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Title:
PROBE PIN AND INSPECTION TOOL INCLUDING SAME
Document Type and Number:
WIPO Patent Application WO/2017/047495
Kind Code:
A1
Abstract:
This probe pin comprises a coil spring (50), a first plunger (30), and a second plunger (40). The first plunger (30) includes: a first insertion part (31) positioned inside the coil spring (50); and a first contact part (32) that is exposed outside the coil spring, and that is provided with a first contact point (34) capable of moving back and forth along a center line. The second plunger (40) includes: a second insertion part (41) that is positioned inside the coil spring (50) and that is slidably connected to the first insertion part (31); and a second contact part (42) that is exposed outside the coil spring, and that is provided with a second contact point (47) capable of moving back and forth in a direction intersecting with the center line.

Inventors:
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
KONDO MAKOTO (JP)
Application Number:
PCT/JP2016/076460
Publication Date:
March 23, 2017
Filing Date:
September 08, 2016
Export Citation:
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Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067; H01R12/72; H01R13/24
Foreign References:
JP2013511039A2013-03-28
JP2004325306A2004-11-18
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
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