Title:
PROBE PIN AND PROBE UNIT WITH SAME
Document Type and Number:
WIPO Patent Application WO/2016/147691
Kind Code:
A1
Abstract:
A probe pin (2) is provided with: a coil spring (30) extending and contracting along the center axis; an electrically conductive first plunger (10) having a gripped section (11) inserted along the center axis into the coiled spring (30) from one end thereof, the electrically conductive first plunger (10) further having a contact section (12) provided with a base (14) for supporting the coil spring (30); and an electrically conductive second plunger (20) having first and second elastic sections (22, 23) inserted along the center axis into the coil spring (30) from the other end thereof and connected in a slidable manner to the gripped section (11), the electrically conductive second plunger (20) further having a contact section (21) provided with a coil spring support section (25) for supporting the coil spring (30). The contact section (12) of the first plunger (10) is provided with an elastic spring section (16) protruding from the contact section (12).
Inventors:
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
MATOBA MASATO (JP)
SAKAI TAKAHIRO (JP)
MATOBA MASATO (JP)
Application Number:
PCT/JP2016/051284
Publication Date:
September 22, 2016
Filing Date:
January 18, 2016
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067; H01L21/66
Foreign References:
| JP2013008467A | 2013-01-10 | |||
| JP2015040734A | 2015-03-02 | |||
| JP2011232181A | 2011-11-17 |
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
Mutsumi Sameshima (JP)
Mutsumi Sameshima (JP)
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