Title:
PROBE PIN AND INSPECTION UNIT
Document Type and Number:
WIPO Patent Application WO/2018/055961
Kind Code:
A1
Abstract:
A probe pin includes: a plate-shaped movable pin (20) having an elastic portion (21) that elongates and contracts along a longitudinal direction, and a first contact portion (22) and a second contact portion (23) provided at both end portions of the elastic portion (21) in the longitudinal direction, respectively; and a conduction path forming member (30) disposed so as to overlap with the movable pin (20) in a thickness direction. The conduction path forming member (30) has, at both end portions in the longitudinal direction, a first contact surface (36) and a second contact surface (37) that contact with the first contact portion (22) and the second contact portion (23), respectively. The movable pin (20) and the conduction path forming member (30) are disposed so as to be relatively movable along the longitudinal direction while maintaining the contact between the first contact portion (22) and the first contact surface (36) and the contact between the second contact portion (23) and the second contact surface (37).
Inventors:
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
SAKAI TAKAHIRO (JP)
Application Number:
PCT/JP2017/029656
Publication Date:
March 29, 2018
Filing Date:
August 18, 2017
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067; G01R1/073; H01R13/24; H01R33/76
Domestic Patent References:
| WO2013054555A1 | 2013-04-18 |
Foreign References:
| JP2003307525A | 2003-10-31 | |||
| JP2016003921A | 2016-01-12 | |||
| JP2015045649A | 2015-03-12 | |||
| JP2015081805A | 2015-04-27 |
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
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