
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (12F Daelim Acrotel, 13 Eonju-ro 30-gilGangnam-gu, Seoul, 06292, KR)
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