Title:
PROBE PIN VISION INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/229197
Kind Code:
A1
Abstract:
The present invention relates to a probe pin vision inspection device enabling quick and accurate inspection of whether a probe pin applied to a probe card is defective, and also enabling easy separation and collection of a non-defective product and a defective product during the process of inspecting whether the probe pin is defective.
Inventors:
JIN CHEON DEOK (KR)
Application Number:
PCT/KR2023/004206
Publication Date:
November 30, 2023
Filing Date:
March 29, 2023
Export Citation:
Assignee:
HURO CORP (KR)
International Classes:
G01N21/88; B07C5/36
Foreign References:
| KR20180029449A | 2018-03-21 | |||
| KR20170142677A | 2017-12-28 | |||
| KR20190089362A | 2019-07-31 | |||
| JP2013043154A | 2013-03-04 | |||
| JP2011137704A | 2011-07-14 |
Attorney, Agent or Firm:
KIM, Jung Su (KR)
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