Title:
PROBE PIN WITH REDUCED FLUX DIFFUSION AND MANUFACTURING METHOD THEREOF
Document Type and Number:
WIPO Patent Application WO/2019/022272
Kind Code:
A1
Abstract:
The present invention relates to a probe pin for a probe card and, more specifically, to a probe pin with reduced flux diffusion, which prevents flux from diffusing along the probe pin when the probe pin is attached to an electrode of a space transformer, and a manufacturing method thereof. To this end, the present invention comprises: a pin body part; a pin elastic part extending from the pin body part so as to have elasticity; and a pin contact part formed on the other side of the pin elastic part, wherein the pin body part further comprises a flux prevention part formed in a groove shape and preventing the flux from diffusing along the pin body part by storing flux therein.
Inventors:
LEE JAE HWAN (KR)
YOON MIN HWAN (KR)
YOON MIN HWAN (KR)
Application Number:
PCT/KR2017/008075
Publication Date:
January 31, 2019
Filing Date:
August 24, 2017
Export Citation:
Assignee:
GIGALANE CO LTD (KR)
International Classes:
G01R1/067; G01R3/00
Foreign References:
| KR101399537B1 | 2014-05-28 | |||
| KR101195355B1 | 2012-12-26 | |||
| KR20090083530A | 2009-08-04 | |||
| KR101059409B1 | 2011-08-29 | |||
| US5922989A | 1999-07-13 |
Attorney, Agent or Firm:
YOON, Byong Kuk et al. (KR)
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