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Patent Searching and Data


Title:
PROBE PIN AND ELECTRONIC DEVICE EMPLOYING SAME
Document Type and Number:
WIPO Patent Application WO/2017/179320
Kind Code:
A1
Abstract:
A probe pin (10) is provided with: a coil spring (11) which extends and contracts along a centerline; a first contact (25) which has a rectangular cross section and is disposed at one end on the centerline; and a second contact (34) which has a rectangular cross section and is disposed at the other end on the centerline; wherein the first contact (25) and the second contact (34) are electrically connected to one another and are supported in such a way as to be capable of reciprocating by way of the coil spring (11). In particular, a contact surface of at least one of the first contact (25) and the second contact (34) is inclined in such a way as to descend in a thickness direction (Y1-Y2 direction).

Inventors:
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
KONDO MAKOTO (JP)
KIMURA NAOYUKI (JP)
Application Number:
JP2017/007497
Publication Date:
October 19, 2017
Filing Date:
February 27, 2017
Export Citation:
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Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067; H01R13/24; H01R33/76
Foreign References:
JP2012520461A2012-09-06
JP2015040734A2015-03-02
JP2015076325A2015-04-20
JPH10221367A1998-08-21
Other References:
See also references of EP 3444620A4
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
Mutsumi Sameshima (JP)
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