Title:
PROBE AND PRODUCTION METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2018/043173
Kind Code:
A1
Abstract:
In the present invention, a substrate formed from an insulator or semiconductor, a first layer formed from a conductive magnetic material, and a second layer formed from a conductive non-magnetic material are laminated, in that order, on a distal end part of a probe, and the second layer is formed so as to have a predetermined thickness that is thinner than the thickness at which spin is weakened. Further, it is possible to apply spin current to the spin device from the second layer by causing current to flow between the first layer and the second layer in a state in which the part where the first layer and second layer are laminated is in contact with the spin device. Additionally, bringing the part where the first layer and second layer are laminated into contact with a spin device generating spin voltage makes it possible to measure the spin voltage of the spin device.
Inventors:
HOBARA REI (JP)
Application Number:
PCT/JP2017/029750
Publication Date:
March 08, 2018
Filing Date:
August 21, 2017
Export Citation:
Assignee:
UNIV TOKYO (JP)
International Classes:
G01R1/06; G01R33/32; H01L29/82
Domestic Patent References:
| WO2004114415A1 | 2004-12-29 |
Foreign References:
| JP2007527507A | 2007-09-27 | |||
| JP2003166929A | 2003-06-13 |
Other References:
TANAKA: "Spintronics: Current Status and Future Prospects", JOURNAL OF THE SURFACE SCIENCE SOCIETY OF JAPAN, vol. 32, no. 3, 23 March 2011 (2011-03-23), pages 120 - 127, XP055604107
UCHIDA: "Heat-current-induced Spintronic Phenomena and Spin Seebeck Effects", MATERIA JAPAN, vol. 49, no. 8, 1 August 2010 (2010-08-01), pages 357 - 363, XP055604113
UCHIDA: "Heat-current-induced Spintronic Phenomena and Spin Seebeck Effects", MATERIA JAPAN, vol. 49, no. 8, 1 August 2010 (2010-08-01), pages 357 - 363, XP055604113
Attorney, Agent or Firm:
ITEC INTERNATIONAL PATENT FIRM (JP)
Download PDF: