Title:
PROBE PIN
Document Type and Number:
WIPO Patent Application WO/2019/225441
Kind Code:
A1
Abstract:
A probe pin comprising: a first contact spring and a second contact spring; and an intermediate section and a buffer spring arranged in series between the first contact spring and the second contact spring. The buffer spring is configured so as to be elastically deformable, relative to the intermediate section, in a second direction that intersects a first direction being the arrangement direction of the first contact spring, the intermediate section, the buffer spring, and the second contact spring. The first contact spring and the second contact spring are configured so as to be elastically deformable, relative to the intermediate section, in a third direction that intersects the first direction and the second direction.
Inventors:
SASANO NAOYA (JP)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
CHOI SI-HUN (JP)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
CHOI SI-HUN (JP)
Application Number:
PCT/JP2019/019332
Publication Date:
November 28, 2019
Filing Date:
May 15, 2019
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
H01R24/60; G01R1/067; G01R1/073; H01R12/91; H01R13/631; H01R24/54; H01R31/06
Foreign References:
| US20140134883A1 | 2014-05-15 | |||
| DE102009036807A1 | 2011-03-03 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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