Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PROBE FOR PHYSICAL PROPERTIES MEASUREMENT
Document Type and Number:
WIPO Patent Application WO/2004/040282
Kind Code:
A1
Abstract:
A probe (31) has an internal electrode (311) and an external electrode (312) and is used in a physical properties measurement system wherein a complex dielectric constant of an object of measurement is measured and values of physical properties of the object, among which the moisture content is the typical, are determined according to the measured complex dielectric constant. In order to accurately measure the complex dielectric constant whether the surface of the object is rough or not and to have an appropriate electrical length, the probe is provided with an end face (313) which is inclined to the axis of the internal electrode (311).

Inventors:
INOUE TOSHIFUMI (JP)
YAGIHARA SHIN (JP)
SHINYASHIKI NAOKI (JP)
Application Number:
PCT/JP2003/013703
Publication Date:
May 13, 2004
Filing Date:
October 27, 2003
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
NICHIREI KK (JP)
UNIV TOKAI (JP)
INOUE TOSHIFUMI (JP)
YAGIHARA SHIN (JP)
SHINYASHIKI NAOKI (JP)
International Classes:
G01N22/00; G01N22/04; G01N33/02; (IPC1-7): G01N22/00
Foreign References:
JP2740528B21998-04-15
JPH0317554U1991-02-21
JPS6347261U1988-03-30
JPH08159990A1996-06-21
JPH062218U1994-01-14
JPH10142169A1998-05-29
JPH08320297A1996-12-03
Other References:
See also references of EP 1562039A4
Attorney, Agent or Firm:
Murase, Kazumi (12-7 Nishishimbashi 2-chom, Minato-ku Tokyo, JP)
Download PDF: