Title:
PROBE PIN, TESTING JIG, AND TESTING UNIT
Document Type and Number:
WIPO Patent Application WO/2020/250637
Kind Code:
A1
Abstract:
This probe pin comprises: an elastic section that can be elastically deformed along a first direction; a first contact section to which one end of the elastic section, in the first direction thereof, is connected; and a second contact section to which the other end of the elastic section, in the first direction thereof, is connected. The elastic section comprises: a first abutting section extending from the first contact section in a second direction and constituting the one end of the elastic section; and a second abutting section disposed on the same side as the first abutting section and the second contact section in the second direction, extending along the second direction from the second contact section, and constituting the other end of the elastic section. The first abutting section and the second abutting section are configured so as to be able to abut the inside of a socket in the first direction in a state of being accommodated in the socket.
Inventors:
SASANO NAOYA (JP)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
Application Number:
PCT/JP2020/020160
Publication Date:
December 17, 2020
Filing Date:
May 21, 2020
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067; G01R31/26
Domestic Patent References:
| WO2014167693A1 | 2014-10-16 | |||
| WO2016156002A1 | 2016-10-06 |
Foreign References:
| JP2002134202A | 2002-05-10 | |||
| JP2006226907A | 2006-08-31 | |||
| CN107038983A | 2017-08-11 | |||
| KR101851519B1 | 2018-04-23 | |||
| JP2017223628A | 2017-12-21 | |||
| JPH07115110A | 1995-05-02 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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