PROBE PIN AND PROBE CARD - JAPAN ELECTRONIC MAT CORPORATION

Title:

PROBE PIN AND PROBE CARD

Document Type and Number:

WIPO Patent Application WO/2023/188369

Kind Code:

A1

Abstract:

A probe pin (20) comprises: a low-resistance portion (L) made of a first metal having conductivity; and a high-resistance portion (H) made of a second metal having conductivity with higher resistivity than the low-resistance portion (L). A five-layer part (T5), in which the high-resistance portion (H), a slit (S) as a clearance, the low-resistance portion (L), a slit (S) as a clearance, and the high-resistance portion (H) are sequentially configured as five layers, is provided between a contact portion (20c) and a terminal portion (20t) in a first direction (Y) different from a buckling direction (Z) of the probe pin (20) in an inspection on a test object (W).

More Like This:

JPS6037869	[Title of the device] The probe for electric measurement
JPH0727789	CIRCUIT WIRING BOARD AND ITS MANUFACTURE
JPH04113075	[Title of the device] Test clip

Inventors:

OKUMA KOKI (JP)

Application Number:

PCT/JP2022/016805

Publication Date:

October 05, 2023

Filing Date:

March 31, 2022

Export Citation:

Click for automatic bibliography generation Help

Assignee:

JAPAN ELECTRONIC MAT CORPORATION (JP)

International Classes:

G01R1/067; G01R1/073; G01R31/28

Domestic Patent References:

WO2021122326A1

2021-06-24

Foreign References:

JP2018091870A	2018-06-14
JP2013007700A	2013-01-10
CN109425765A	2019-03-05
JP2009272308A	2009-11-19
JP5995953B2	2016-09-21

Attorney, Agent or Firm:

PALMO PATENT FIRM, P.C. (JP)

Download PDF:

View/Download PDF PDF Help

Previous Patent: DRIVE CONTROL DEVICE AND CONTROL METHOD FOR DRIVE CONTROL DEVICE

Next Patent: WIRE ELECTRIC DISCHARGE MACHINING DEVICE