Title:
PROBE PIN
Document Type and Number:
WIPO Patent Application WO/2018/042931
Kind Code:
A1
Abstract:
This probe pin is provided with: a coil spring (20); a first plunger (30) including a first body section (31) which extends through the coil spring (20) and both ends of which are exposed to the outside of the coil spring (20) when the coil spring contracts, a first contact section (32) which is provided at one end of the first body section (31), a first contact point section (33) which is provided at the other end of the first body section (31), and a retaining and holding section (34) which retains and holds the coil spring (20); and a second plunger (40) including a second body section (41), a second contact section (42) which is provided on one end of the second body section (41), which retains and holds the coil spring (20) by coming into contact with the coil spring (20), and which comes into contact with the first contact section (32) at least when the coil spring (20) contracts, and a second contact point section (43) which is provided on the other end of the second body section (41).
Inventors:
TAKAMORI SATOSHI (JP)
Application Number:
PCT/JP2017/026261
Publication Date:
March 08, 2018
Filing Date:
July 20, 2017
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067
Foreign References:
| JP2006310025A | 2006-11-09 | |||
| JP2015040734A | 2015-03-02 | |||
| JP2015108608A | 2015-06-11 |
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
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