PROBE PIN AND ELECTRONIC DEVICE USING SAME - OMRON TATEISI ELECTRONICS CO

Title:

PROBE PIN AND ELECTRONIC DEVICE USING SAME

Document Type and Number:

WIPO Patent Application WO/2015/133016

Kind Code:

A1

Abstract:

A probe pin (1) is provided with a coil spring (30), and first and second plungers (10, 20). The first and second plungers (10, 20) are formed such that, when the first and second plungers are inserted toward the inside from both the ends of the coil spring (30), slide contact surfaces (17, 27) are reciprocatably disposed along an axis center, while being in slide contact with each other, and the coil spring (30) can be held between a main body section (11) of the first plunger (10) and a main body section (21) of the second plunger (20). Furthermore, the first and second plungers (10, 20) are formed such that the first and second plungers (10, 20) are close to each other, and a contact area where the slide contact surface (17) of the first plunger (10) and the slide contact surface (27) of the second plunger (20) are in contact with each other is tilted with respect to the axis center.

Inventors:

TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)

Application Number:

PCT/JP2014/080964

Publication Date:

September 11, 2015

Filing Date:

November 21, 2014

Export Citation:

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Assignee:

OMRON TATEISI ELECTRONICS CO (JP)

International Classes:

G01R1/067; H01R13/24

Domestic Patent References:

WO2011013731A1

2011-02-03

Foreign References:

US20080064236A1	2008-03-13
JP4683993B2	2011-05-18
JP2010539672A	2010-12-16

Other References: