Title:
PROBE PIN AND INSPECTION JIG
Document Type and Number:
WIPO Patent Application WO/2020/095679
Kind Code:
A1
Abstract:
This probe pin comprises: an elastic part which is elastically deformable in a first direction; and a connection part which is provided at one end of the elastic part in the first direction, and to which a conductor part of an electric wire is able to be connected.
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Inventors:
SASANO NAOYA (JP)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
Application Number:
PCT/JP2019/041489
Publication Date:
May 14, 2020
Filing Date:
October 23, 2019
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067; G01R1/073; H01R13/24
Domestic Patent References:
WO2017026304A1 | 2017-02-16 |
Foreign References:
JP2017146119A | 2017-08-24 | |||
JP2009052913A | 2009-03-12 | |||
JP2009016291A | 2009-01-22 | |||
JPH08271547A | 1996-10-18 | |||
JP2004138405A | 2004-05-13 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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