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Patent Searching and Data


Title:
PROBE PIN AND INSPECTION JIG
Document Type and Number:
WIPO Patent Application WO/2020/095679
Kind Code:
A1
Abstract:
This probe pin comprises: an elastic part which is elastically deformable in a first direction; and a connection part which is provided at one end of the elastic part in the first direction, and to which a conductor part of an electric wire is able to be connected.

Inventors:
SASANO NAOYA (JP)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
Application Number:
PCT/JP2019/041489
Publication Date:
May 14, 2020
Filing Date:
October 23, 2019
Export Citation:
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Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067; G01R1/073; H01R13/24
Domestic Patent References:
WO2017026304A12017-02-16
Foreign References:
JP2017146119A2017-08-24
JP2009052913A2009-03-12
JP2009016291A2009-01-22
JPH08271547A1996-10-18
JP2004138405A2004-05-13
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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